Functional ATE
Automated application specific testing system.
See Also: Functional Test, ATE, Functional Test Systems
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Product
Arbitrary Function Generators
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PeakTech Prüf- und Messtechnik GmbH
This arbitrary waveform generator has excellent technical properties, a variety of functions. In addition to the frequency sweep, burst and modulation functions, this device also has a 7-digit frequency counter with a wide range of measurement functions up to 350 MHz. Due to the high number of functions and easy handling, this device is ideal for almost all tasks in research, development and training.
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Product
Drop-In Functional Test Fixtures
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Circuit Check’s drop-in base fixture and replaceable personalized plates are the ideal solution where production volumes are lower and the need to change from one fixture and test program to another occurs quickly. Interchangeable test fixture drop-ins enable the same test system to be quickly reconfigured with different tooling and probe patterns for different products. This maximizes equipment re-use, while minimizing the cost for each new test. With Circuit Check’s base fixture and drop-ins, the wiring and test electronics are not disturbed, thus ensuring configuration consistency each time the system is re-tooled.
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LXI Function Card Carriers
ProDAQ 6100 Series
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Ethernet-based LXI is changing the way engineers and scientists perform test and measurement and data acquisition. As more and more PCs ship without expansion slots, customers are faced with the problem of replacing their test and measurement and data acquisition equipment. Bustec believes in the power of distributed systems and the use of IEEE standards.
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Product
Arbitrary Waveform Function Generator PXI Card
GX1110
Waveform Generator
The GX1110 is a high performance, single-channel PXI arbitrary waveform generator that offers function generator and arbitrary waveform generator functionality within one instrument. Built-in waveforms are available for use with both the DDS or AWG modes of operation and include Sine, Triangle, Ramp, Noise, Gaussian pulse and Sinx / x. A flexible sequencer is also available as part of the AWG's architecture, supporting the generation of complex waveforms.
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Product
0.1Hz-2MHz Functional Generator
MFG-3002
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Features:*Frequency of the models: 0.1Hz~2MHz/5MHz/10MHz/13MHz/15MHz*Output waveform:Sine,Triangle,Square,±Ramp,±Pulse*Voltage Control Frequency (VCF) capability*TTL/CMOS and OUTPUT synchronous output*Less than 1% distortion at 10Hz~100kHz*Less than 0.5dB frequency response at 0.1Hz~100kHz*1Hz~30MHz frequency counter*AM/FM function optional (models with suffix "A" include this function)*FM/Sweep function optional (models with suffix "C" include this function)
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Product
PXIe Multi-Channel Function Generator Module, 16-Channel
43-625-003
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The 41-625-003 (PXI) and 43-625-003 (PXIe) are function generator modules that provide 16 channels in a single PXI/PXIe slot. They can generate sine waves to 300 kHz with 5.76 mHz frequency resolution referenced to the 10 MHz PXI clock. The output voltage range is up to +/-25 V in a 16-bit resolution. It also support PXI trigger functions allowing events from other instruments to initiate waveform generation or sweeps.
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Product
SparkFun MicroMod Ethernet Function Board
W5500
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Integrate your MicroMod project into an Ethernet network including Power-over-Ethernet with the SparkFun MicroMod Ethernet Function Board. This specialized Function Board uses the W5500 Ethernet control module from WIZnet and a DC/DC converter to configure a MicroMod assembly as a connected and powered device into an Ethernet network with a Power-over-Ethernet (PoE) system.
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Functional Testing For Critical Software
RapiTest
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*Requirements-based testing for Ada, C & C++ on-host & target*Reduce test authoring effort through easy-to-use test formats*Manage project artifacts with requirements traceability*Simplify verification through integration with your CI tool*Produce evidence for DO-178 and ISO 26262 certification
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Product
Functional Testing for Evolved Packet Core (ePC/VePC)
PacketCraft
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is a software-only functional tester for ePC and VePC networks. It is installed on a customer laptop or desktop, or on a virtual PC in the cloud.
