Focused Ion Beam
A scanning electron microscope with the electron source replaced by a gallium ion gun. Used for fault analysis and modification of modern microchips and semiconductor devices. (http://www.empa.ch)
See Also: Beam
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Product
Large Aperture Beam Profilers
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Modern laser applications seldom require large beam profiling, combined with high resolution. The BeamOn HR 1" is the perfect solution enabling both relatively large beam characterization, with a high resolution detector of 20 MP. By implementing a diffuser to present the beam to a smaller detector via dedicated optics, one of the largest beam profilers of 60 mm is offered, i.e BeamOn LA U3. Even further than that, for collimated beams the Laser Analyzing Telescope offers an input aperture of 100 mm combined with high resolution, attitude and divergence measurement of the laser beam.
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Beam Position Detectors
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We offer a wide range of laser beam position detectors for optical alignment including Quadrant Cell Photoreceivers, PSDs, and Thermopile Position Sensors. Please see our Beam Position Sensor Guide for more information.
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Carbon Fibre Beam Gauge
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Designed to measure both internal and external diameters and lengths, the high modulus carbon fibre beam is stiff, lightweight and has an extremely low co-efficient of thermal expansion (CTE). Suitable for measuring high accuracy diameters and lengths up to 4000mm+.
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Laser Beam Positioning
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Under the trade name of SpotOn we offer a wide variety of computerized position measurement systems.This is a family of cost-effective and versatile solutions to numerous industrial and laboratory applications.Among the measurement applications, are:Measure laser power and centration or displacementAlign beams and QC of optical systemsMeasure target rotation and displacementMonitor vibration, deflection and motion
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Product
Secondary Ion Mass Spectrometry (SIMS Analysis)
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Rocky Mountain Laboratories, Inc.
Secondary ion mass spectroscopy is operated either in the dynamic mode (DSIMS) or the static mode (SSIMS). DSIMS is useful for profiling impurity and trace elements through films and interfaces. SSIMS is useful for characterizing polymeric materials and only measures the outermost molecular layer of a specimen.
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Product
Ar Gas Cluster Ion Source
GCIS
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The Kratos Ar Gas Cluster Ion Source (GCIS) is optimised for depth profiling organic materials in Arn+ cluster mode and inorganic materials in Ar+ monomer mode, dependent on the operating parameters defined by the user and the type of material to be profiled. In Arn+ ion cluster mode the ions can be accelerated up to a maximum of 20 keV. This enables the successful sputter depth profiling of the widest range of polymer materials to be undertaken. However, Arn+ cluster depth profiling has been shown to give very low sputter yields for inorganic materials. In order to retain the capability of generating depth profiles from this class of materials this ion source can also be operated in the more conventional Ar monomer (Ar+) mode.
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Ion Chambers
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0.2 to 5000 mR/hr, 5 Ranges• Temperature Compensated• Retractable 1000 mg/cm² Beta Shield• High Background Zero Capability• Proportional Audio Output
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Product
Chloride Ion Test Kit for Abrasives
134A
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Contamination can build up, particularly if the blast media is recycled several times. Using the Elcometer 134A Chloride Ion Test in the field will accurately identify contamination and prevent costly surface-related failures.
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Product
Compact Type 4 Safety Beam Sensor
ST4
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Panasonic Industrial Devices Sales Company of America
Panasonic's concept of connecting 6 sets of Sensor heads to 1 Controller in series offers maximum flexibility to solve a wide range of safety applications. Just configure exactly the number of Sensor heads and controllers required to protect the area in question, e.g. small openings or irregularly shaped spaces impractical for Safety Light Curtains. A beam interruption indicator is incorporated in both the emitter and receiver to indicate operation and assist with beam alignment.
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Product
Shear Beam Load Cell
SB-1.0
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The Shear Beam Load Cell SB-1.0 is a single point weighing device, suitable for use in multiple applications.
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Product
Beam Lead PIN Diodes
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The SemiGen SBL 2000 series Beam Lead PIN Diodes feature fast switching speeds at both low capacitance and resistance. Beam Lead PIN Diodes have high levels of mechanical strength and stability during assembly. These diodes are suitable for microstrip or stripline circuits as well as circuits requiring high isolation from a series of mounted diodes such as multi-throw switches, phase shifters, attenuators and modulators.
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Product
Sodium Ion Concentration Pocket Water Meter
LAQUAtwin Salt-22
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The only pocket meter that directly measures sodium ion concentration in 0.3ml sample (or 0.05ml sample with sampling sheet B) and converts it into salinity or NaCl salt concentration. No need for a beaker to calibrate the meter or measure a sample. Just place few drops of the standard or sample onto the sensor. This procedure saves you time and prevents wasting your precious sample.
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Product
pH Ion Meter
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pH Ion Meters can be used in research institutions, and at a variety water quality related production sites in the mining, agriculture, forestry and fishery industries, for measuring the ionic concentration and various laboratories for the researches and drug manufacture processes. In addition, it is used in agriculture to measure the salinity levels of surface water and of soil samples and also measure the quality of water.
