Mechanical Fixtures
Use cams or levers to bring UUT to contacting elements.
See Also: Fixtures, Test Fixtures, Vacuum Fixtures, Pneumatic Fixtures, Manual Fixtures
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Latch-on Test Fixtures
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Latch-on Test Fixtures provide a convenient way for production personnel to quickly and reliably make electrical connections to a product for programming or final test. These custom fixtures eliminate the need to hand-wire products in order to power them up and communicate with them. Typical applications for latch-on test fixtures are metering devices, control panels, and any type of controls that connect via terminal strips.
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Product
Exchangeable Test Fixture
MA 2112/D/H/S-7/GR228x-15/15
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,46 kg
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Product
Soil Mechanics
INSITU
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The INSITU program interprets statical and dynamical geotechnical in situ tests. In order to interpret the SPT tests, the program utilises the main correlations that are normally used to determine the geotechnical parameters of a soil. One should enter the geometrical and geotechnical parameters pertaining to the stratigraphy surveyed trough drilling and the number of blows relative to each test; some corrective parameters can be entered that enable one to limit the perturbations in the interpretation of the data caused by the way the test is performed and the type of instrument that is used.
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Remote Docking Fixtures
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RTI offers a variety of docking interfaces including our Standard OctoPogo series with interchangeable alignment plates to third party test fixtures. RTI has developed many complete interface solutions, including everything required to interface to various test systems.
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Product
200 Vdc External Voltage Bias Fixture
16065A
Test Fixture
Measure a DUT with up to +/-200 V DC bias and also measure axial/radial lead components
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Product
Manual Fixture Kit
230371 – CMCSK-02-01
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Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Product
Manual Fixture Kit
230372 – CMCSK-03-01
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Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Product
Custom Fixtures
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The shock and vibration fixture model BW-SV-3X3X3 is designed to accept up to 24 each of the TO-3 packages on each of the 6 axes and mount to the vibration shaker model BW-100C and Shock Tester model BW-E5000. The fixture is made of white derlin and measures 3”x3”x3”and weighs approximately 13 ounces. The fixture includes a white derlin cube with a 2 ¼” bolt circle and 4 10-32 x 3” cap screws.
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Product
28 cm2 Test Fixture Operations Kit
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The 28 cm2 Cell Test Manifold Kit offers a highly effective solution for testing of individual planar solid oxide fuel cells. The kit contains all items necessary to easily mount cells with ~100 cm2 substrates. Designed for both long and short term experiments to measure properties such as fuel utilization, thermal gradients, red-ox cycling and longevity/degradation, these kits will accelerate your research and development activities.
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Product
Stand-Alone Test Fixture
MA 2013/D/H
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 22,00 kg
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Product
In-Circuit Test (ICT) Fixtures
Test Fixture
At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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Ethernet Test Fixtures & Software
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We have developed a series of custom testing tools as part of our dedication to performing the most comprehensive Ethernet testing in the industry. These tools allow for testing at lower layers than most commercially available tools and are available for use in your own testing labs. In addition, we have an extensive amount of T&M partner test tools which members of our Ethernet testing services also have access to.
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Product
High Speed Spin Fixture
1571P Series
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The Model 1571 High Speed Rate Table System is designed to provide a precision high velocity testing solution for the development and/or production testing of inertial packages or their components.
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In-Circuit Test Fixture Design Services
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An integral part of board test is the test fixture. Innovations in board technology may manifest themselves as challenges in test fixture design. Utilizing a creative & systematic design philosophy, Acculogic consistently delivers state of the art solutions for the most complex test interface problems.
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Product
Mechanical Wedge Action Grips
2716 Series
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The Instron mechanical wedge action grips are durable tensile grips designed to automatically increase clamping force as test loads rise, maintaining fixed jaw positions and preventing slippage. Their open-front, moving-body design allows easy specimen insertion while ensuring consistent gauge length and minimal compressive force during clamping, making them a versatile gripping solution and particularly suitable for testing high-strength materials such as metals and composites.
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Cryogenic Millimeter-Wave / Microwave Test Fixtures and Calibration Kits
upj10
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KEYCOM''s cryogenic millimeter-wave / microwave test fixtures and calibration kits are specifically optimized for testing the performance of patterns between the edges of printed boards(edge type) and circuit testing on the printed boards(probe type). They are also designed to minimize heat capacity by miniaturizing their dimensions so they cool off efficiently, and materials with low coefficient of linear thermal expansion such as invar are used for major parts where high dimensional stability is required. Their operating frequency ranges from DC to 110GHz.
