Image Analysis
The extraction and analysis of data from images.
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High Power Beam Analysis
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The advantages of fiber lasers are their high power, mechanical stability and good beam quality; however beam quality and beam profile has to be periodically checked. In general, there are many difficulties in checking beam quality especially at the focal point, where densities will exceed 50KWatt per square cm. On one hand those energies are capable of melting and destroying most known materials, while on the other hand measuring a focused profile is the most significant measurement.
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Product
System Grounding & Earthing Analysis
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ETAP's system grounding & earthing foundation automatically detects the system earthing configuration based on source and transformer grounding or earthing type selection. The resulting earthing types are displayed both on the one line diagram and for the various connected cables.
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Product
Microwave Furnace for Ash, Bone Content & Carbohydrate Analysis
Phoenix
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The Phoenix line of microwave muffle furnaces offers unmatched versatility and speed in a rugged, easy-to-use system. Choose from two configurations and a variety of options!
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Quantitative Optical Gas Imaging System for GF620/GFx320/GF320
FLIR QL320
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The QL320 is a quantitative optical gas imaging (QOGI) system that allows surveyors to measure the leak rates for methane and other hydrocarbons. This eliminates the need for secondary sampling with a toxic vapor analyzer or similar tool. In addition, the QL320 does not require close contact with the gas in order to measure emission rates, making it a safer solution for quantifying difficult-to-measure gas leaks.
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Product
Ultra-compact thermal imaging core
Dione S 1024 CAM Series
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The Dione S 1024 CAM series is based upon the Dione 1024 OEM thermal imaging core with 1024×768 pixels and 12 μm pixel pitch. The NETD is less than 40 mK (available upon request) or 50 mK. The maximum frame rate is 80 Hz.Dione S 1024 CAM is a LWIR uncooled thermal imaging SWaP module with housing supporting M34/M45 lens (optional).Dione S 1024 CAM series benefit from Xenics image enhancement for advanced image processing while keeping power consumption low. Moreover, GenICam compliance and the availability of multiple lenses provide a high level of tunability for optimal integration into many systems.The compact Dione S 1024 CAM series find applications in safety and security, transportation and industrial process monitoring.
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Product
CD Measurement and Advanced Film Analysis
FilmTek CD
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Scientific Computing International
SCI’s leading-edge solution for fully-automated, high-throughput CD measurement and advanced film analysis for the 1x nm design node and beyond. Delivers real-time multi-layer stack characterization and CD measurement simultaneously, for both known and completely unknown structures. Patented multimodal measurement technology meets the challenging demands associated with the most complex semiconductor design features in development and production.
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Fluid Analysis Information Management System
SpectroTrack
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SpectroTrack is an Information Management System (IMS) optimized for laboratories that specialize in the analysis of in-service (used) lubricants for machine condition monitoring. The browser-based system is the ideal tool for accessing historical and trend information about an organization’s high-value assets. The software provides a single end-to-end view of a sample lifecycle from sample submission and receipt to results entry. The software also provides all trending, imaging, numerical and textual asset data in one secure location. Clients can see a comprehensive, historical view of fluid condition for an engine, department or an entire fleet.
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Imaging Station
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Standard upright microscopes were not designed to work with temperature controlled stages. Microscopes are optimized to get the best possible image for a number of different techniques (phase contrast, DIC, polarized etc...) Unfortunately due to the confines of the standard microscope frame, it is not easy to get samples under the objective lens and into the stage.
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Product
PathWave Vector Signal Analysis Software
89600 VSA
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A comprehensive set of tools for demodulation and vector signal analysis.
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Product
Manual Label-Free Molecular Interaction Analysis Machine, Flexible Research Platform
OpenPleX
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Designed to meet the demands of biologists, biochemists and biophysicists, the OpenPlex is a flexible surface plasmon resonance imaging system.OpenPlex is your companion for the development of label-free and multiplexed bio-assays and molecule detection. It is a robust and compact system designed for simple use and high versatility. Its open format, dedicated sensor chips and manual operation enable numerous types of experiments to be explored without compromise, covering chemistry, biochemistry, physico-chemistry and biomolecular interactions.
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Product
Analysis
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*Time & Frequency domain visualisation & analysis*Worldwide connectivity – Thin Client/Server Architecture*Interactive viewing & cursor interrogation*Mode definition & alignment*Order & mode tracking*Phase analysis with Cartesian and Polar plots*Third-octave analysis (also 1/6, 1/12, 1/24)*Rainflow and cycle-counting analysis
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Image Sensor Testing
IP750Ex-HD Family
Test System
The IP750EX-HD has been the test platform that has enabled the industry to manufacture high quality CCD and CMOS image sensors, and it is the most economical platform to meet the needs of newer technologies such as Time of Flight (ToF) sensors. When you use a smartphone, high performance digital still camera, or in-home security and surveillance system, these applications have image sensors most likely tested by Teradyne’s IP750ExHD.
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Product
Visible / Infrared / Imaging Test System
System 1808
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Testing Low-voltage CCDs and IR FPAs; Military, science-grade and medical CCDs or IR FPAs; CMOS ROICs and multiplexers; CMOS sensors. Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
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Preventive Maintenance Thermal Imaging Cameras
TC4/TC8 Series
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The TC4 and TC8 series are the new Amperis thermographic cameras, with 160x120 and 384x288 sensors respectively. New concept of camera more ergonomic and practical that gives us an image with 3 million pixels and a 3.6" touch screen. It also incorporates the option of real time data transmission, very appreciated in the field of science and industrial control.
