Thin Film
layer of material ranging < a nanometer to > a micrometer in thickness.
See Also: Film, Ellipsometers
-
Product
100GHz DWDM Optical Add/Drop Multiplexer (CATV Overlay Multiplexer)
OADM-1001-VOA (100GHz)
-
Hangzhou Huatai Optic Tech. Co., Ltd.
Huatai OADM-1001-VOA is an optical Add-Drop multiplexer with 100GHz channel interval. It is based on mature thin film filter technology, sealed with metal shell, and featured with low insertion loss, high isolation, wide channel and flexible configuration. It is the ideal device to Add(insertion Add)/Drop(Tape-out Drop) a specific wavelength(OADM) in optical fiber DWDM system. OADM-1001-VOA configures a manual-adjust optical attenuation, for adjust the equilibrium the optical power between insert channel and main signal channel, which is conveniently used for VOD overlay in CATV system.
-
Product
Resistors
-
SemiGen builds high power tantalum nitride resistor chips to customer specifications. We can manufacture chip resistors using a variety of substrates in various thicknesses to meet your specific needs. Resistors can be produced with element features under 0.002 inch for high density or high value resistor applications. Low noise stable TCR and chip sizes under 0.010 inch x 0.020 inch are routinely processed in production quantities. SemiGen’s series of Thin Film Resistors offer proven stability, low noise, and excellent TCR of both Tantalum Nitride (TaN) and Nichrome (NiC) resistive films. From our standard product offering, to custom requirements, this series of resistors is offered in a large selection of chip size, resistance values, and tolerances.
-
Product
Thin Film Lithium Tantalate (TFLT™) Pyroelectric Detectors
-
For room temperature measurement of THz sources, from nW to mW.
-
Product
Thin Film Current Sensing Chip Resistors
CSTN
-
*Thin film process*High power rating up to 3 watts in 2512 size*Resistance values from 50m to 1ohm*High purity alumina substrate for high power dissipation*Power management applications*Switching power supply*Over current protection in audio applications*Voltage regulation module (VRM)*DC-DC converter, battery pack, charger, adaptor,*Automatic engine control*Disk drive
-
Product
Time-Resolved Electrochemical Quartz Crystal Microbalance
400C Series
-
The quartz crystal microbalance (QCM) is a variant of acoustic wave microsensors that are capable of ultrasensitive mass measurements. Under favorable conditions, a typical QCM can measure a mass change of 0.1-1 ng/cm2. QCM oscillates in a mechanically resonant shear mode under the influence of a high frequency AC electric field which is applied across the thickness of the crystal. Figure 1b below shows an edge view of a QCM crystal undergoing oscillatory shear distortion. The central portions of the top and bottom of the crystal are coated with a typically disk-shaped thin metal film (e.g., gold).
-
Product
Reflectance Standards
STAN Series
-
Ocean Optics offers specular reflectance standards for measuring shiny surfaces such as machined metals and semiconductor materials and low-reflectivity surfaces such as anti-reflective coatings and thin film coatings. The STAN-SSH varies in reflectivity from 87%-98% over the 200-2500 nm wavelength range and is available in a version (STAN-SSH-NIST) calibrated to a NIST master standard. The NIST calibration data range is 250-2500 nm.
-
Product
Customized Ellipsometers
-
~0.1 nm thickness difference can be seen by IE-1000.Thickness distribution of thin film can be imaged.Thickness and optical images of semiconductor device, display, and bio samples.IE-1000 can show the images which can not be seen by conventional microscope.Defect of semiconductor and display can be seen directly.Easy and fast operation.
-
Product
C-Band / L-Band MWDM
WD1615/C, WD1516/L
-
Hangzhou Huatai Optic Tech. Co., Ltd.
WD1615/C, WD1516/L WDM is based on mature thin film filtering tech, with wide bandwidth, flatness, low insertion loss and high isolation. It is mainly applied to EDFA and DWDM network to achieve the combination and separation of C-Band and L-Band.
-
Product
Spectroscopic Ellipsometry
-
Spectroscopic ellipsometry is a surface-sensitive, non-destructive, non-intrusive optical technique widely used for thin layers and surface characterization. It is based simply on the change in the polarization state of light as it is reflected obliquely from a thin film sample. Depending on the type of material, spectroscopic ellipsometers can measure thickness from a few Å to tens of microns. It is also an excellent technique for multi-layers measurement.