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Product
Advanced 4-CH Encoder Card with High-speed Triggering Function
PCI-8124-C
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PCI-8124-C is a 4-CH trigger board which is suitable for advanced line scan application which need high line rates. PCI-8124-C has internal FIFO to realize the high speed position compare and trigger pulse output. For this application, ADLINK proposes you can use PCI-8134 and PCI-8124-C together to gain the advantage of motion control and high speed trigger function. For position compare, PCI-8124-C provides two method: linear function or variable interval. PCI-8124-C also provides the variety of mapping function between comparator and trigger output. The comparator condition can be associated with latch signal, TTL input and EA/EB signal.
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Product
DIO Function Cards
ProDAQ 3600 Series
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The ProDAQ 3600 Series digital I/O (DIO) function cards are high-density cards that fit into ProDAQ VXIbus motherboards and LXI function card carriers. ProDAQ instruments are versatile, providing users with the highest channel density and functionality available on the market. The ProDAQ 3600 Series function cards are supplied with drivers for use with all popular software packages. The driver automatically detects and initializes all the function cards installed in one of the ProDAQ VXIbus motherboards or LXI carriers, removing any possibility of configuration errors.
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Product
Function Test and In-Circuit Test
CT350
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ICT test points: max 2736 CAD Data import Automatic program generator Powerful debugging tools Test coverage analysis Paperless repair station Logging- and statistic functions Full graphical functions Panel and multisite tests Fast adapter exchange High Pin Count-Interface On table optional usable shelf part.
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Product
Modular Functional Test Platform
LX-OTP2
Test Platform
The OTP² system platform has recently been available in both the PXI and LXI versions. The OTP2 system platform enables the cost-effective and fast implementation of function test systems based on defined modules and function blocks. Thanks to the open system interfaces, customer-specific adjustments can be made at any time without any problems. When considering options for your next generation functional test system, it is important to assess the entire life cycle of the system and the associated costs and efforts. Use OTP² to accelerate development cycles and reduce the development effort for new functional test systems.
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Automotive Electronics Functional Test Systems
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Keysight Technologies’ TS-5000 Family of Automotive Electronics Functional Test Systems helps automotive electronics manufacturers get their products to market faster by accelerating test system deployment. It utilizes common architecture and core instrumentations to offer maximum flexibility to keep pace with the dynamic changes in the automotive electronic industry.
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Modular Functional Testing Platform
OTP2
Test Platform
Functional testing is an important part of product development and manufacturing and is used to ensure quality, performance and reliability from launch to end of life. A modern, future-proof functional test system must meet many criteria in order to meet the ever-growing demands of the industry. The OTP 2 open test platform developed by LXinstruments meets the following requirements for a dynamic and highly competitive market.
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Product
Multi Function Calibrators
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This range of multi function calibrators are designed for accurately simulating various sensor values such as temperature, voltage and current for calibration purposes.
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Product
JTAG Functional Test
JFT
Functional Test
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Arbitrary / Function Generators
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Today's designs are often complex, demanding a variety of stimulus signals during test. With standard waveforms, arbitrary waveform capability and signal impairment options, a Tektronix Function Generator supports a wide range of application needs with one instrument. Best-in-class Function Generator performance from Tektronix AFGs ensures signals are accurately reproduced.
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Product
8-Channel VME Function Generator
V340
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The V340 provides eight independent DDS-synthesized waveform outputs, each programmable for frequency and amplitude. Any output may be switched to a front-panel test connector, allowing in-crate calibration check without removing field cables.
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Product
Mixed function mezzanine side card for CPCI-S CPU boards
SCX-PCIE
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The SCX-PCIE is a mezzanine side card for EKF CPU boards, equipped with a PCIe® Gen3 packet switch, onboard NVMe and SATA mass storage, and high-speed front I/O.
