Radar Test
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Product
Mixed Signal Automated Tester
MSAT
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Whether you are testing radar systems for the Department of Defense (DoD), or the next actuator circuit card for aircraft landing systems, ARC’s Mixed Signal Automated Tester (MSAT) offers flexible automated testing capabilities for nearly every budget.
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Product
Weather Radar Panel for Primus
TA-3B
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A weather radar panel similar to the TA-3 panel but with more specific test jacks for testing the Primus 300/400 series radars. Specific test jacks for power supply, antenna and indicator.
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Product
Antenna Test Chamber for Automotive Radar
ATS1500C
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The R&S®ATS1500C radar test chamber is a compact antenna test range (CATR), consisting of a gold-plated parabolic reflector and a two-axis positioner for 3D movements of the radar module. Combined with the R&S®AREG800A target simulator and other Rohde & Schwarz test and measuring instruments, it can be used for a variety of applications, including antenna characterization, module calibration, RF performance validation, interference testing or in-band compliance testing. The chamber is equipped with a universal feed antenna which gives access to both polarizations in parallel. Automated temperature testing over the range of -40 to 85°C is possible with an optional enclosure.
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Product
PSG Analog Signal Generator, 100 kHz to 67 GHz
E8257D
Signal Generator
Address your toughest requirements with metrology-grade frequency & level accuracy with excellent distortion & spurious characteristicsTest high-power devices & overcome test system losses with 1 W output powerAddress the demanding needs of Doppler radar, ADC & receiver-blocking tests with the PSG's extremely low phase noiseCharacterize devices & circuits by adding AM, FM, PM & pulse modulation to your signalMeet test system needs up to 1.1 THz with frequency extender modules
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Product
Radar Systems / Millimeter Wave Radar / Micro Wave Radar
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KEYCOM develops various radars for versatile applications based on its knowledge and expertise on millimeter wave and microwave technologies. KEYCOM’s product line of radars includes Radar Test Systems (RTS) to evaluate distance accuracy or output, Radar Alignment Systems (RAS) to help you adjust the alignment of radars, and Radar Cross Section (RCS) measurement systems to measure RCS of such radar targets as aircraft, ships and automobiles.
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Product
Radar Cross Section (RCS) Measurement and Evaluation System
XRC
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KEYCOM develops various radars for versatile applications based on its knowledge and expertise on millimeter wave and microwave technologies. KEYCOM’s product line of radars includes Radar Test Systems (RTS) to evaluate distance accuracy or output, Radar Alignment Systems (RAS) to help you adjust the alignment of radars, and Radar Cross Section (RCS) measurement systems to measure RCS of such radar targets as aircraft, ships and automobiles.
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Product
Collins Radar Fixture with Gyro Simulator
TA-3A/B
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This weather radar test fixture is a combination of the established WXT-250 series fixture and the RDR-2000 and RDR-2100 radars so that a single panel will provide many features that are still required today. The gyro simulator built into the panel is usable for either radar being tested and eliminate's plugging in any external simulator. The features for both product lines as shown in their respecting CMM's are provided on the panel so that full testing and alignment of these radars and their system components can be tested and/or evaluated. If you require any changes or other product versions please give us a call.
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Product
RADAR Stability Testing
PN9002
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Radar component and system testing usually evokes images of complex, expensive measurement systems occupying multiple equipment racks. In some cases, radar equipment designers have even used entire radar systems as a proving ground for their new components and modules. With the introduction of the PN9002 pulse-to-pulse radar stability test set from Noise eXtended Technologies , radar testing has become significantly less complex and costly. The modular PN9002 system provides outstanding dynamic range at frequencies from 2 to 18 GHz and optionally from 0.4 to 18 GHz.
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Product
Fixed/Dual Delay Line
Series 1000
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The EOX Series 1000 RF/Microwave Time Delay System is an economical, high performance, turnkey solution for radar test, wireless communications, Wi-MAX, and altimeter applications. The Series 1000 features ultra wide bandwidth, low loss, high isolation, low noise figure, and high dynamic range. Available with time delays up to 250 µsec and a top end frequency of 18 GHz.
