Image Analysis
The extraction and analysis of data from images.
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Product
2D CMOS Image Sensor
Lince6M5
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Lince6M5 is a single chip, fully digital, high speed CMOS active pixel sensor which is designed for maximum flexibility. It has excellent performance in a large variety of applications, ranging from low noise, high dynamic range surveillance, to high speed slow motion analysis, including high resolution machine vision applications. Lince6M5 incorporates a high speed 6.5MP CMOS active pixel image sensor providing both global and rolling electronic shutter, as well as High Dynamic Range (HDR) features. The sensor array utilizes active CMOS pixels with pinned photodiodes to deliver high image quality whilst maintaining the size, cost, and integration advantage of the CMOS technology.
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Product
Characterization Of VCSEL Arrays Including Polarization Analysis
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Konica Minolta Sensing Americas, Inc
Laser diodes are becoming indispensable in a multitude of everyday and industrial applications, thereby expediting new applications and technologies. These include: facial and gesture recognition in consumer electronics, LiDAR (light detection and ranging) in the car and material processing with high-performance diode lasers.
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Product
High Performance Isotope analysis of LC Separated Compounds
Iso CHROM® LC
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Elementar Analysensysteme GmbH
Unlike the existing LC-inlet solution via chemical oxidation, the iso CHROM LC works with high-temperature combustion. It quantitatively converts organic carbon to CO2.In addition, the easy-to-use iso CHROM LC shows outstanding precision, accuracy, and linearity without significant peak broadening that can diminish the chromatographic performance. In continuous operation, virtually all peaks in a chromatogram can be analyzed for the stable isotope ratios of carbon.
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Product
FTIR Analysis
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Anton Paar offers state-of-the-art Fourier-transform infrared (FTIR) instrumentation with the possibility to automate and connect to other Anton Paar benchmark instruments. It combines FTIR spectroscopy with comprehensive data analysis to provide rapid results and increase efficiency in the laboratory. A high-resolution touchscreen with a user interface inspired by modern smartphones enables operators to conduct the most intuitive FTIR analysis available on the market. Anton Paar’s FTIR specialists and a worldwide service network are ready to support you with your spectroscopy applications.
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Product
Gasoline/Fuel Analysis
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A gas chromatograph is used for composition analysis of gasoline and its additives in order to improve fuels' performance. In addition to excellent performance, Shimadzu's GC systems improve productivity. For example, the Nexis GC-2030 system combines three standards into one to save analytical instrument and labor costs.
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Product
Analysis and Visualization of Arbitrary Test Reports and Result Data
TEST-GUIDE
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Test execution in development projects leads to the accumulation of various reports and data. Test automation intensifies this, producing very high numbers of test executions, which are distributed over several users and test environments. This multitude of test results from different sources can be efficiently managed and analysed using TEST-GUIDE.
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Product
Multi-Layer Analysis for Next Generation PONs
Multi-ONU Emulator
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The NG-PON Xpert multi-layer analyzer is a unique, real-time protocol analyzer for XG-PON1, NG-PON2 and XGS-PON networks and products. The Multi-ONU Emulator introduces a new revolutionary approach for comprehensive testing of an OLT. It enhances the testing with repeatable test scenarios and functionalities that cannot be tested in any other way, including the OLT's ability to handle various ONU models and configurations, error and defect conditions, alarms and traffic loads.
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Product
Network Analysis Solution
IOTA
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IOTA is a complete network analysis and troubleshooting solution for a variety of use cases in small, mid-size enterprises, remote sites, and small data centers. It is a versatile integrated solution, combining TAP, storage, and analysis capabilities in a single portable device.
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Product
Measuring Microscopes, Image Processing + Semiconductor Technology, Micro Scriber
Line Width Measurement
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Optik Elektronik Gerätetechnik GmbH
COMEF is an image processing software with special functions for the highly accurate measurement of line width and line distance. Using grey value algorithms, the width and distance of conductor lines or structures on silicon wafers can be measured with subpixel accuracy.
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Product
Thermal Imaging Camera
Compact Series
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Made for iPhone® and Android™ top models, Seek Compact transforms your smartphone or tablet into a professional thermal imaging tool. By utilizing the power and convenience of your smartphone, our cameras make it easy to take thermal photos and video, share findings, and send for documentation. Simply connect and detect energy loss caused by air leaks, missing or damaged insulation, inefficient HVAC systems, electrical faults, and much more. On top of all this, Seek Compact cameras are engineered to run on low power from your smartphone and do not require batteries or
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Product
Strain Measurements and Experimental Stress Analysis
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Experimental structural testing using strain gauges is necessary in a wide range of applications from airframes and sub-assemblies down to individual components such as turbine blades, satellites, wind turbines, buildings, bridges and many others. These tests enable the engineers to compare the acquired data with the predicted results from the design calculations.