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Product
Distributed 4-Axis Motion Control Modules (with High-Speed Trigger Function)
MNET-4XMO-(C)
Motion Controller
The MNET-4XMO is a 4-axis motion controller module for Motionnet distributed motion systems. It can generate fast frequency pulses (9.9 MHz) to drive stepper or servomotors in the machine automation field. As a motion controller, it can provide comprehensive motion functions which include 2 axis circular interpolation, 2-4 axis linear interpolation, or continuous interpolation for continual velocity and so on. Also, changing position/speed on the fly is available with a single axis operation.
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Product
Frequency Response Function
FRF
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FFT Spectral Analysis. Frequency Response Function (FRF) is a commonly used measurement type of the Dynamic Signal Analyzer. FRF is defined as the ratio of response i.e. acceleration, velocity, or displacement with respect to the excitation force which is the reference.
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Turn-Key Functional / Mechanical Fixture
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In addition to In-circuit testing, functional testing is widely used in the industry to verify electronic cards. This is why ReMaTek has always paid a special attention to the specific requirements of functional testing. Our dedicated engineering staff is prepared to handle all of your mechanical, electrical and software requirements. We are aiming particularly the small turn-key test systems where all the elements; the mechanical fixture, the test equipment and the test software, are put together in a complete system.
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Flexible Functional Tester
igentic® 421t
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Electronics customers require greater test flexibility to address the growing trend towards high-mix, low-volume printed circuit board (PCB) production. Sterner Automation is pleased to introduce the igentic® 421t, the next generation of automated test solution specially engineered to address these challenges. The igentic® 421t provides the flexibility, reliability and efficiency needed in one standard platform, allowing our customers to test multiple PCB's and significantly reduce individual product testing costs.
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Functional Testing Services
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We manage an in-house team of testing specialists having sufficient experience to perform quality functional testing activities.ImpactQA exhibits cross-browser & cross-platform testing capabilities together with the latest interoperability testing methods to assess functionalities across multi-faceted systems.Unlike other functional testing services, our testing model is loaded with adaptable properties to perform white-box testing and functional testing of Java and .Net applications.
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Product
FAult Detector and OScilloscope 9 Functions in 1
FADOS9F1
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Prot-Ar-Ge Industrial Project Design R&D Ltd. Co.
2 unique features are added to the FADOS9F1 over the FADOS71. First feature is the Programmable DC Power Supply; It can be adjusted between 0-16V and 20-1500mA with power output; the DC Voltage/Current graphs of the electronic card power supply can be produced. The second feature is the “IR Remote Temperature Measurement Sensor”; this sensor is used to find the components that heat up by drawing too much current. Using these two features together may reduce the time for trouble shooting some malfunctions by 5 to 10 times. These features can be used as a new technique for trouble shooting.
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NI's Electrical Functional Test Solution
Functional Test
PXI instrumentation ensures complete and accurate test coverage with a modular architecture mounted in ultra-reliable PXI chassis.TestStand and LabVIEW software provide rapid development of complex test steps and sequences. PXI systems conserve floorspace because of their small, light form factor. Order them preassembled and installed using NI ATE Core Configurations.SystemLink™ software deploys updates and democratizes data insights to optimize operational efficiency.
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Product
Arbitrary Function Generator
AFG31000
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The AFG31000 series with InstaView™ technology is the first high-performance AFG with built-in waveform generation applications, patented real-time wave monitoring, and a modern user interface.
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Product
0.1Hz-5MHz Functional Generator
MFG-3005
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*Frequency range: 0.1Hz~5MHz*Output waveforms: Sine ,triangle, square, positive and negative pulse, positive and negative ramp*Output impedance: 50Ω±10%*Output Amplitude: Not less than 20Vp-p(open circuit)*DC voltage: 0~±10V continuously adjustable*Symmetry range: 90:10—10:90*Rising edge of square: Less than 100ns
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Product
Functional Test System Optimized For Real-Time Digital Bus Test
Spectrum HS
Test System
Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.