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Product
UV-Vis Double Beam Research Spectrophotometer
UVD-3500
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The high- performance blazed holographic grating and the optimized CT-type Monochromator reduce stray light, and widen the photometric range. Wavelength range: 190 nm – 900 nm. Spectral bandwidth: 0.1, 0.2, 0.5nm, 1.0nm, 2.0nm, and 5.0 nm.(UVD-3500).
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Product
Waterproof pH/mV/Ion/ Conductivity/TDS/ Resistivity/SalinityHandheld Meter
CyberScan PC 650
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Combining two of the most popular electrochemistry parameters, the Eutech’s CyberScan PC650 allows you to measure pH, conductivity and temperature with one handheld, at the same time.
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Product
Gridded RF Ion Sources
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Veeco's gridded RF ion sources are designed for improved production of long-run ion beam deposition processes.
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Product
Broad-Beam Ion Milling
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Materials Evaluation and Engineering
Ion beam milling is a unique method of sample preparation that complements and significantly extends the capabilities of the traditional microscopy and metallographic laboratories.
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Beam Diagnostics
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We offer camera-based devices with wavelength ranges from UV to IR. All are cameras are USB3.0, for the fastest data transfer rates.
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Economical Single Point Bending Beam Load Cells
ESP SERIES
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The ESP Series is a economical, high accurate single point bending beam load cell. It is ideal for OEM applications such as electronic scales and weighing machines. The single point bending beam design is highly resistant to eccentric loading allowing direct mounting to the scale base and weighing platform. The ESP Series features a moisture proof sealant.
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Product
Ion Chromatography
Hyphenated Techniques
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Extend the scope of ion chromatography by interfacing your Metrohm IC with various sampling system and detection techniques
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Product
MALDI Digital Ion Trap Mass Spectrometer
MALDImini-1
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With its simple configuration and compact size, it is possible to install the MALDImini-1 in places where mass analysis devices could not previously be used. Through ingenious engineering and innovation its footprint has been reduced to the size of a piece of paper.
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Product
Beam Bender
10707A
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The Keysight 10707A bends the incoming beam at a 90-degree angle and is designed for beam diameters of 6 mm or less . Includes a housing for standard mounting.
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Product
Camera Based Beam Propagation Analyzer: M2
BeamSquared
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The BeamSquared® system is a compact and fully automated tool for measuring the propagation characteristics of CW and pulsed laser systems from the UV to NIR to Telecom wavelengths. Users can also measure wavelengths above 1.8 microns, including CO2 and terahertz in manual mode (a bench set-up; without the automated optical train) with a Pyrocam IV or IIIHR. Our longer optical train and patented Ultracal™ Calibration makes BeamSquared the most accurate product on the market and is ISO 11146 compliant. Its operational robustness and reliability ensures continuous use applications in industry, science, research and development.
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Product
Multiple Light Beam Safety Devices
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Leuze electronic GmbH + Co. KG
The multiple light beam safety devices of the MLD 300 (type 2) and MLD 500 (type 4) series are used for access guarding at machines and systems. The devices are available as 2-, 3- and 4-beam transmitter-receiver systems for large operating ranges up to 70 m and as cost-efficient 2- and 3-beam transceiver systems for operating ranges up to 8 m.
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Product
Spectro UV-Vis Dual Beam PC Scanning Spectrophotometer
UVS-2800
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Spectro UV-Vis Split Beam PC is a precise scanning Spectrophotometer with a new design of 8 microprocessor automatic 2 row cell holder that moves noiseless with a special membrane. This Split Beam Spectro has a dual detector and a very accurate system.
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Product
Automated Laser Beam Quality Measurement System
Beamage-M2
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Large Apertures: The only M2 system on the market equipped with a complete set of 50mm optics. Also, the sensor is 11.3 x 11.3 mm. Simple Alignment: Two beam-steering mirrors are included for quick and easy alignment of your laser into the system. The internal mirrors are factory-aligned and the pre-set height also simplifies the alignment.Available Fall '17
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Beam Diagnostics Systems
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Characterize the spatial intensity distribution and size of laser beams, and visualize beam shape, with speed and accuracy.
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Product
Ion 700 Benchtop Meters
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Oakton benchtop 700-series meters are designed for use in crowded laboratory settings. Compact footprint of less that 6" x 7" (16 x 18 cm) conserves valuable space, while the large, dual-display LCD provides excellent visibility—even from a distance. Ion 700 meter measures pH, mV, relative mV, ion concentration and temperature. Automatic temperature compensation (ATC) maintains reading accuracy even with fluctuating temperatures. Models feature five-point pH calibration with automatic buffer recognition for both USA (pH 1.68, 4.01, 7.00, 10.01, 12.45) and NIST (pH 1.68, 4.01, 6.86, 9.18, 12.45) pH buffers. Meters additionally feature ion concentration calibration of up to 5 points. Meter features include Auto-Hold, selectable °F or °C measurement, and easy recall of electrode slope or offset. The convenient pull-out quick reference card keeps procedures handy at all times. Use 700-series meters with any pH, ORP, or ISE electrodes with a BNC connector.
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Product
Laser Diode Collimators, 520nm - 785nm, Elliptical Beam
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The Optoelectronics Company Ltd
Custom lasing wavelengths and power options are available. Both standard and custom configurations provide OEMs, end-users and systems integrators with complete, cost-effective laser solutions.