-
Product
Spectroscopic Ellipsometers
M-2000
-
The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. An advanced optical design, wide spectral range, and fast data acquisition make it an extremely powerful and versatile tool.
-
Product
Low Noise Amplifier
-
Low noise amplifiers, or LNAs, are designed and manufactured by utilizing the most advanced PHEMT or MMIC devices, thin film technologies, and an improved DC power supply to deliver a low noise performance with broad operating bandwidths and good gain flatness. While standard models focus on general purpose applications, additional models with differing frequency ranges, gains and noise figures are listed on the website. Custom designs are also offered to meet any user’s specific needs.
-
Product
100GHz Dense Wavelength Division Multiplexer
DWDM-1000
-
Hangzhou Huatai Optic Tech. Co., Ltd.
DWDM series is based on mature thin film filtering technology and adopt metal sealing technology to encapsulate. It has the feature of flat channel bandwidth, flexible channel configuration, low insert loss and high isolation. The flexibility of channel configuration and modularized design make it convenient for system upgrading and expanding. All the Huatai products have no epoxy glue in optical line and can be used in high power optical communication system.
-
Product
Microwave Dielectric Measurement Systems
-
This system enables fast and non-destructive measurements of materials having various shapes, including thin films. Enables fast and non-destructive measurement of permittivity of thin-films and various dielectric materials using the evanescent mode of an open coaxial resonator.
-
Product
Spectroscopic Ellisopmeter for Simple Thin Film Measurement
Auto SE
-
The Auto SE is a new thin film measurement tool that allows full automatic analysis of thin film samples with simple push button operation.Sample analysis takes only a few seconds and provides a complete report that fully describes the thin film stack – including film thicknesses, optical constants, surface roughness, and film inhomogeneities.
-
Product
OhmegaPly®
-
For many years Teledyne Labtech has manufactured RF & Microwave PCB with integrated OhmegaPly® resistors. OhmegaPly® is a thin film resistor-conductor material. Using standard subtractive printed circuit technology, integral resistors are formed on circuit layers. These resistors can be buried within a Multilayer circuit board or used on the board surface. The resistors can also be used mounted on Metalbacked PCB.OhmegaPly® is available in 25 ohm per square, 50 ohm per square and 100 ohm per square sheet resistivity.
-
Product
RFoG 4-Band Multiplexer. 1550, 1590 & 1310/1490nm MWDM
WD5943
-
Hangzhou Huatai Optic Tech. Co., Ltd.
WD5943 WDM is based on mature thin film filtering tech, with wide bandwidth, flatness, low insertion loss and high isolation. It is mainly applied to FTTx PON network to achieve the combination and separation of the 1550nm (CATV) and 1310/1490nm (data).
-
Product
Gas and Vapor Delivery Systems
-
In thin film deposition, high-quality results start with how process gases are delivered, as they help create the stable environment needed for consistency by controlling flow, pressure and composition to support processes like ALD, CVD, and PVD. Advanced semiconductor devices developed for the most advanced computing processes, such as AI and edge computing, need the ultra-high-purity environments of our gas and vapor deposition delivery systems.
-
Product
XRD Diffractometers
Empyrean Range
-
With the Empyrean, Malvern Panalytical has set the new standard in developing the ultimate X-ray platform for the analysis of powders, thin films, nanomaterials and solid objects.
-
Product
AI ANALYZER
-
Nanotronics uses artificial intelligence to give our customers’ unprecedented freedom and control for defect detection. We offer an AI based Anomaly Detection Algorithm (ADA) toolkit that automates the work of writing computer vision algorithms to detect and classify defects on bare substrate and epi wafers as well as on thin films, glass and any other material with a uniform background.
-
Product
Resistive Components
-
Diamond is the best thermal conductor on earth. Combined with a low dielectric constant, it is an excellent RF dielectric material for high-frequency applications in which thermal performance is equally critical. By applying cutting-edge thin film process and extensive millimeter wave design experience, Smiths Interconnect has created a high-performance line of resistive components. The resulting products, our Diamond RF Resistives® resistors, terminations, and attenuators, are significantly reduced in size and unparalleled in average and peak power handling.
-
Product
CWDM Mux/Demux in 1U Rackmount(4,8,16,18-Channel)
-
Flyin Optronics’ Coarse wavelength division multiplexer (CWDM Mux/Demux) utilizes thin film coating technology and proprietary design of non-flux metal bonding micro optics packaging. It provides low insertion loss, high channel isolation, wide pass band, low temperature sensitivity and epoxy free optical path.
