Probe Systems
use programmable motorized staging to position contacting pin s.
See Also: Probe Stations, Flying Probes
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Electrical Probe Systems
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INSTEC's Probe Systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range.Compact Mini Probe Stages enable an existing inspection microscope or optical test setup to be converted easily into a precision temperature-controlled semiconductor testing and qualification station.Analytical probe stations are fully featured industry-standard platforms for all modern probing applications and testing.Benchtop Probe Stations provide the user with four independent electrical probes with X,Y,Z micropositioning for precise placement without opening the sample chamber.Highly configurable probe systems meet a range of requirements for atmospheric and temperature control, sample areas, and electrical measurements.
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MPI Fully Automatic Probe Systems
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MPI Advanced Semiconductor Test
Addressing the RF and High Power communication devices and discrete passive components production test market requirements, MPI introduced the TS2500 200 mm fully automatic probe system series. The system is based on industry leading production equipment from the Photonics Automation Division and incorporates decades of experience in RF and High Power measurement techniques from the MPI’s Advanced Semiconductor Test (AST) Division in combination with other AST products such as RF Probes, related calibration technology, and High Power accessories.
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Kelvin Probe Systems
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Kelvin probe measures the work function difference between the tip and the sample when in thermoequilibrium state (a), and measures the electrical potential when the sample is illuminated (b), which is the sum of the difference in workfunction and internal/external-applied voltages.
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MPI Manual Probe Systems
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MPI Advanced Semiconductor Test
manual probe systems are open, easy to use and cost effective yet highly accurate. These systems are designed for precision analysis of substrates and wafers up to 150, 200 and 300mm.
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MPI Automated Probe Systems
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MPI Advanced Semiconductor Test
MPI’s 200 mm and 300 mm automated probe systems are dedicated and designed to address current and future requirements for all facets of Device Characterization for Modeling and Technology/Process Development, Failure Analysis, Design Verification, IC engineering, Wafer Level Reliability as well as special requirements for MEMS, High Power, RF and mmW device testing.
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Fully Automatic MRAM Probe System
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*This system can measure MRAM characteristics automatically.*Generates strong and constant magnetic fields. (Max 1.5T, the highest in the industry)*Performs high speed sweep of magnetic field by using non-magnetic materials wafer chuck. (Max 4Hz, ±1T, the highest in the industry)
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Pilot Control Software Suite
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The SemiProbe PILOT Control Software Suite semiautomatic and fully automatic probe systems employs the SemiProbe patented Adaptive Architecture. Software modules can be added to the base system as needed. PILOT Control Software consists of a Microsoft Windows-based user interface built on the SemiServer application for communicating to and from the probe system. Individual customer applications can be integrated with PILOT Control Software for a customized system to meet individual needs.
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Product
Sampling Scope Adapter
N5477A
Adapter Module
The N5477A sampling scope adapter makes the InfiniiMax III probing system fully compatible with the Infiniium 86100 DCA sampling scope family. With the N5477A, the DCA modules have 30 GHz of probing, increasing their performance and flexibility.
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Custom solutions
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Novacam develops custom interferometric solutions to address particular inspection and imaging needs of specialized applications and OEM markets. Our modular interferometer components offer a superior and cost-effective platform for developing high-performance systems and assemblies. We will collaborate with your application experts to devise the optimal combination of inteferometric (OCT) hardware, non-contact fiber-based sensor probes, and system software.As needed, Novacam engineers: develop customized optical probes and inspection stations develop inline probe fixtures for production environments adapt Novacam standard interferometer component modules to suit your application help integrate Novacam systems or components with third-party tools write customized software
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Semi-auto 4 Point Probe System for Solar Cell Substrate
RG-100PV
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*Measurement system for thin film on substrate samples for multi-points measurement*Even pitch and random pitch for Max.1,000 points*2-D/3-D square mapping software for even pitch
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General Purpose Probe
PIT-6
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PIT-6 General Purpose Probe for Pressurized Systems - 6'' #304 stainless steel shaft. Diameter is 1/16''. Immersible. Maximum temperature 350°C, Time constant 0.5 Seconds. Shaft Terminated in a sub-miniature Type T Thermocouple plug. 10 foot Sub Miniature Type T extension lead supplied. Not isolated.
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Ultra-High Vacuum
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KP Technology offer a range of Kelvin Probes that work under ultra-high vacuum conditions, choose from single-point or scanning probes to add to your existing vacuum chamber, customize the UHV corner cube or consider the newest addition to the range, the Ф4 ultra-high vacuum scanning Kelvin Probe system.
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Ambient Single Point Kelvin Probe System
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This single point Kelvin Probe System operates under ambient conditions and is small enough to be placed in a customized glowth box. The probe head operates with an oscillating membrane and can be easily exchanged. The preamplifier is integrated inside the probe head.
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MPI PCB Probe Systems
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MPI Advanced Semiconductor Test
Every MPI manual probe systems can be configured with a variety of different holders for printed circuit boards (PCB’s) in order to provide in addition to on-wafer, versatile, convenient, and accurate Signal Integrity (SI) measurements with single-ended or differential RF probes. Measuring signals at the end of the channel for eye-patterns, deterministic jitter, distortion, TDR (Time Domain Reflectometry) impedance, cross-talk, coupling, and losses, or even S-parameters is easily accomplished.
