System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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Product
PXI-2541, 300 MHz, 8x12 PXI RF Matrix Switch Module
778572-41
Matrix Switch Module
300 MHz, 8x12 PXI RF Matrix Switch Module—The PXI‑2541 is an RF signal switching matrix. With its non-blocking design, you can simultaneously connect any row or column within the switching matrix and maximize the flexibility of your test system. Isolation relays on the module disconnect unused parts of the switching matrix to maintain RF performance and high isolation. The density and bandwidth of the PXI‑2541 is ideal for routing signals between digitizers, function generators, and other RF generators and analyzers. For higher channel count applications, you can connect multiple PXI‑2541 modules together to create switching matrices of 8x24, 8x36, and larger.
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Product
System Test
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Testing a complete system is very different from unit and integration test. It starts with the V model that defines the system requirements, and this needs an effective system test capability that includes both the system and the environment around it. If the system has interfaces to the outside world, communications links or human control, these interfaces have to be tested.
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Pump Test System
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This automated test system evaluates a wide range of performance metrics for a cooling pump assembly. The LabVIEW based system programs the DUT then initiates a series of tests to check:Serial communication verificationMotor voltage & currentImpeller speed and flowAir and water temperaturesLeak and level sensor functions
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Product
Large-size Hybrid Reverberation / Anechoic Chamber
F-Series
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The F large-size hybrid Reverberation/Anechoic Chamber represents the most versatile OTA test system in the market today. With the same unique test features of their E Series RC counterparts, the F-Series can also test large form-factor devices under test (DUTs) like laptops, large TV sets, solar and trash compactors, drones, fridges or washing and vending machines, among others. With up to 16x16, 8DLCC and DUTs up to 2m and 500 kg including full-body phantoms in a turntable, the F Series also expands the frequency range down to cover 200 MHz up to 40 GHz frequency ranges and the test modes to include EMC, BS, small cell, eNodeB and Virtual Drive Testing over the air (VDT-OTA). In an again unheard-of feature, the F-Series is also reverse-convertible into an Anechoic chamber, allowing Far Field (FF) and Spherical Near Field (SNF) radiation patterns, efficiency and gain measurements and pre-5G testing of antennas and devices. Conversion from RC to AC or vice versa can be performed within half a day.
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Product
JTAG Debugger Software
JSCAN
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JSCAN lets you view and control JTAG pins in real-time without having to touch your board! With a simple click of your mouse, you can set pins HIGH or LOW and observe the results right on your PC.J-SCAN works independently of any logic inside the JTAG device, you do not need any special firmware, code or logic installed. View and control pins in real-time, program FLASH memories, create test macros, for system test, easy to use graphical interface and affordable.
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Product
Test System
UltraFLEX
Test System
The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Product
Rack - Touch Display on Swivel Arm
OTP2-Modul-Nr042
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The module is for mounting on a rack, such as the midi or maxi rack. The extension with the module can create new possibilities for your test system.
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Product
Computer-Based Instruments
GT668PXIe
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GuideTech’s GT668PXIe PXI 3U form factor, meets industrial standard chassis with an expandable platform, achieving optimal test system at low cost. High accuracy 100MHz time base with NIST traceable calibration. Some of the GT668PXIe-1 measurements include Jitter measurements, PLL & Clock Jitter, Spread Spectrum Modulation, PLL Lock Time, Frequency, Period, Pulse Width, Skew, Tpd, Rise/Fall Time, Time Interval Error and more.
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Product
PCI High Density Pecision Resistor Card, 9-Channel, 2.5Ω To 1.81kΩ
50-298-022
Programmable Resistor Module
The 50-298-022 is a high density programmable resistor card with 9 channels which can be set between 2.5Ω and 1.81kΩ with 0.5Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Missile Systems
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IES Systems is a turnkey test system solution provider with proven experience in Acceptance Test Procedure (ATP) testing, Highly Accelerated Stress Screening (HASS) and Environmental Stress Screening (ESS) testing.