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Product
NI Vehicle Radar Test System
Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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Product
NI PXIe Based Platform for Radar/EW Test
BAT
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• NI PXIe Based Platform for Radar/EW Test- Leverages a Variety of NI FPGAs/VSTs/Upconverters up to 44GHz- LabVIEWTM and LabVIEWTM FPGA Software Environment• Provides PDW to IQ Generation• Multi-Emitter System- Faster Simulation Setup- More Complex Scenario Testing- Ease of Changing Scenarios• Supports Multiple PDW Formats- Simple, Built-In PDW Format- Industry Standard PDW Formats (e.g., NEWEG)- Custom PDW Formats• PDW Data Accessible via Stored Files, or Live Streaming• Factory to Field Deployable
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Product
PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783156-01
Signal Module
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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Product
Testing Large Radar Sensors with CATR Technology
CATR Radar Test System UTP 5069
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Modern driver assistance systems must recognize increasingly complex traffic scenarios and convert them into appropriate vehicle reactions with the help of artificial intelligence (AI) and specific algorithms. Imaging radar sensors with a higher spatial resolution, so-called imaging radar sensors, are therefore required. These can better distinguish larger from smaller objects and, due to the larger antenna apertures, also require larger dimensions of the test environment or larger far-field distances. Testing these sensors in the direct far field ( UTP 5065 ) would therefore require very large absorber chambers up to ten meters in size and more.Our efficient test system UTP 5069 offers exactly the right solution:By using CATR technology (Compact Antenna Test Range), 4D, imaging and other radar sensors with large far-field distances are calibrated with high precision in a small footprint. With the extremely low-reflection NOFFZ absorber chamber, the system is very well suited not only for validation, but also for EOL tests.
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Product
Test Management Software
ActivATE™
test
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Product
Fast and Flexible WLAN Measurements up to 802.11ax
WLAN Test Toolkit
test
The WLAN Test Toolkit gives you direct and fine control over the generation and analysis of IEEE 802.11a/b/g/n/ac and ax signals, as well as 802.11j/p/ah/af waveforms, with industry-leading speed and accuracy. It empowers you to characterize, validate, and test a variety of WLAN connectivity products, such as RF front end components, wireless modules, and user devices.The toolkit includes extensive support for the latest features of the 802.11ax standard, including extended single-user packets, multiuser OFDMA, and multiuser multiple input, multiple output (MIMO) functionality with per-user configuration and measurement results. The WLAN Test Toolkit helps you solve demanding new access point test cases by generating signals that simulate multiuser environments, including per-user impairments. You can also use the new software to generate trigger frames to test the real-time response of client devices and make power precorrection and relative center frequency measurements.
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Product
Doppler Radar Target Simulators
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Automotive radar sensors play a vital role in the current development of autonomous driving. Their ability to detect objects even under adverse conditions makes them indispensable for environment-sensing tasks in autonomous vehicles. As their functional operation must be validated in-place, a fully integrated test system is required. Radar Target Simulators (RTS) are capable of executing end-of-line, over-the-air validation tests by looping back a received and afterward modified radar signal and have been incorporated into existing Vehicle-in-the-Loop (ViL) test beds before. However, the currently available ViL test beds and the RTS systems that they consist of lack the ability to generate authentic radar echoes with respect to their complexity. The paper at hand reviews the current development stage of the research as well as commercial ViL and RTS systems. Furthermore, the concept and implementation of a new test setup for the rapid prototyping and validation of ADAS functions is presented. This represents the first-ever integrated radar validation test system to comprise multiple angle-resolved radar target channels, each capable of generating multiple radar echoes. A measurement campaign that supports this claim has been conducted.
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Product
Automated Test Equipment
test
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
test
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Product
Interactive Benchtop Test
test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
TestStand
test
TestStand is industry-standard test management software that helps test and validation engineers build and deploy automated test systems faster. TestStand includes a ready-to-run test sequence engine that supports multiple test code languages, flexible result reporting, and parallel/multithreaded test.
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Product
EOL RF Functional Test
AS652
Test Platform
With this RF test platform, integrable according to the specific needs of the product, we cover a very wide range of test needs with manual feeding.Ergonomics have been fully observed in the design, including the option of servo adjustment of the working height according to the operator.
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Product
VXI Digital Multiplier
4152A
Test System
The 4152A’s advanced features like limit testing, averaging, speed/resolution trade-offs, and fast function changes provide the high “test system” throughput required in today’s production test environments.
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Product
Test System
UltraFLEX
Test System
The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Product
Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
Test System
Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
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Product
OLED Lifetime Test System
58131
Test System
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Product
VITA 62, 3U Test Fixture
TF-3U-7B041-1
Test Fixture
This Power Supply test fixture is being proposed as a tool for checking Injector / Ejector operation, proper alignment of the VITA 62 connector and proper alignment of both keys on a Single slot, 3U, VITA 62/SOSA power supply.
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Product
LTE RRM Test System
T4010S
Test System
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
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Product
PXI Integration Platform
ATS-3100
Test Platform
The new ATS-3100 enables you to rise above the module level and shift your focus to the sophisticated test solution you’re actually building. Simply add your instruments, software, and customization to create a complete solution. Or, if you're short on time or resources, ask Astronics Test Systems to do the finishing work for you.
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Product
PCIe 2.0 Test Platform
PXP-100B
Test Platform
The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
