Test Program
Generate native system input events for the purposes of test automation, self-running demos, etc. (developer.com)
-
Product
LitePoint RF Test System
J750
Test System
The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
-
Product
BSD (Test Diagnostics)
test
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
-
Product
Modular Functional Test Platform
LX-OTP2
Test Platform
The OTP² system platform has recently been available in both the PXI and LXI versions. The OTP2 system platform enables the cost-effective and fast implementation of function test systems based on defined modules and function blocks. Thanks to the open system interfaces, customer-specific adjustments can be made at any time without any problems. When considering options for your next generation functional test system, it is important to assess the entire life cycle of the system and the associated costs and efforts. Use OTP² to accelerate development cycles and reduce the development effort for new functional test systems.
-
Product
Electrification Testing Solutions
Test System
When looking for a partner to assist with your electrification testing or power electronics testing challenge, Ball Systems has the expertise and experience to ensure your energy storage or power conversion project moves forward efficiently.
-
Product
Universal Automated Programming System
4900
-
The 4900 is powered by the newest BPM 9th generation technology, which delivers the fastest programming speeds in the industry for MCU’s, eMMC HS400, NAND, NOR and Serial Flash devices. BPM 9th generation technology produces 200 MHz signals, allowing each byte of data to transfer in up to 2.5 ns. Up to 9 times faster than competing programmers. 3D Vision option inspects BGA, CSP, QFP, TSOP, SOIC and J-Lead devices for coplanarity, bent lead, pitch, width, diameter, standoff and XY errors.
-
Product
Digital Program Insertion Auditor
Torque DPI
-
The DPI Auditor supports the ANSI/SCTE 35 2001 standard that defines a fully digital mechanism to control remote splicing equipment via cueing messages embedded in the transport stream. The core of the standard is centered on an SIT (Splice Information Table) which can contain a schedule message or an insert message.
-
Product
High Speed Test Bench
AT444
Test Platform
AC motor with mechanical multiplying gearbox test benches allow precise programming of all drive parameters required for accurate rotating devices test.The use of special high-speed bearings, mechanical components and parts wear resistant leads to a large life. The supply includes the electronic drive and control as well as the entire oil cooling unit.
-
Product
Software Program
Process Engineer 4.0
-
To benefit from the full potential of industry 4.0, process and asset experts must be empowered with analytics to answer their own day-to-day questions. With use of our self-service advanced analytics solution, process engineers will move from analytics aware to analytics enabled up to analytics expert. The new Process Analytics Engineer will be better equipped to improve overall equipment effectiveness, improve product quality and reduce costs.
-
-
Product
Flash Memory Test System
T5830
Test System
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
-
Product
Fixturing Kit
10744A
Test Fixture
The Keysight 10744A fixturing kit includes mounting hardware for a variety of Keysight measurement optics devices. A large base, multiple posts, and other accessories let you build structures -- such as tall, rigid towers -- that place optics in the center of a machine's work zone or wherever needed. The fixturing kit helps meet the physical requirements of a range of measurement applications.
-
Product
System for UHV Temperature Programmed Desorption (TPD) Studies
TPD Workstation
-
The Hiden TPD Workstation is a complete experimental system for UHV temperature programmed desorption (TPD) studies. The triple filter mass analyser is configured with a cooled shroud giving the analyser optimum sensitivity with minimum background contributions to desorption products from the sample. A fast sample load lock with sample transfer mechanism is included to provide for rapid sample change. The TPD Workstation features a multiport UHV chamber with heated sample stage coupled to a high precision triple filter analyser with digital pulse ion counting detector for ultimate sensitivity and time resolution.
-
Product
Script Driven Automation Program
-
SDAP-Torque has detailed instructions and pictures for each step; the process includes assembly instructions, incremental inspection, and limit values for the torque to be applied at mechanical fasteners. Commercial torque sensor instrumentation was combined with unique LabVIEW software developed by BCO to cue the operator, provide real-time visual feedback of each torque measurement, assure and report every step in the assembly process, evaluate torque compliance and produce a QC Report.