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Precision Flying Probe Platforms For Automated Test Applications
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Flying Probe technology is used to automate the testing of printed circuit boards (PCB) that would otherwise have to be tested manually. Adding a Huntron Access Prober to your test procedure will significantly decrease test times therefore increasing productivity.Access Probers can accurately place a probe on test points with high accuracy achieved using micro-stepping motors and linear laser encoders. Probing the smallest surface mounted devices is possible. Huntron Access Probers can automate your unique test process using the standard probe or by adding a custom probe of your design. Huntron offers three Flying Probe system configurations based on PCB size and test head requirements.
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Advanced JTAG Emulators
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Blackhawk offers JTAG Emulators ranging from entry level to full-capability debug probe models supporting System Trace (STM), starting at $99. This includes XDS100v2, XDS200 and XDS560v2-class models that are compatible with Code Composer Studio.
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CMM Retrofits
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Eventually, measurement software, probe systems and controller electronics become outdated by newer, faster, better systems. Our range of standard retrofits and upgrade kits will inject new life into your measuring machine.
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Probe Systems
Mini-PS4L
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The mini-PS4L series of probe systems are built using a similar concept as our patented Probe System for Life (PS4L) Architecture. The base system is built on a 300 mm x 300 mm metric breadboard and that allows the user to configure the system to meet the application and budget.
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Test House Services
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Microtest provides complete test house services in a clear room equipped with the state of the art handler and wafer probing system using its own innovative ATE.The test house operates in hot, cold and room temperature for both production and characterization test.Innovative reliability system for Burn In and HTOL ServicesStatistical analysis is performed for digital and mixed-signal devices.Microtest Pacific Test house is located in Malacca (Malaysia).
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Device Characterization
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Probe systems for device characterization must be particularly flexible because many different measurements often must be performed; DC, IV/CV, Capacitance, HF, 1/f, temperature and more. The modular architecture of the PS4L product line is ideal for these broad requirements.
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Probe Card Analyzers
PB1500
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The PB1500 is a low cost probe card analyzer system. It has the capability to perform all the tests done on the larger PB3600/6500 probe card analyzers, but at a lower cost for low pincount cards. A maximum of 1,280 channels may be configured in the PB1500 MUX system. The Precision Measurement Unit (PMU) has the same accuracy, repeatability and range as the larger analyzers. The repair process consists of selecting a failing probe, which moves it under the binocular microscope and positions a crosshair over the correct position for that probe.
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Probe System for Life
PS4L
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The Probe System for Life, or PS4L, is SemiProbe’s patented adaptive probe system architecture. Unlike traditional probe systems, all of the basics components of our systems, including the bases, stages, chucks, microscope mounts, and manipulators, are interchangeable, upgrade-able, and configurable. The PS4L Adaptive Architecture ensures and optimal test configuration for each individual customer application.
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Single-Point Kelvin Probe
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Our Single-Point Kelvin Probe system (KP020) is the introductory system in the KP Technology product family. The off-null signal detection method allows high-quality measurements of the Work Function/Fermi Level of materials.
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Supported Test Systems
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TTCI is a leading solutions provider of application development for test systems from Seica, Keysight, Teradyne, Digitaltest, and XJTAG. We offer a wide variety of testers and test solutions to meet your needs. Our Seica Pilot and Digitaltest Condor flying probe systems can handle all of your low- to mid-volume production, prototypes, and PC boards with accessibility issues. The Keysight 3070 and Teradyne TestStation can address your larger production runs and fixture requirements. In addition, we can also address your functional and boundary scan needs.
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Tunable Laser Hydrogen Chloride Analyzer
TX-100
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Laser HCl analyzer with a probe type optical system which employs direct insert method. TX-100 is suitable for monitoring HCl concentration in incineration plants and the control of HCl removal process in various industries including cement factories and petrochemical plants, etc.
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Wafer Probe Test System
STI3000
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The STI3000 is a wafer-level MEMS and mixed signal ASIC probe test system that combines several functional STI test equipment blocks for testing gyros, accelerometers, pressure sensors, microphones, resonators, and mixed signal ASICs.
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Flying Probe Testers
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Flying probe test systems require no test fixturing, have few restrictions on board access, and can test boards with virtually unlimited number of nets. These systems also allow developers to complete test programs in a short time.
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Wafer/Chip/Package Semi-automated ESD Tester
400SW
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Tokyo Electronics Trading Co., Ltd.
Semi-automated ESD tester featuring Ecdm 400E, Universal ESD Simulator. Used with a manual wafer probing system or a die manipulator, wafer or die level semi-auto ESD test can be done, as well as packaged device test. Damage is detected by V-I curve or leakage current change detection. Stress level and measurement points are programmed by personal computor via GP-IB. Once test terminals are selected, ESD endurance is automatically measured.
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Revolution CMMs
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Advanced Industrial Measurement Systems
A coordinate measuring machine (CMM) measures the geometry of certain physical objects along their X, Y, and Z axes. The CMM’s probing system scans objects at precise points to determine dimensions, angularity, size, profile, and angularity. These capabilities have many applications across different industries. In this blog post, we’ll explain the benefits of CMM technology and the types of machines we offer.
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Multi-Cell Test System
Cellcia
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Next-generation wafer probing system for 300mm wafers. The multi-layer system structure maximizes the efficiency of testing, further reducing the total testing cost.