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Product
Microchip Electrophoresis System For DNA/RNA Analysis MCE™
202 MultiNA
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This system is used to analyze the size of DNA/RNA samples, with convenientanalytical operability. It achieves analysis costs on par with agarose gel electrophoresis, and can perform fully automatic analyses of up to 108 samples. Using optimized reagent kits (four types for DNA analysis and one type for RNA analysis), the system achieves a high resolution and high sensitivity. It can significantly improve the workflow for mutation checks in genome editing, and genotype determination.
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Product
LPDDR5 Protocol Debug And Analysis Solution
U4971A
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The LPDDR5 Solution Bundle provides a systemized hardware, probing, and software solution for LPDDR / 2 / 3 / 4 / 5 protocol debug, compliance validation, and analysis.
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Product
Real-Time Analysis, 85 MHz, Basic Detection, Multi-touch
N9020B-RT1
Signal Analyzer
See, capture, and understand elusive signals as short as 17.3 s with 100% POI and a complete set of advanced triggers View signal dynamics with integrated real-time displays Maximize your investment by adding RTSA at a fraction of the cost of a dedicated solution Easily integrate the 89600 software and thoroughly analyze complex signals Industry-leading 3 year warranty Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
Analysis Software for FLIM, PLIM
SPCImage
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*Analysis of Single-Decay, FLIM and PLIM Data*Analysis by Iterative Convolution and Fit Procedure or by First Moment of Photon Distribution*Calculations of Decay Parameters and Lifetimes by Various Decay Models*Calculation of FRET Efficiencies*Display of Lifetime and FRET Images*Display of Lifetimes, Amplitudes, Intensities or Ratios*Export of Lifetime Data and Images
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Product
Material Analysis Laboratory
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Trialon’s world class Material Analysis Laboratory consists of state-of-the-art equipment and experienced staff. Our specialty is to determine failure analysis of design, material, process and root cause in both current and future products across multiple industries.
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Product
1.3 Million Pixel CMOS Image Sensor
Sapphire 1.3M
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This 1.3 million pixel Sapphire CMOS image sensor, designed on Teledyne e2v’s proprietary Eye-On-Si CMOS imaging technology, is ideal for diverse applications where superior performance is required. The innovative pixel design offers excellent performance in low-light conditions with both electronic rolling shutter and electronic global shutter, with a high-readout speed of 60 fps in full resolution. Novel industrial machine vision application features such as multi ROI and histogram output are embedded on-chip. Very low power consumption enables this device to be used in battery powered applications.
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Product
SSA-J Precision Clock Jitter Analysis Software
E5001A
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To meet the demanding needs of today's advanced digital communication systems, Keysight offers Precision Clock Jitter Analysis software (E5001A SSA-J) for more precise and accurate characterization and evaluation of clock-signal jitter.
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Product
VPX Image & Video Processing and GbE Data Transmitting Board
VP69702
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LinkedHope Intelligent Technologies Co.,Ltd.
Based on AMD Radeon™ E8860 GPU and Intel 82599ES controller, VP69702 is a VPX image & video processing and 10GbE data transmitting board mainly designed for applications of embedded image & video processing, GPGPU and 10GbE data transmitting.On VP69702, there are 2 independent display outputs routed to front and 2 10GbE interfaces. The GPU of VP69702 is equipped with 2GB GDDR5 video memory, 768/48 GFLOPS single/double precision peak processing ability and 640 shader processing units. VP69702 is highly suitable for HD output (1920x1080), 4K output (3840x2160), high-performance parallel computing and other applications and fields.
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Product
Scientific CCD Image Sensors
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Our front and backside illuminated (BSI) and backthinned Charge Coupled Devices (CCDs) are seen as the gold standard for scientific and quantum imaging in applications in spectroscopy, microscopy, In vivo, x-ray and astronomy. We understand that every imaging application is unique and requires our engineers and scientists to work closely with our customers providing highly tailored imaging solutions.