-
-
Product
160W DC Programable Power Supply
-
*Source effect: CV≤0.01%+3mV(mA)*Load effect: CV≤0.01%+3mV(I≤3A) CC≤0.2%+3mA(I≤3A) CV≤0.02%+5mV(I>3A) CC≤0.2%+5mA(I>3A)*Ripple and noise: CV≤1.0mVrms(I≤3A) CC≤3mArms(I≤3A) CV≤2.0mVrms(I>3A) CC≤6mArms(I>3A) *Protection Type: Overcurrent Protection (OCP) Overvoltage Protection (OVP)* Display accuracy: Voltage indication accuracy: ± (0.5% + 2 words)
-
Product
Universal In-System Programming Tool
ScanExpress JTAG Programmer
-
ScanExpress JTAG Programmer is a universal in-system programming (ISP) solution designed for convenience and versatility—a modular, multi-functional, and high-performance tool to program, read, and verify Flash memories, serial EEPROMs, CPLDS, FPGAs, and more.Like all Corelis ScanExpress family products, ScanExpress Programmer is a tool for all phases of the product life cycle—whether programming early code during product development, programming production code during manufacturing, or reprogramming units out in the field, ScanExpress Programmer is designed to fit all in-system-programming needs.
-
Product
Universal Function Test System for Industrial Electronics
Test System
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.The system has a Virginia Panel adapter interface to which various desk adapters can be docked, including automated contacting of the DUTs. A camera for the verification of light emitting diodes on the test object is integrated in the adapter interface.
-
Product
Iridium Physical Layer Test Systems
PLTS
Test System
Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
-
Product
ASCA Pilot Program Participation
-
Compatible Electronics, Inc. is a testing laboratory participant under the United States Food and Drug Administration’s Accreditation Scheme for Conformity Assessment (FDA ASCA) pilot program. We are listed under ASCA ID# TL-80, TL-81 and TL-82.
-
Product
Conformance Test System
TS8980
Test System
The R&S®TS8980 is the most compact full range conformance testing solution on the market for testing in line with requirements from GCF, PTCRB and regulatory bodies. It supports the entire device certification process for RF and RRM, covering the widest range of technologies including 5G NR based on 3GPP and carrier acceptance specifications. The test system is available in various configurations to cover the required scope of testing.
-
Product
Program Specific Systems
-
Curtiss-Wright Defense Solutions
Our experienced system design and integration teams analyze your system requirements, conduct trade studies to identify appropriate products, analyze data paths, select suitable cooling approaches, and create a rugged system solution tailored and optimized for your platform or program.
-
Product
Remote Assisted Programming in Your Shop with Guaranteed Results!
RAP®2
-
*Free up your technicians to do higher-skilled work and increase your profitability, with Opus IVS' team of experts doing the programming for you remotely.*No need to send complex vehicles to the dealership or call a mobile technician for flashing.*Have confidence that all vehicles will be successfully programmed and your customers will leave your shop satisfied.
-
Product
PCI Express 3.0 Test Platform with SMBus Support
Test Platform
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
-
Product
Component Test Systems
Test System
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
-
Product
Test Requirements Document (TRD) System
TRD Software
System
The Test Requirements Document (TRD) System helps users develop and document the strategy and structure of test programs.
-
Product
Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Test Instrument
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
-
Product
MPI Education Program
-
MPI Advanced Semiconductor Test
Education plays a critical role in the economic success of any country or society. As a result universities are facing enormous pressure to ensure that every procurement decision meets the needs of not just today’s students, but tomorrow’s.
-
Product
Programming on-chip flash in your processor
XJDirect
-
XJDirect is an advanced and innovative method for programming the internal flash of your processor and implementing some aspects of board test through JTAG when traditional boundary scan techniques cannot be used.
-
Product
Voltage Maintenance Program
VoltRef
-
VoltRef provides the power of automation formaintaining statistical control of the volt in yourlaboratory. This program controls a low thermalscanner and voltmeter to compare voltagestandards using the process recommended by NISTand other national laboratories.
-
Product
6TL24 Combinational Base Test Platform
H71002400
Test Platform
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
