Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Product
Digital Microscope
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A variation of a traditional optical microscope in which a digital/microscope camera is connected, and image output is displayed on a screen and/or monitor. Most models include software and a computer for use.
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Product
Electronic DC Load, 500V, 16A, 400W
LDH400 Series
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Versatile solution for direct testing of dc power sources and PFCsConstant current, resistance, conductance and power modesWide voltage and current range, 10 to 500V and 0 to 16A400 watts continuous dissipation at 28°C (360W at 40°C)High resolution and accuracy for level settingBuilt-in transient generator with variable slewCurrent monitor output for waveform viewingVariable drop-out voltage for battery testingHigh resolution backlit graphic LCD with soft key controlAnalogue remote control of levels and TTL control of on/off and transient switchingFront and rear input terminalsLoad inputs rated to CAT II (300V)Full bus control via USB, RS232 and LXI compliant LAN interfacesGPIB Option
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Electronics For Signal Processing
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PCB Piezotronics manufactures a wide variety of electronics to power ICP®, PE (Charge Mode), MEMS, strain gage and other types of sensors. All of these products provide conditioning of sensor signals for transmission to data acquisition systems.
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Atomic Force Microscope for SEM/FIB
AFSEM® AFM Insert
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AFSEM is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The correlated image data of AFM and SEM enable unique characterization of your sample, and the combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM enables you to easily combine two of the most powerful analysis techniques to greatly extend your correlative microscopy and analysis possibilities.
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Electron Diffraction System
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Modern physics is the post-Newtonian conception of physics. It implies that classical descriptions of phenomena are lacking, and that an accurate, " Modern", description of nature requires theories to incorporate elements of quantum mechanics or relativity, or both. This section includes many of the most important experiments in physics, including e/m tubes, the Franck-Hertz experiment, and nuclear magnetic resonance (NMR)
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Programable Power Supply & Programable Electronic Load
PW-8033P
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*DC 0~32V / 0~3A X 2 + Fix 5V/3A*Triple Output 207 VA High Power*4 Digits, 4 Display*Programable Control, 9 Memory*Built In USB Interface*Series 0~64V / 0~3A Operation
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Programmable DC Electronic Loads
SDL1000X/X-E Series
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SDL1000X/SDL1000X-E series Programmable DC Electronic Load has a 3.5 inch TFT-LCD display, a user-friendly interface and superb performance specifications. The SDL1020X/SDL1020X-E models feature an input range of 150 V/30 A 200 W while the SDL1030X/SDL1030X-E have an input range of 150 V/30 A 300 W. The SDL1000X series leads with measurement resolution of 0.1 mV/0.1 mA and the base SDL1000X-E series resolution is 1 mV/1 mA and adjustable current rise times from 0.001 A/μs~2.5 A/μs. For remote communication and control, the SDL series includes RS232/USB/LAN interface types. The SDL1000X series delivers stability over a wide range of applications and can meet all kinds of testing requirements. including: Power, battery/handheld device design, industry, LED lighting, automotive electronics, and aerospace.
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64-Channel Boundary-Scan Digital I/O Scan Module
JT 2111/MPV DIOS IDC
Digital I/O
The JT 2111/MPV is a 64 channel boundary-scan digital I/O scan module enclosed in an impact resistant housing. The module is designed to test and control edge connectors, on-board connectors and logic clusters in boundary-scan applications. Multiple modules can be connected serially to increase the number of I/Os. Available with 96-pin DIN 41612 connectors and 20-pin 0.1″ pitch IDC connectors.
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RF Electronic Calibration Module (ECal), DC/300 KHz To 9 GHz, 7mm, 2 Port
85091D
Electronic Calibration Module
The Keysight 85091D RF electronic calibration (ECal) module makes the calibration of vector network analyzers fast, easy, and accurate. ECal is a precision, single-connection calibration technique for your vector network analyzer. Performing a full two-port calibration takes less than half the time and a number of connections using ECal versus mechanical calibration kits. Furthermore, the accuracy of the calibration is comparable between electronic and mechanical methods. Traditional mechanical calibrations require intensive operator interaction, which is prone to errors. With ECal, the operator simply connects the ECal module to the network analyzer and the software controls the rest.
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Electron Multiplication (EM) Standard Image Sensors
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EM (Electron Multiplication) is a technology that uses on-chip gain in the charge domain to effectively eliminate read noise from an image sensor. This enables advanced ultra-low light applications that require extreme sensitivity at fast frame rates. Examples include life science applications such as single molecule detection, super resolution microscopy and spinning disk confocal microscopy along with physical science applications such as nanotechnology imaging, Bose Einstein condensates and soft X-ray spectroscopy, and astronomy applications such as adaptive optics and lucky imaging. The inclusion of an additional conventional output allows further flexibility for applications such as true 24 hour surveillance.
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Standardize Production Test Software For PCBAs And Electronic Devices
test
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Strap-Down Electronic Compass - for Commercial, Industrial, and Military Users
Revolution LP
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The Revolution™ LP is a strap-down electronic compass designed specifically for commercial, industrial, and military users. The Revolution LP will be of particular interest to ROV and AUV manufacturers who are concerned with power usage and accurate heading in all types of challenging conditions. In standby mode, it draws a mere 50 μA and requires only 15 mA in run mode. It provides accurate heading data in less than a tenth of a second from wakeup. An extended range tilt sensor is available that allows for +/-60° of pitch and roll.
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Turret Test And Scan Handlers
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Turret platforms for semiconductor test, inspection and packaging.