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Spectrum Analysis, Up To 70 GHz
S930907B
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The S930907B spectrum analysis (SA) adds high-performance microwave spectrum analysis to the N522xB/N524xB PNA family up to 70 GHz. With fast stepped-FFT sweeps resulting from optimized data processing, the SA application provides quick spurious searches over broad frequency ranges. Simultaneous spectrum measurements can be done using up to five test and reference receivers. This multi-channel SA can be used with the internal swept-signal generators for efficient measurements of spurious signals emanating from mixers and frequency converters. The SA application employs source-power and receiver-response calibration as well as fixture de-embedding, providing in-fixture and on-wafer spectrum measurements with the highest level of accuracy.
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Product
Data Acquisition Analysis SystemWave Stocker
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This is the really useful equipment which our Solution Teamdeveloped using their experience obtained at their customer' s site.Simultaneous measurement by with sampling of max.16 channels is possible, enabling easy waveform analysis. This can be used for versatile tasks as the measurement at the site, inspection and R & D.
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Advanced NDT Data Acquisition & Analysis
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WeldSight™ software’s comprehensive acquisition and analysis tools enable you to engineer compliant and repeatable advanced phased array (PA), ultrasonic testing (UT), and time-of-flight diffraction (TOFD) weld inspections.
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Green House Gas Analysis
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Gas chromatographs help analyze green house gases in air and soil. In addition to nitrous oxide, which is known by its high global warming potential, CO and CH4 are measured by a single analysis.
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Thermo Imaging
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Thermal Imaging SensorTP-L series is a compact infrared thermal imaging sensor utilizing a thermopile array detector.
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Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Product
Infared Thermal Imager
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China Sheenrun Electronics Co.
*Using a continuous zoom lens, the image is clear, the detection distance is long, it can search in a large range, but also can observe the target at close range*Advanced image noise reduction processing, adding digital image details to enhance DDE function, output hot white/hot black/false color image*Low power consumption, fast startup, stable performance, clear imaging, uniform picture*Simple operation, easy to use and maintain*Precision-cast aluminum alloy shell, sealed and waterproof, filled with nitrogen, resistant to harsh environments, long working life
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High Performance Isotope analysis of LC Separated Compounds
Iso CHROM® LC
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Elementar Analysensysteme GmbH
Unlike the existing LC-inlet solution via chemical oxidation, the iso CHROM LC works with high-temperature combustion. It quantitatively converts organic carbon to CO2.In addition, the easy-to-use iso CHROM LC shows outstanding precision, accuracy, and linearity without significant peak broadening that can diminish the chromatographic performance. In continuous operation, virtually all peaks in a chromatogram can be analyzed for the stable isotope ratios of carbon.
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Software Tools for Efficient Code Development and Analysis
Specador Documentation Generator
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Specador is a tool that automatically generates accurate HTML documentation from comments inserted in the source code. It works in batch mode (command line) and uses dedicated language parsers.
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Complete Power Analysis System
PK3564-PRO+
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PK3564-PRO+ complete Power Analysis System includes PS3550 Power Analyzer, AC charger, Quick-Start manual, deluxe voltage leads, four eFX6000 flexible current probes, SD memory card, PSM-A Software, Mini Line-to-DC Converter, Bluetooth Adapter, USB Communications Cable, CASW Weather-Resistant Carrying/Operating Case, and 2-year deluxe warranty.
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Failure Analysis
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Failure analysis on electronic components is a continuous challenging task. The smaller transistor dimensions, increasing functional complexity and changing device packaging styles requires new tools and skills for sample preparation, fault localization techniques, high resolution imaging and analysis.
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Product
Widely Tunable Ultrafast Laser System For Multiphoton Imaging
InSight X3
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Spectra-Physics’ new InSight® X3™ is the third generation of Spectra-Physics’ industry leading InSight platform, specifically designed for advanced multiphoton microscopy applications. Based on patented technology1, InSight X3 features a broad 680 nm to 1300 nm continuous, gap free tuning from a single source, nearly double the tuning range of legacy Ti:Sapphire ultrafast lasers. InSight X3 delivers high average and peak power levels across the tuning range, including critical near infrared wavelengths above 900 nm for deepest penetration in-vivo. With Spectra-Physics’ integrated patented DeepSee™, the industry standard dispersion pre-compensator, the short pulses are optimally delivered through a microscope to the sample for maximum fluorescence and penetration depth. InSight X3 also has exceptional beam pointing stability, beam quality and output power stability, as well as fast wavelength tuning, making it ideal for microscopy.
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Boundary-Scan Test Coverage Analysis Tool
ScanExpress DFT Analyzer
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Test coverage statistics provide engineers and managers valuable information to make critical decisions in product development and manufacturing.ScanExpress DFT Analyzer is an automatic test coverage analysis tool for printed circuit boards and systems that include a mix of boundary-scan and non-boundary-scan devices. The tool assists design and test engineers to increase fault coverage and reduce boundary-scan test procedure development times. Using ScanExpress DFT Analyzer results in better informed test decisions.
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Reject Station for X-Ray Image Analyser
IV-110I
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IV-11OI is a reject station for X-Ray Image Analyser known for having an X-Ray Image Wire Defect Detection and a compact and space-saving dimension.