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Nanomechanical Test Systems
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Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
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Product
Mini LED Backlight Module Automatic Optical Test System
7661-K003
Test System
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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Display Test System
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PIMACS provides the broadest range of display optical performance measurement system for optical testing of various samples including flat panel displays. We are specialized in testing all sizes of display modules and panels ranging from various field.
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PXI High Density Precision Resistor Module, 18-Channel, 2Ω to 62.1Ω
40-298-011
Programmable Resistor Module
The 40-298-011 is a high density programmable resistor module with 18 channels which can be set between 2Ω and 62.1Ω with 0.25Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
Waveguide Harmonic Mixers (smart mixer), 60 to 90 GHz
M1970E
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The Keysight M1970E 60 to 90 GHz waveguide harmonic mixer is an un-preselected mixer that will extend the operating frequency range of the N9030A PXA, N9020A MXA,and N9010A EXA signal analyzers up to 90 GHz. Smart features are embedded to help you to greatly simplify your overall test setup and improve the DANL and TOI of your test system. Go smart with harmonic mixing for your millimeter-wave applications.
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Product
FaithTech Regenerative High-power Programmable DC Load
FTR9000 Series
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Shenzhen FaithTech Technology Co., Ltd.
FTR9000 series is a regenerative programmable DC electronic load. It not only has the function of traditional consumable load, but also cleanly feeds the energy consumed by traditional load back to the power grid to achieve the purpose of energy conservation. It can be widely used in new energy equipment testing, lithium ion, fuel and other battery discharge testing, automatic testing system, AC/DC, DC/DC and other one-way module product testing and aging. The product is equipped with rich communication, programming interfaces, color screens and a variety of text menu interfaces, which is easy to operate and intuitive. It is a common equipment in the power electronics, new energy, sensors, motor drives, system integration and other industries.
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Product
PXI/PXIe MEMS RF Multiplexer, Quad 4-Channel, 4GHz, 50Ω, SMB
40-878-241
Multiplexer Module
The module is based on the latest micro-electromechanical system (MEMS) switching technology and has low insertion loss and VSWR. In addition, MEMS devices have a long operational life of >3 billion operations and benefit from an operating time of <20 μs allowing greater test system throughput. The multiplexers have excellent and repeatable RF characteristics beyond 4 GHz with each path having a nominally equal insertion loss.
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Product
Drivetrain Test Stands
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Customers in automotive and off-highway vehicle production and R&D environments trust us to design and build precise, reliable, and repeatable drivetrain component test stands. All of our systems are designed to provide the highest level of dynamic testing capability at a competitive price. For decades, RedViking has designed, built, and implemented highly engineered test systems for drivetrain systems and components.
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Modular Test System
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A modular test system, RTS (real time scanner) provides instant test results with minimal interface cables to check wiring during installation.It tests wire harnesses in real time using our micro switching technology, reducing the need for high cost interface cables by around 90%. an innovative best-in-class solution for FAL testing, RTS also offers many benefits for wire harness and sub-assembly manufacturers.
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PXI Programmable Power Supply
Programmable Power Supply
PXI Programmable Power Supply modules feature multiplechannels that you can combine for higher voltage or current capabilities. Some modules include isolatedchannels and an output disconnect functionality that allows isolation from the device under test(DUT) when not in use and remote sense to correct for losses in system wiring. You can use these models to simplify the task of designing automated test systems for a wide range of applicationsfrom aerospace and defense to automotive and component testby eliminating the need to mix multiple instrumentation form factors in a given test system.
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LCZ LCR Meter
SS1062
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This (SS1061 / SS1062 / SS1063) LCZ Meters are a test system for passive components designed for the use in electronic inspection or production process for quality control. They meet any demanding requirement on production speed and precision, discrimination of qualified products from unqualified ones, as well as internal setup, storing and calling function for up to 10 instrument groups, so they are actually optimum test instruments for component incoming and production inspection. Like as: transformer, inductor, resistor, capacitor, relay, motor, generator, eletric valve, contactor, cable, wire, etc..