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Product
Enhanced Time Domain Analysis With TDR
S93011B
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S93011B enhanced time domain with TDR is available on all PNA models (N52xxB) and provides a one-box solution for high-speed interconnect analysis, including impedance, S-parameters, and eye-diagrams
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Product
Zero-footprint Event-level Scheduling Analysis For Critical Software
RapiTaskZero
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*Gain insight into your application through scheduling analysis*Locate rare timing events that need attention*Identify bottlenecks in your application by analyzing capacity issues *Compare scheduling algorithms from different RTOSs*Visualize scheduling behavior of libraries without source code
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Product
Ultra-compact thermal imaging core
Dione 1024 CAM Series
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The Dione 1024 CAM series is based upon the Dione 1024 OEM thermal imaging core with 1024×768 pixels and 12 μm pixel pitch. The NETD is less than 40 mK (available upon request) or 50 mK. The maximum frame rate is 80 Hz.Dione 1024 CAM is a LWIR uncooled thermal imaging SWaP module with housing supporting M34/M45 lens (optional).Dione 1024 CAM series benefit from Xenics image enhancement for advanced image processing while keeping power consumption low. Moreover, GenICam compliance and the availability of multiple lenses (optional) provides a high level of tunability for optimal integration into many systems.The compact Dione 1024 CAM series find applications in safety and security, transportation and industrial process monitoring.
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Product
Cross-Section Analysis Laboratory
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PCBs are constructed of a variety of materials such as glass, ceramic, copper, solder and Teflon. Trialon has the equipment and experienced staff to perform this difficult analysis. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Product
Visual Analysis of any Embedded System
SystemView
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SEGGER Microcontroller GmbH & Co. KG
SEGGER is announcing the release of SystemView, a free tool enabling the visual analysis of any embedded system. SystemView gives complete insight into the behavior of a program, with minimal side effects on the observed embedded system. SystemView offers cycle accurate tracing of interrupts and task start stop as well as task activation and API calls when an RTOS is used. It visualizes and analyzes CPU load by task and interrupts and scheduler. Test setups with LED and oscilloscope are a thing of the past.
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Product
Counterfeit Analysis / Screening Services
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DPACI perform counterfeit part analysis on all types of electrical, electronic, and electromechanical (EEE) components. Our suspect counterfeit analysis task groups include source identification, manufacturer validation, external visual inspection, mechanical inspection, electrical test, X-Ray, in-depth internal visual and materials analysis. With one of the largest databases of test reports for EEE components, we can offer similar historical data for correlation with images, test data, certifications and reports.
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Product
Root Cause Failure Analysis
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Maintenance Reliability Group, LLC
Root Cause Analysis of Grease Lubricated Components: Root cause analysis includes a complete root-cause failure report and recommendations for further monitoring and corrective actions. MRG will test for grease consistency, oxidation, product contamination and wear metals utilizing Grease Thief® Analyzer die extrusion test, FTIR, RULER and RDE Spectroscopy. Testing includes Analytical Ferrography and Rheometer testing. Testing can include the submission of a failed component for extraction of grease from failed component and visual inspection for Root Cause Analysis.Root Cause Analysis of Grease Lubricated Components: Root cause analysis includes a complete root-cause failure report and recommendations for further monitoring and corrective actions. MRG will test for grease consistency, oxidation, product contamination and wear metals utilizing Grease Thief® Analyzer die extrusion test, FTIR, RULER and RDE Spectroscopy. Testing includes Analytical Ferrography and Rheometer testing. Testing can include the submission of a failed component for extraction of grease from failed component and visual inspection for Root Cause Analysis.
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Product
Imaging Camera for Dynamic FLIM Studies at Real Time Video Rates
FLIMera
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The HORIBA FLIMera camera is a new concept in FLIM technology. It is a wide field imaging camera, rather than a confocal point scanning system, with the intrinsic benefit of being able to study FLIM dynamics at video rates with a simple camera technology.
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Product
Device Parameter Analysis
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bsw TestSystems & Consulting AG
The complexity of DC Parametric Characterisations has significantly increased with the level of miniaturisation in the semiconductor industry. The demand is not only on the precision of the measurements. New measurement methods have emerged to gain insight into phenomena previously unknown or only of marginal relevance. One example is "Pulsed IV" which is now widely in use. The modular concept of the Keysight B1500A allows users to tailor their instrument exactly to their needs. Flexible upgrades ensure the investment for many years. Together with bsw AG you will get an optimum solution for your application. Our experts provide not only support for the instrument itself but have also working knowledge of all the solutions surrounding it. This includes Cabeling and Adapters, Fixturing for packaged Parts and of course Wafer Probing. We help customers from replacements of broken or worn-out parts to planning and deployment of turn-key-systems.
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Product
Metallurgy Analysis
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The metallurgical group is well equipped and staffed (9 full-time metallurgists and technicians) to evaluate materials ranging from cast iron to superalloys to composites. They are experienced in classical metallographic techniques, as well as the latest preparation methods.
