X-ray Diffractometers
Measure the intensity of diffracted rays.
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Product
Scanning X-Ray Detectors
Shad-o-Scan
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Shad-o-Scan is a family of scanning X-ray detectors specifically designed for the challenging requirements of high-performance industrial and scientific X-ray applications. Industry-leading TDI CCD performance enables the ultimate sensitivity and highest resolution in the industry, and ensures long detector lifetime in even the harshest radiation environments.
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Product
X-Ray Inspection System
MXI Quadra 5
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Quadra™ 5 is the X-ray inspection system of choice for sub micron applications such as PCB and semiconductor package inspection, counterfeit component screening and finished goods quality control.
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Product
Energy Dispersive X-Ray Spectroscopy (EDS)
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Rocky Mountain Laboratories, Inc.
Energy Dispersive Spectroscopy (EDS Analysis) is used in conjunction with the Scanning Electron Microscope (SEM) providing chemical analysis in areas as small as 1 µm in diameter. EDS detects all elements except for H, He, Li, and Be. EDS can be performed exactly on any features or particles seen in the SEM images and can “MAP” elements on a surface. Unknown materials can be identified and quantitative analysis can be performed.
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Product
X-ray Fluorescence, XRF Analysis Services
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Two XRF systems are available, a wavelength dispersive system (WDXRF) and an energy dispersive system (EDXRF). The difference is the manner in which the x-rays are detected. WDXRF instruments have very good energy resolution which leads to fewer spectral overlaps and improved background intensities. EDXRF instruments have higher signal throughput which can shorten analysis times. The higher signal throughput also makes EDXRF systems suitable for small spot or mapping analysis.
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Product
Industrial CT X-Ray Inspection System
X5000
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The X5000 is the most versatile system offered by North Star Imaging. The system boasts a large scanning envelope and excellent ergonomics for loading sizable objects while still maintaining the sensitivity to inspect even the smallest of items.
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Product
X-ray Inspection System
NEO-690Z / NEO-890Z
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Off-line Microfocus X-ray Inspection System equipped with PONY ORIGINAL Direct Conversion X-ray Camera; SID-A50. Suitable for inspection of BGA, CSP, and LGA on PCB.
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Product
X-ray Diffraction and Elemental Analysis
N8 HORIZON
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The N8 HORIZON is a powerful tool for both high-end research and for multi-user facilities investigating a variety of nano-materials from solid bulks, to fibers, surfaces or biological samples.
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Product
X-Ray Seamless Pixel Array Detector
XSPA-400 ER
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In general, X-ray diffraction measurements using a Cu X-ray source are known to have difficulty detecting trace crystalline phases because of increased background when measuring samples containing transition metals. The high energy resolution of the XSPA-400 ER supresses the fluorescent X-rays originating from the sample, thereby reducing background, enabling highly sensitive measurements of samples containing transition metals, such as iron and steel compounds and battery materials.Therefore, it achieves higher sensitivity measurements than conventional detectors.
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Product
X-ray Photoelectron Spectroscopy Analysis (XPS Analysis)
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Rocky Mountain Laboratories, Inc.
X-ray photoelectron spectroscopy (XPS Analysis) also called Electron Spectroscopy for Chemical Analysis (ESCA) is a chemical surface analysis method. XPS measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
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Product
Digital X-ray Detector
Aurora
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Aurora is a product family of digital X-ray detector solutions powering all security and a variety of industrial line-scanners. The product family consists of a wide range of stand-alone detectors, and all needed building blocks, like ready-made detector boards, modules and readout electronics, for end-to-end systems. Aurora provides superior image quality and a fully digitalized data path in the most robust, modular and easily scalable platform. It is a plug-and-play type solution speeding up time-to-market and delivering total cost savings.
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Product
X-ray CT System
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The surface and the internal parts, in one measurement. We provide “Dimensional X-ray CT System” that does not only observe the interior of the workpiece, but that can also perform high precision, contactless measurements.
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Product
X-ray Fluorescence
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XRF analysis – one of the best analytical techniques to perform elemental analysis in all kinds of samples, no matter if liquids, solids or loose powders must be analyzed.
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Product
X-ray and CT inspection System
UX20
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Due to the transformation to electric mobility, foundries are increasingly producing larger and more complex components. With its exceptional inspection envelope and the smart Geminy software, the UX20 facilitates fast and precise inspections of cast parts and helps increase overall production efficiency.
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Product
Refurbished And Demo X-ray Inspection Systems
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Our 2024 collection of refurbished and demo X-ray inspection systems offers high-quality performance at an affordable price. These precision X-ray inspection systems provide exceptional value without compromising on quality.
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Product
X-Ray Inspection System
MXI Ruby XL
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Designed for the largest PCBs, Ruby XL allows 96 x 67 cm (37.9” x 26.4”) areas to be inspected non-destructively, with feature resolution up to 0.5 µm.
