Acoustic Microscopes
use high frequency ultrasound to image material.
See Also: Microscopes, Acoustic Microscopy, Infrared Microscopes, Atomic Force Microscopes, Ultrasound
-
Product
Pocket Microscopes
-
Powerful magnification with an extremely lightweight and portable design.
-
Product
Acoustic Wave (Acoustic Emission) Monitoring Solutions
-
Qingcheng offers a variety of solutions to solve some essential difficulties and problems in some industrial fields.
-
Product
Precigrader: Acoustic MSR System
-
Precigrader is an acoustic on-line strength grading system. The system is installed in more than 150 mills. It is used to determine common commercial grades in North America, including 1650 and 2100. A spring-loaded impact mechanism strikes the lumber as it passes. The resulting vibration is captured by microphones to determine the appropriate MSR grade.
-
Product
High-Resolution Scanning Probe Microscope
SPM-8100FM
-
The new HR-SPM scanning probe microscope uses frequency detection. his instrument is not only capable of ultra-high resolution observations in air or liquids, but for the first time enables observations of hydration/solvation layers at solid-liquid interfaces.
-
Product
AFM (Atomic Force Microscope) Optical Platform
-
The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
-
Product
Atomic Resolution Analytical Electron Microscope
NeoARM JEM-ARM200F
-
"NEOARM" comes with JEOL’s unique cold field emission gun (Cold-FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold-FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV."NEOARM" is also equipped with an automated aberration correction system that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging even at low accelerating voltages. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit.
-
Product
Custom Microscopes and Optical Systems
OpenStand
-
Whether developing new automation techniques and software or developing new imaging methods, you can quickly find that you need a microscope system tailored to your application and business needs. Prior Scientific has developed OpenStand® to offer a working platform to build OEM solutions and one-off customizations with excellent value for money and reduced development time.
-
Product
Integrated USBL Acoustic Tracking and Communication Systems
-
The TrackLink systems are the world's best selling USBL acoustic tracking systems with fully integrated high speed acoustic communication capability. Capitalizing on its benchmark Broadband Acoustic Spread Spectrum (BASS) technologies, LinkQuest provides the end users with solutions for underwater tracking and communication at sharply reduced cost and increased robustness. An extensive line of models are available to suit the users' specification and budget constraint.
-
Product
Semiconductor Wafer Microscope Inspection System
MicroINSPECT
-
MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.
-
Product
Digital Automated Interferometer and Microscope for Surface Inspection
DAISI-V3
-
The ultimate production interferometer for measuring end-face geometry on single-fiber connectors, equipped with a revolutionary «no-exterior-moving-parts» mechanical design.
-
Product
Light Sheet Microscopes
-
Life science research can place high demands on your imaging capabilities: Sometimes you need to image whole living model organisms, tissues and cells as they develop. Or you may want to observe subcellular dynamics in living samples over hours and even days. Light sheet fluorescence microscopy (LSFM) with its unique illumination principle is ideal for fast and gentle imaging of such specimens.
-
Product
Scanning Electron Microscope
JSM-IT510
-
Scanning electron microscopes (SEMs) are indispensable tools not only for research but also for quality assurance and manufacturing sites.At those scenes, the same observation processes need to be performed repeatedly and there has been a need to improve the efficiency of the process.
-
Product
Metallurgical Microscope
BXJ900 Series
-
Nanjing Kozo Optical and Electronical Instrument Co., Ltd.
LCD Metallurgical microscope is one new microscope, it is suitable to observe the sample while with the sharp image.
-
Product
Acoustic Emission Sensors
-
Acoustic wave (acoustic emission) sensors are the ceramic piezoelectric transducers converting the mechanical elastic acoustic waves generated in the material (e.g. elastic waves occur when a material cracks, wears, deforms, or corrodes) to electrical signals. The electrical signals are then amplified and filtered by a preamplifier and then transmitted to a special acoustic emission acquisition instrument for further data processing and analysis.
-
Product
Light Sheet Microscopes
-
Discover advanced light sheet microscopy solutions from Leica Microsystems. Our portfolio combines cutting-edge technology with exceptional imaging capabilities to enhance your research.
-
Product
Acoustic Calibrators
-
We offer a range of Class 1 and Class 2 acoustic calibrators for the field calibration of any make or model of sound level meters and noise dosimeters.