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Product
PXI 5W Programmable Resistor Module, 1-Channel, 1.5Ω to 3.55kΩ
40-252-123
Programmable Resistor Module
The 40-252-123 is a programmable resistor module with 1 channel which can be set between 1.5Ω and 3.55kΩ with 1Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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VeriStand
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VeriStand helps you get your hardware-in-the-loop or test cell control and monitoring system up and running quickly. With a wide range of out-of-the-box functionality that includes configurable data acquisition and logging, test sequencing, and simulation model integration, VeriStand reduces the time needed to test your products. You can also use a variety of software tools to add custom functionality to VeriStand, which makes it flexible enough to adapt to even the most complex applications. Choosing VeriStand gives you the confidence that your test system will perform reliably while providing the flexibility you need to meet your real-time test requirements.
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FPGA PXI High-Performance Digital I/O Card
GX3702
Digital I/O
The GX3702 is a user configurable, FPGA-based, 3U PXI card which offers 160 digital I/O signals which can be configured for single-ended or differential interfaces. The card employs the Altera Stratix III FPGA, which can support SerDes data rates up to 1.2 Gb/s, digital I/O clock rates of 700 MHz, and features over 45,000 logic elements and 1.836 Kb of memory. The GX3702 is supplied with an integral expansion board providing access to the FPGA's 160 I/Os and is pin for pin compatible with the NI PXI 7813R and 7811R FPGA cards . Alternatively, users can design their own custom expansion cards for specific applications - eliminating the need for additional external boards which are cumbersome and physically difficult to integrate into a test system. The design of the FPGA is done by using Altera's free Quartus II Web Edition tool set. Once the user has compiled the FPGA design, the configuration file can be loaded into the FPGA directly or via an on-board EEPROM.
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Product
PXIe-2748, 3 GHz, 16x1 PXI RF Multiplexer Switch Module
780587-48
Multiplexer Module
PXIe, 3 GHz, 16x1 PXI RF Multiplexer Switch Module—The PXIe‑2748 is a PXI RF multiplexer switch module that is ideal for switching RF signals up to 3 GHz in production test applications. The high channel count of the PXIe‑2748 makes it well-suited for test systems that require switching a large number of RF signals, such as switching several devices under test to a single channel on the RF analyzer. It also features onboard relay counting for relay monitoring.
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PXI Precision Resistor Module 9-Channel, 1 to 31.5
40-297-110
Programmable Resistor Module
The 40-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Bus Management Test System
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Solution to test redundant Architecture of BMUComprehensive test system performing tests of > 3000 I/O's Special test circuits using hybrid / ceramic components to operate in Thermovac chamber Tests various subsystem functionalities like, AOCS, Sensor Electronics, Telemetry, Tele-command with Self test and application test software
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3U Intel® Core™ i7-7820EQ Quad-Core Processor-Based PXI Express Gen3 Controller
PXIe-3987
Controller
The ADLINK PXIe-3987 PXI Express embedded controller, based on the 7th gen Intel® Core™ i7 processor, is specifically designed for hybrid PXI Express-based testing systems, delivering maximum computing power for a wide variety of testing and measurement applications.
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Product
Metallic Pendulum Impact Testing Machine
JB-S Series
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Jinan Testing Equipment IE Corporation
JB-S series superior metallic pendulum impact testing system is strictly designed according to international standards ISO148, ASTM E23 and EN10045. The pendulum impact testing system is mainly used to determine the anti-impact capability of metal materials under dynamic load and is capable of doing a large number of of impact tests continuously. Adopting the important intelligent programmable logic controller (PLC) system, the pendulum impact testing system can realize the test process control and test data collection based on computer software program or digital display touch screen controller. The test data can be used for further data analysis, storage and printing. An aluminum shield with transparent tempered glass covers the load frame for safe operation. The impact testing machine of metallic pendulum is the essential quality control equipment for metal material manufacturers and QC departments, as well as the necessary instrument of research institutes for new material research.
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PCI High Density Pecision Resistor Card, 18-Channel, 2Ω To 122Ω
50-298-012
Programmable Resistor Module
The 50-298-012 is a high density programmable resistor card with 18 channels which can be set between 2Ω and 122Ω with 0.5Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
