Communications Test
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Product
2-CH MIL-STD-1553A/B Bus Simulator Module
1553 WA73A-455
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The WA73A-455 MIL-STD-1553A/B Bus Simulator Module allows a system controller in an ATE system to communicate with and test devices that conform to the MIL-STD1553A/B data bus used in military aircraft and communications systems. Each of the WA73A-455's two channels operate as two separate and independent channels with their own VXIbus logical address, interrupts, and complete set of controls and indicators. As a result, each channel of the WA73A-455 is truly an independent instrument, and, therefore, individually programmable.
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Product
DRO/VCO Modules
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The Analog Devices portfolio of dielectric resonant oscillators (DROs) and voltage controlled oscillators (VCOs) offer excellent output power and phase noise performance over temperature and cover a range of applications and uses to meet the needs of industrial, medical, aerospace and defense, EW, ECM, and communications markets. Our DRO modules are a natural choice for applications in fixed tuned or narrowband tunable configuration, while our selection of VCOs play a key role in providing reliable frequency generation for RF and microwave communication and test systems.
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Product
Phase Locked Loop with Integrated VCO
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PLL with integrated VCOs provide local oscillator sources and clock sources for communications (COMMS) , test and measurement (ETM) and aerospace/defense (ADEF) applications. ADI's PLLs with integrated VCO portfolio includes both narrowband and wideband parts, supporting frequencies up to 13.6GHz. Our PLLs with integrated VCO, as well as our full PLL portfolio including integer-N and fractional-N PLLs, feature best-in-class performance for phase noise, jitter, and spurious, and also feature high levels of integration in small form factor packages.
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Product
MODBUS RTU Test Software
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MODBUS RTU Communication Test Program that helps users troubleshoot MODBUS RTU Communications. The software supports function codes, #3, #6 and #10(hex)
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Product
XMC - Module VITA61/42
XMC-1553-2-IO
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The XMC-1553-2-IO-2 uses a DDC® Total-ACE® communication device as its 1553 bus controller, or as a remote terminal with concurrent bus monitor terminal. Dual controller has a dual redundant channel with built in transceivers and transformer. The controller has the capability to emulate up to 31 RT addresses simultaneously.
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Product
4/8-port Asynchronous Serial Communications Modules
cPCI-3534/3538-S
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- 32-bit CompactPCI, PICMG 2.0 Rev 2.1- Plug-and-play, IRQ & I/O address automatically assigned by PCI BIOS- 4/8 asynchronized communications ports with intelligent buffer- Three RS-232 ports and one isolated RS-422/RS-485 port with 2500 VRMS isolation voltage for cPCI-3534, and eight RS-232 ports for cPCI-3538- Surge protector in TXD/RXD signal line
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Product
Scienlab Measurement And Control Module
SL1067B
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The Measurement & Control Module SL1067B is a rack-mount measurement module for measuring voltage input ±10 V with 16 channels. The module can be used either as a stand-alone device or as extension for a Scienlab Battery Test System.
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Product
DSP Based Serial Communication Board
CPCI-ISC8
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The CPCI-ISC8 is an intelligent DSP based serial communication board. This 3U board is based on the CPCIIPC product and has been modified to remove the IPinterface and to support additional I/O features. The CPCIISC8 provides mechanical support and the electrical interfaces for an I/O mezzanine board. Multiple CPCI-ISC8 boards may be installed in a single system.
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Product
Interactive Benchtop Test
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Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
NI Real-Time Test Cell Reference System
778820-35
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DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Product
NI Real-Time Test Cell Reference System
780590-35
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VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Product
Scienlab Measurement & Control Module
SL1060A
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The Measurement & Control Module SL1060A is a mobile measurement module for measuring voltage input ±10 V with 16 channels. The module can be used either as a stand-alone device or as extension for a Scienlab Battery Test System.