-
Product
ALD Advantages
-
Atomic Layer Deposition (ALD) stands out for one reason: control. The most significant advantages of thin film deposition via Atomic Later Deposition over other methods, are manifest in four distinct areas – film conformality, low temperature processing, stoichiometric control, and inherent film quality associated with the self-limiting, and self-assembled nature of the ALD mechanism ALD is exceptionally effective at coating surfaces that exhibit ultra high aspect ratio topographies, as well as surfaces requiring multilayer films with good quality interfaces technology. This thin-film process builds materials one atomic layer at a time, delivering unmatched uniformity and sub-nanometer precision, even on complex 3D structures. That level of accuracy makes ALD a critical technology for advanced semiconductor manufacturing, flexible electronics, and materials research.
-
Product
200GHz DWDM Module(4,8,16 Channel)
-
Flyin Optronics’ 200GHz dense wavelength division multiplexer (DWDM) utilizes thin film coating technology and proprietary design of non-flux metal bonding micro optics packaging to achieve optical add and drop at the ITU wavelengths. It provides ITU channel center wavelength, low insertion loss, high channel isolation, wide pass band, low temperature sensitivity and epoxy free optical path . It can be used for wavelength add/drop in telecommunication network system.
-
Product
Pressure Measurement Film
Prescale
-
Prescale allows you to easily measure pressure balance, distribution, and size. Created using Fujifilm's advanced thin film coating technologies, the pressure inspection sensor on the entirety of the film allows you to confirm pressure distribution of the entire surface at a glance. The color appears red where pressure is applied, and the color density varies according to the amount of pressure. To cover a wide pressure range (0.006 to 300 MPa), we supply eight types and nine variations of Prescale.
-
Product
Chip Resistors
-
Panasonic Industrial Devices Sales Company of America
Panasonic offers a wide range of Chip Resistors including conventional Thick Film Chip Resistors, Specialized Resistors such as Thin Film, Current Sense, Anti-Sulfur, Anti-Surge and Metal Film Chip Resistors.Panasonic’s standard Thick Film Chip Resistors are offered in cases sizes from 01005 to 2512.
-
Product
Stylus Profilers
Dektak
-
Bruker's Dektak® stylus profilometers are the culmination of over five decades of proprietary technology advances. They provide repeatable, reliable, and accurate measurements — from traditional step height measurements and 2D roughness surface characterization to advanced 3D mapping and film stress analyses. With over 10,000 systems installed around the world, Dektak surface profilers have been widely accepted as the gold standard for measuring thin film thickness, stress, surface roughness and form in diverse applications areas from academic research to semiconductor process control.
-
Product
Benchtop Metrology Solution
FilmTek 2000 PAR-SE
-
Scientific Computing International
Our most advanced benchtop metrology solution, engineered to meet the needs of nearly any advanced thin film measurement application, from R&D to production. Combines spectroscopic ellipsometry and DUV multi-angle polarized reflectometry with a wide spectral range to deliver the highest accuracy, precision, and versatility in the industry. Patented parabolic mirror technology allows for a small spot size down to 50µm, ideal for direct measurement of product wafers and patterned films.
-
Product
1x2 CWDM Device(3 Ports)
-
Flyin Optronics’ Coarse wavelength division multiplexer (CWDM) utilizes thin film coating technology and proprietary design of non-flux metal bonding micro optics packaging. It provideslow insertion loss, high channel isolation, wide pass band, low temperature sensitivity and epoxy free optical path .
-
Product
Reflection/Transmission Spectrophotometry
FilmTek 3000 PAR-SE
-
Scientific Computing International
Engineered to meet the needs of any advanced thin film measurement application, excelling at material characterization on both transparent and non-transparent substrates. Combines spectroscopic ellipsometry, DUV multi-angle polarized reflectometry, and transmission measurement with a wide spectral range to meet the most challenging of measurement demands in both R&D and production. Patented parabolic mirror technology allows for a small spot size down to 50µm, ideal for direct measurement of product wafers and patterned films.
-
Product
Semiconductor Technology, Micro Scriber + Flatness, Bow, Warp, Curvature, Glass Thickness
FLATSCAN
-
Optik Elektronik Gerätetechnik GmbH
Non contact automated 2D- or 3D measurement of warp, bow, slope and surface curvature with software module for calculation of thin film stress (wafer stress) of wafers and glass substrates.