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Product
X-ray Fluorescence Sulfur-in-Oil Analyzers
SLFA-2100/2800
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The SLFA-2100/2800 are designed specifically to meet the recent demanding needs of measuring the new low sulfur fuels, diesel and RFG.Using the X-ray fluorescence technique, fast and accurate measurements can be carried out in compliance with the ASTM D4294 method, either in the lab or in the field.
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Product
Cabinet X-ray System
XPERT 80- L
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Kubtec's XPERT 80-L, for large area imaging, is a multi-purpose cabinet x-ray system bringing high quality medical-grade imaging and ease of use to applications in scientific research, pathology and industry. A small focal spot with an x-ray source of up to 130 kV offers brighter images with higher contrast for visibility of the smallest details and most subtle variations in density. Optional sources are available for micro-focus and soft x-ray applications.
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Product
X-ray Fluorescence
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XRF is an elemental analysis technique with unique capabilities including (1) highly accurate determinations for major elements and (2) a broad elemental survey of the sample composition without standards. For example, XRF is used in analysis of rocks and metals with an accuracy of ~0.1% of the major elements.
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Product
X-Ray Inspection
MXI Jade Plus
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Restrictions in manufacturing materials and ever increasing expectations for reliability mean ensuring quality product manufacture is more important than ever. Jade Plus enables you to Prove Your Quality and reduce product returns from the field, and the associated cost and damage to reputation.
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Product
X-ray Non-Destructive Testing (NDT) System
DynamIx HR / Series 5
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High precision 12-bit 50µm reading allows inspection of minute image details. Wide dynamic range resulting in wide allowance of X-ray exposure value.
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Product
X-ray Analytical Microscope (Micro-XRF)
XGT-9000
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- <15µm probe size with ultra-high intensity without compromising sensitivity or spatial resolution. - High resolution cameras and multiple illumination modes to help capture images.- Dual types of detectors for transmission and fluorescent X-rays.- Detectable element range down to carbon with a light element detector.
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Product
XRD Diffractometers
Empyrean Range
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With the Empyrean, Malvern Panalytical has set the new standard in developing the ultimate X-ray platform for the analysis of powders, thin films, nanomaterials and solid objects.
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Product
X-ray Microscopy
ZEISS Xradia Versa
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Extremely versatile ZEISS Xradia Versa 3D X-ray microscopes (XRM) provide superior 3D image quality and data for a wide range of materials and working environments. Xradia Versa XRM feature dual-stage magnification based on synchrotron-caliber optics and revolutionary RaaD™ (Resolution at a Distance) technology for high resolution even at large working distances, a vast improvement over traditional micro-computed tomography. Non-destructive imaging preserves and extends the use of your valuable sample, enabling 4D and in situ studies.
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Product
X-ray Fluorescence Spectrometers
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Is a non-destructive analytical technique used to determine the elemental composition of materials.
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Product
Simultaneous Wavelength Dispersive X-ray Fluorescence Spectrometer
Simultix 15
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Multi-channel simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system, the Simultix 15 high-throughput WDXRF spectrometer. Analyze beryllium (Be) through uranium (U) in almost any sample matrix. The most important metrics for automated process control are precision, accuracy and sample throughput. With up to 30 (and optionally 40) discrete and optimized elemental channels and 4 kW (or optionally 3 kW) of X-ray tube power, Simultix 15 delivers unparalleled analytical speed and sensitivity.
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In-Line X-ray Inspection System for Secondary battery
X-eye 9000 Series
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X-ray Tube100 kV / 200 µAMin. Resolution5 µmInspection Ability120ppm , 150ppm, 180ppmSystemConveyor / Index / Pick&Place 방식 LoadingDimension1,800(W) x 1,560(D) x 2,070(H)mm / 5,000kg
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Industrial CT- And X-Ray Solutions
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To examine things, to get to the bottom of them, to get to their core – this desire has always driven science, research, and development. X-ray technology from ZEISS has provided perfect insights for years in these and other areas. When it comes to quality and process control, it reveals what would otherwise remain hidden from even the most watchful of eyes – without destroying the part.
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Product
Benchtop Small Angle X-ray Scattering (SAXS) Instrument
NANOPIX mini
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Non-destructive measurement of particle size and size distribution.Rigaku NANOPIX mini is the world’s first benchtop small angle X-ray scattering (SAXS) system that is engineered to deliver automatic nanoparticle size distribution analysis for both quality control (QC) and research and development (R&D) applications. Nanoparticle size, size distribution, and particle shape are the key pieces of information obtained from SAXS. Samples may range from solutions, suspensions or slurries to solid plastics, rubbers or polymers.





