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Product
Application Software for Electronic Test & Instrumentation
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Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Product
Wireless Device Test
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New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Product
Scienlab Measurement And Control Module
SL1065B
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The Scienlab Measurement & Control Module SL1065B – Analog Input is a rack-mount measuring and control module for measuring voltages and currents (e.g. single cell voltages in battery modules or packs). It features fully galvanically isolated measurement inputs and records all measured values synchronously and with common time stamps by Precision Time Protocol (PTP).
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Product
4-Port RS-422/485 Isolated Serial Communications Card
cPCI-3544
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- 32-bit CompactPCI®, PICMG® 2.0 Rev 2.1- Plug-and-play, IRQ & I/O address automatically assigned by PCI BIOS- Four asynchronous communications ports with intelligent buffer- Four RS-422/485 ports- 2500 VRMS isolation voltage
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
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Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Product
Dielectric Test Fixture
16451B
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The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
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Product
Bottom Electrode SMD Test Fixture
16197A
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The 16197A is designed for impedance evaluations of bottom electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The Keysight 16197A supports various SMD sizes, as small as 1005 (mm)/0402 (inch) and as large as 3225 (mm)/1210 (inch). Accommodation of the 0603 (mm)/0201 (inch) size is available with option 001.
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Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
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The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Product
EOL/Functional Testing
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Whether you are testing RF LRU modules as a defense contractor, or implementing the next power supply tester for EV charge stations, ARC can create a custom, flexible automated end of line test solution for a variety of needs, with your budget in mind.Leverage our expertise with PXI mixed signal modular instruments, RF test capabilities and switching to complete your next solutions. Shorten your test development times, improve hardware and software standardization, and control your future test development costs by partnering with ARC on your next project.
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Product
Functional Test Fixtures
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Forwessun’s Functional Test Fixtures are tailored to validate the performance of your electronic assemblies, ensuring each product meets critical quality and functional standards. With customisable designs and precision engineering, these fixtures support a range of testing needs—from checking connectivity and function to confirming performance under real-world conditions. Built to handle rigorous demands, Forwessun's solutions are ideal for industries requiring reliable and repeatable results. Whether for high-volume production or specialised testing, our fixtures provide robust, adaptable support to maintain efficiency and accuracy throughout the testing process. We also create, and work with Ingun to create fixtures using the Ingun kit.
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Product
Radar Test System
UTP 5065
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Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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Product
Test System for Detecting Exact PCB Short Circuit Locations
QT25
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Qmax Test Technologies Pvt. Ltd.
QT25 employs a unique method to detect exact PCB shorts circuit locations and pin down the shorted components and tracks. It is designed in such a manner that it precisely detects exact short circuit locations across VCC - GND or a shorted component connected across a Bus or hair-line shorts between PCB tracks, Which is highly impossible to detect using conventional tools especially when they are connected parallel in circuit. It can also be used in measuring the contact resistance of switches and relays in its milli-ohm mode as a value add.
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Product
Regenerative Battery Pack Test System
17040E
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High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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Product
Scienlab Battery Test System – Pack Level, 220 KW
SL1730A
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Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
SMD Array Type LCR Test Fixture
16034H
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The 16034H is designed for impedance evaluations of array-type SMD.The minimum SMD size that this fixture is adapted to evaluate is 1.6(L)x0.8(W)[mm]. Since the tip of the measurement electrodes are very thin and the device holder is extremely flat, the device can be shifted and the measurement electrodes can contact each of the elements of the array-type component.
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Product
Lens Module Test Platform
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The Lens Module Test Platform is a flexible solution to deliver the quality that is expected from your brand for all types of lenses and cameras. The system can be configured to measure objective, eyepiece or camera lenses. As the platform can efficiently measure lenses as small as 2 mm3, it is perfect for the critically precise applications of life sciences, consumer electronics, automotive and other industries. With 25+ years of quality experience, the Lens Module Test Platform ensures that all products shipped to market work as intended.
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Product
H(3)TRB & HTGB Test Systems
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SET offers two H(3)TRB and HTGB product lines which differ in the number of test object channels and the range of technical possibilities. The innovative systems are scalable, modular and standardized.
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Product
Memory Test System
T5833/T5833ES
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T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