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Product
Test Fixture (SMD Components)
16034E
Test Fixture
Perform impedance evaluation on a minimum SMD size of 1.6(L) x 0.8(W) [mm]
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Product
Test Fixtures & Test Sets
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Keysight test fixtures are used to hold electronic components or materials (physically and electrically) in order to perform various measurements. Keysight offers a variety of test fixtures from Parametric, Dialectrice, Liquid test fixtures and more.Some of our test fixtures allow you to connect directly to your measurement instrument, while others require various adapters.
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Product
Open Source Hardware Test/Programming Fixture
OpenFixture
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OpenFixture is a fully parametric programming/test fixturing solution written in openscad. The inputs are generated/captured from the users board layout software and a laser cuttable fixture is generated automagically.
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Test Fixtures & Jigs
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A test fixture or test jig is the component containing the bed of nails used for testing the PCB or assembled product. It is powered and controlled by the Yelo Testpoint system which has test cards capable of providing multiple test conditions. This system also controls the probes used in the bed of nails, and relays test information back to the Testpoint system to be analysed.
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Product
EBIRST 200-pin LFH Verification Fixture
93-002-101
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The 93-002-101 200-pin LFH Verification Fixture is an accessory for the eBIRST range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces switching solutions.. The tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Dual Servo Electrical Test Fixture
TA-334001
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The TA-334001 is a Dual Servo Electrical Test Fixture made to be an equivalent substitute for the Honeywell test fixture T-334001. The test fixture front panel duplicates all the proper switch numbers and descriptions so the technician can follow by the book testing. The panel overlay text is reverse screened (backside) to insure that text quality will not degrade over time. All the appropriate test jacks are provided on the panel for servo pin and bracket breakouts. This fixture provides for the switching of motor direction, clutch, tach selection, synchro selection, limit switching and polarity relays. Panel meters are provided on the test fixture so that the technician can monitor the servomotor voltage as well as clutch voltage and current.
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In-Circuit Test Fixtures
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In-circuit testing provides electronic manufacturers a reliable, high fault coverage verification method for the assembly process. Circuit Check ICT fixtures are robust, reliable and designed for easy customization to cover a large range of PCB sizes without impacting turnaround time. We stock a large variety of fixture sizes and actuation methods to meet your test demands. If a stocked sized ICT fixture is not adequate our engineering staff will design a custom solution.
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RF Functional Test Fixtures
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EMC Technologies’ design team has developed a variety of test adaptors and test stations for testing RF circuit assemblies and microwave sub-assemblies.
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Debug Fixture
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With at-speed test, debug can easily become a problem: If test points are on the bottom, as is often the case for test processing, then this requires the board to be flip over for the debug. However, during at-speed testing, key devices and signal paths are often on the topside. IST Engineering has in-house expertise with debug fixtures, which allow the test technician to flip over a test board, or even hold it vertically for dual-sided access, while still running the Device-Under-Test at full-speed through card-edge connectors - whether these are standard DIN type or F or N type co-ax connectors. The debug stations are constructed robustly, with metal frames and high-grade flexible cabling and can also be used as backup test stations in a manufacturing flow. They can be built with custom machined waveguide connections for RF/Microwave applications, or with standard, off the shelf connectors, as defined by the application. A number of these debug fixtures are in production use with a range of customers.
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ICT/FCT-Fixtures Max UUT 370 × 300 mm (wxd)
CK-2 Large (Hold-Down Gate) / 230158
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
Automatic Fixture Removal
S95007B
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Many devices do not have coaxial connectors and so they are put in fixtures in order to measure them in a coaxial environment. You must accurately remove the effects of the fixture to get a good measurement of the device under test (DUT). This option adds a powerful application wizard to guide you through characterizing a fixture and removing it from the measurement. The S95007B software is compatible with M980xA PXI Vector Network Analyzers.
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Product
RF-Ready DC Fixture
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The RF-Ready DC fixture provides space for mounting RF input and output matching circuits. Hence, it is possible to tune up the assembly at a remote test station, such as a network analyzer, to peak performance and then run the life test with DC stimulus. The matching structures also allow incorporation of more complex stabilization structures.
