Protocol Test
See Also: Protocol Analyzers
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Product
USB Power Delivery and Type-C™ Tester & Analyzer
GRL-USB-PD-C2 (GRL-C2)
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GRL-USB-PD-C2 (GRL-C2) is the only solution available that supports all compliance test specifications for USB Power Delivery 3.0 and USB Type-C Alternate Mode designs, and enables product developers to quickly run full compliance and validation test suites at the push of a button. GRL-C2 provides an automated, efficient, and fully-integrated way perform all required USB Power Delivery version 3.0 and 2.0 and related tests over the USB Type-C connector, as well as PHY test automation for USB Type-C Alternate Modes. GRL-C2 automates all required USB PD compliance tests for power providers (chargers), consumers, dual-role ports, and cable and adapter E-Markers; and is the only solution available that integrates Qualcomm Quick Charge 4+ and Intel Thunderbolt-specific test items. GRL-C2 also incorporates analyzer capability to sniff PD traffic. GRL-C2 integrates all required USB PD tests into a single 2-port tester, including all tests supported on GRL’s USB-IF approved first generation solution introduced in 2015. Each port can be configured independently as a PD Provider or Consumer. All other PD Protocol and Power tests are fully integrated, removing the need for external electronic loads.
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Product
Medium-size Reverberation Chamber
E-Series
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The E medium-size multicavity Reverberation Chamber Series represents that state-of-the-art in reverberation chamber technology. The E-Series can make single measurements, batch tests, protocols or campaign tests for different frequency bands, different technologies and different channel models, running overnight without human intervention. Embedded frequency-, mode-, source- and platform-stirring in a double-shielded set of cavities allow Passive MIMO (Efficiency, Correlation, Diversity Gain, MIMO Capacity and others), Active MIMO OTA (TRP, TIS, TPUT, MTS, CQI, M2TxDT, RSRP, MCL and others) and Time-Domain MIMO (DL/UL TCP/UDP TPUT, RMS DS, STD, PL, CBW, Mute%, eNodeB, VDT-OTA) measurements up to 8x8 and 8DLCC to be performed for antennas and devices up to 50cm and 50kg ranging from 2G to 4G, covering all available cellular and wireless technologies to date, including wearables devices, sound acoustic mute, WLAN and W-IoT testing. There is no RC in the market more advanced than the E-Series.
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Product
PCIe 5.0 Protocol Exerciser
P5551A
Protocol Analyzer
Keysight PCIe 5.0 Protocol Exerciser gives the flexibility in emulating either as a root complex or as an endpoint device when validating PCIe designs.
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Product
PCIe 3.0 Protocol Analyzer
Summit T34
Protocol Analyzer
The Teledyne LeCroy Summit T34 PCI Express protocol analyzer is designed for PCIe storage, add-in card and embedded application developers. It supports x1 to x4 lane widths with the capability of expanding to x8 with two boxes connected together, and deep buffer memory that is expandable from 4GB to 64GB ideal for storage analysis, the Summit T34 provides unmatched capability and flexibility for developers and users of advanced PCI Express products. Teledyne LeCroy has been the leader in NVM Express and SATA Express protocol analysis since 2010. This storage analyzer incorporates all of these powerful legacy features and adds the latest in storage queuing performance analysis.
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Product
PCIe 5.0 Protocol Analyzer
P5552A
Protocol Analyzer
The Keysight P5552A PCIe 5.0 Protocol Analyzer introduces a new form factor that is easily deployable in the lab bench environment to enable deep protocol analysis of a PCIe system with unparallel signal integrity. Locate protocol errors or validate device operations by viewing data from the physical layer all through the transactional layer with ease.
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Product
Protocol Analyzer / Jammer for PCI Express 5.0
Summit M5x
Protocol Analyzer
The Summit M5x is Teledyne LeCroy's PCIe/ NVMe Jammer solution and is the latest protocol analyzer targeted at high speed PCI Express 5.0 I/O-based applications such as workstation, desktop, graphics, storage, and network card applications.
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
test
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Product
MIPI M-PHY Protocol Analyzer
U4431U
Protocol Analyzer
Power to meet the needs of today’s and tomorrow’s designs Up to Gear 3 HS data rates Up to 16 GB trace depth Up to 4 data lanes Complete insight into complex designs Track multiple M-PHY busses from the PHY to the application layer Raw Mode 8b/10b data views Infiniium Oscilloscope integration Powerful interface that allows unlimited customization of system views
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Product
Cable Free ATE
CABLEFREEATE
test
Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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Product
Interactive Benchtop Test
test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
Application Software for Electronic Test & Instrumentation
test
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Product
Automotive Test Solutions
test
The testing and simulation systems from this division are used primarily in the automotive and automotive supplier industry. These are, for example, modular function-testing systems and diagnostic tools for automotive ECUs or bus communication systems for a wide variety of electronic components in automotive production. Electromechanical assemblies and entire car seats are also tested to ensure they function
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Product
PCI Express (PCIe) 5.0 and Compute Express Link (CXL) Protocol Analyzer
Summit T516
Protocol Analyzer
The Summit T516 is targeted at high-speed PCI Express 5.0 and CXL I/O-based applications such as workstation, desktop, graphics, storage, and network card applications.
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Product
Standardize Production Test Software For PCBAs And Electronic Devices
test
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Product
NI Real-Time Test Cell Reference System
778820-35
test
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Product
TestStand
test
TestStand is industry-standard test management software that helps test and validation engineers build and deploy automated test systems faster. TestStand includes a ready-to-run test sequence engine that supports multiple test code languages, flexible result reporting, and parallel/multithreaded test.
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Product
6TL24 Combinational Base Test Platform
H71002400
Test Platform
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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Product
Scienlab Battery Test System – Pack Level, 330 KW
SL1740A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
OLED Lifetime Test System
58131
Test System
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Product
EFT Module for Teststand
test
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Product
Sealed Beam Bulb Testing System
H710019SSL
Test Platform
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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Product
EOL/Functional Testing
Functional Test
Whether you are testing RF LRU modules as a defense contractor, or implementing the next power supply tester for EV charge stations, ARC can create a custom, flexible automated end of line test solution for a variety of needs, with your budget in mind.Leverage our expertise with PXI mixed signal modular instruments, RF test capabilities and switching to complete your next solutions. Shorten your test development times, improve hardware and software standardization, and control your future test development costs by partnering with ARC on your next project.
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Product
True Concurrent Test
TestStation Duo
Test System
The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
Test Fixture
The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Disk Drive Test System
Saturn
Test System
The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
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Product
Scienlab Battery Test System - Cell Level
SL1007A
Test System
The SL1007A Scienlab Battery Test System – Cell Level enables you to accurately and productively test battery cells for automotive and industrial applications. The bidirectional power supply charges and discharges your cells under test with very high efficiency.
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Product
Advanced SoC Test System
3680
Test System
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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Product
NI Real-Time Test Cell Reference System
780590-35
test
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Product
In-Circuit Test System
TestStation LX
Test System
TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