-
Product
NanoFluorescence Microscope
NFM
-
The NFM is a specialized optical microscope system custom-designed for imaging individual single-walled carbon nanotubes (SWCNTs) through their intrinsic short-wave infrared fluorescence. It is ideal for SWCNT studies in physics, chemistry, biomedicine, and environmental research. The NFM is the new, more affordable replacement for our pioneering NM1 Fluorescence Microscope.
-
Product
Spectroscopy Upgrade for Any Microscope
SMS
-
Get a simple upgrade to your existing microscope, or a turnkey microspectrophotometer system that works out-of-the-box.
-
Product
Laser Scanning Microscopes
-
The Olympus FLUOVIEW confocal microscopes are designed for high-resolution, confocal observation of both fixed and living cells, enabling visualization deep within samples. From the New FV3000, optimized for the most robust interactive live cell and tissue experiments, to easy-to-use high content imaging, explore the wide range of options with Olympus exclusive optical technologies.
-
Product
Ultrafast Nearfield Optical Microscope
Femtosecond NSOM
-
Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nano-manufacturing.
-
Product
Temperature Controlled Microscope Stage
-
Linkham Scientific Instruments
Specialists in temperature controlled microscopy, Linkam Scientific Instruments, announce the launch of their Optical DSC450 which enables simultaneous visualization of thermal processes for improved materials characterisation. The Optical DSC450 enables the user to measure glass transitions and melting behaviour of a wide range of substances whilst accurately controlling temperature from -196 °C to 450 °C. The atmosphere of the stage can also be purged with gas as required by the user. A new feature which will increase the characterisation capabilities of the DSC system is to combine it with imaging capability. The new LINK Digital Imaging module enables additional information to be obtained by correlating optical changes such as colour with temperature. The new TASC analysis tool takes this further. TASC (Thermal Analysis by Surface Characterisation) is a new image analysis capability which enables structural changes in samples to be tracked and quantified optically. It has the unique ability to measure local transition temperatures allowing different points on a sample to be identified. The new DSC system is great tool to use in research and quality control to measure quantitative values for glass transitions, melting peaks and sample purity and, when combined with TASC, even sample homogeneity.
-
Product
Acoustic Emission Calibrator
-
AE calibrator is similar to a simple signal generator, it can generate a variety of controlled waveform signal, different types, different amplitude and different frequency. It can help users calibrate acoustic emission detection equipment before acoustic emission detection.
-
Product
Noise Control And Acoustical Consulting Services
-
Our acoustical consultants use the latest and most advanced noise prediction and modeling software, precision sound measurement equipment and detailed acoustical analysis that enable us to help our clients achieve their project's noise requirements and goals. Contact us before your noise challenges become noise pollution problems.
-
Product
Microscopes
-
Probing Solutions offers Microscopes made by Azoom, Excelitas, Meiji, Leica, Mitutoyo, and Motic. To order Microscopes, please call PSI at (775) 246-0999, or email sales@probingsolutions.com for a quote.
-
Product
Electron Microscope Sample Preparation
-
Excellent sample preparation is the prerequisite for first-class electron microscopy. Be prepared – for great results in EM Sample Preparation! Perfect preparation makes the difference between trying and achieving, between failure and success, between results and excellent results. So be prepared for great results with Leica Microsystems!
-
Product
Acoustic Calibrator
Beddrock BACx
-
The Bedrock BAC1 and BAC2 acoustic calibrators are used to accurately verify (and if neccesary adjust) the level calibration of your Bedrock acoustic measuring instruments. We recommend the BAC1 for the Bedrock SM90 class 1 instrument, and the BAC2 (which complies with class 2) for the Bedrock SM30 and SM90. Each calibrator comes with an individual calibration certificate.
-
Product
Scanning Electro-chemical Microscope
920D
-
The scanning electrochemical microscope (SECM) was introduced in 19891 as an instrument that could examine chemistry at high resolution near interfaces. By detecting reactions that occur at a small electrode (the tip) as it is scanned in close proximity to a surface, the SECM can be employed to obtain chemical reactivity images of surfaces and quantitative measurements of reaction rates.
-
-
Product
Scanning Probe Microscope
SPM-9700HT
-
Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to observe their three-dimensional image or local properties at high magnifications. The SPM-9700HT takes high-throughput observations to the next level.
-
Product
Acoustic Imaging
-
Acoustic imaging offers cutting-edge solutions for precise leak detection, partial discharge identification, and mechanical fault diagnosis. With high-performance microphone arrays and advanced algorithms, our products ensure exceptional industrial safety and perfomance.