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Product
DC Electronic Load
Model - KM-mPD-501
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Kusam Electrical Industries Limited
KM-mPD-501 DC electronic load mainly focuses on the testing of power circuit on PCB. KM-mPD-501 offers a solution for function test of Switch step up, Stepdown, Regulators and Driver IC . Engineer puts components, such as CPU, DSP, FPGA; etc on a PCB after the power circuit has been tested. It’s not complete to use a meter to measure the voltage. KM-mPD-501 offers engineer OVP, OCP and OPP functions that help engineer know the value of overload current . On the other hand, engineer can use a programmable DC power supply (mPP series) to offer external power and connect PCB’s output to KM-mPD-501. Then engineer can easily get output watt, figure out the efficiency of power circuit and check if inductances, capacitances and resistances perfectly work with the power circuit. KM-mPD-501 not only offers loading emulation of current but also provides OVP and OPP. User can use these functions to test solar power battery, rechargeable battery and motor driver. In school laboratory, KM-mPD-501 helps students do experiment on power circuit, linear circuit and driver circuit.
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Electronic Load Device
786531-01
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The RMX-4005 provides capabilities for qualifying power designs and validating power supply functionality in a production environment. You can combine Electronic Load Devices to customize your test system based on the number of channels, maximum load power, and voltage and current of each channel. You can connect multiple RMX-4005 devices in parallel to provide higher power capabilities for your power supply tests. This feature gives flexibility for future projects that have different power requirements.
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AFM (Atomic Force Microscope) Optical Platform
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The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
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Area Scan Camera
Genie Nano-5GigE
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Engineered for imaging applications that require high-speed data transfer, the all new Genie Nano 5GigE is an easy replacement for gigabit ethernet cameras built into current vision systems that rely on the existing GigE Vision interface standard. The new Genie Nano 5GigE models feature the brand new 5Gbps (5GBASE-T) link speed.
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High Current Probes (Power Electronics) HCF77306B300G150
1009398
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The High Current Probes (Power electronics) model HCF77306B300G150 is specifically designed for high-performance applications in demanding environments. With a robust operating temperature range of -45°C to +200°C, this basic contact probe excels in reliability and performance under extreme conditions. The probe features a compact design with a pitch of 3.50 mm, making it suitable for various integration needs in power electronics.
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Acoustic Microscope
AMI P300
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The FastLine P300 Acoustic Microscope is specifically designed for accelerated throughput, semiautomated screening of microelectronic devices on the manufacturing floor.
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Ultrafast Nearfield Optical Microscope
Femtosecond NSOM
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Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nano-manufacturing.
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Electronic Test & Measurement Equipment
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We are known worldwide for the M.O.L.E. Temperature Profiler. The Mole is used in the Electronic, Paint, Food, and the Industrial marketplace. The Mole is a stand alone, 6 channel, temperature profiler that it is used in many harsh processes that require the temperature measuring instrument to be inside the heating chamber or "ride along" with the parts or process being measured over time such as Solder Reflow Ovens and Wave SolderMachines.
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Electronic Pressure Comparator
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Huaxin Instrument (Beijing) Co., Ltd
When it comes to simultaneous pressure calibration for several pressure measuring instruments, electronic pressure comparator is always a great choice for most of people. The comparison calibrator features 5 pressure ports which allow simultaneous connection of 4 pressure gauges under test, making calibration more efficient and time saving. It also comes with an external air source for easy and precise pressure generation and servo valve for stable pressure control.
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Electronic Loads
SLM 1 / 4 Chassis
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AMETEK Programmable Power, Inc.
From the leader in programmable power products, Sorensen introduces the SL series electronic loads which offer the best value with the most flexible platform. A wide range of loads are available from 75-1800W with both DC and AC input in benchtop, modular and standalone form factors.
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3D Video Microscope
BVM-20102B
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High-resolution CCD sensor, built-in analog/digital converter, analog and digital signal directly display on the screen, can also simultaneously display on TV and computer through corresponding interfaces; taking photo and video through software; easy operation, reducing user's fatigue and injury.
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Scanning Instruments
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X-Rite scanning solutions automate press-side color control and are ideal for printers and converters who want to benefit from fast, accurate color. These systems not only remove the possibility of human error, they speed up make-ready and generate predictable and repeatable color results.
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Workshop Equipment for Electronics
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PeakTech Prüf- und Messtechnik GmbH
Is a new development for fast and uncomplicated voltage measurements as a two-pole voltage tester with digital LCD display and additional LED display of the current voltage values.
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Sequence Creation Software for Power Supplies and Electronic Loads
Wavy Series
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WAVY is sequence creation software that supports the power supplies and electronic loads from KIKUSUI Electronics Corp.
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Digital Inverted Microscopes
WELDinspect
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High-resolution, ergonomic optical inspection systems designed for weld bead analysis and measurement. 4K or Full HD inverted imaging system with motorised zoom, auto-focus, built-in large aperture illumination, and dedicated software for weld bead measurements, analysis, documentation, and reporting.
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Fluorescence Microscopes
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PicoQuant offers different solutions for time-resolved confocal microscopy. The available systems include single molecule sensitive microscopes with picosecond temporal resolution and super-resolution imaging capabilities as well as upgrade kits for laser scanning microscopes of all major manufacturers that enable time-resolved applications.
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High Resolution Microscope For Multi-fiber Connector
D SCOPE MT LWD
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Designed for inspection of MPO connectors, patch-cords or bulkheads, the D Scope MT LWD checks the cleanliness of the connector face and precisely measures the defects on the optical fiber end-faces. Using Deep Learning technology associated with a high-resolution optical bench, the scratch and defect detection thresholds are significantly improved compared to traditional software.
