ATE Fixtures
Holding and positioning assemblies to guide UUT I/O access by automated test equipment.
See Also: Test Fixtures, PCB Test Fixtures, Board Test Fixtures
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Product
High Speed Spin Fixture
1571P Series
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The Model 1571 High Speed Rate Table System is designed to provide a precision high velocity testing solution for the development and/or production testing of inertial packages or their components.
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Product
Test Fixtures & Jigs
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A test fixture or test jig is the component containing the bed of nails used for testing the PCB or assembled product. It is powered and controlled by the Yelo Testpoint system which has test cards capable of providing multiple test conditions. This system also controls the probes used in the bed of nails, and relays test information back to the Testpoint system to be analysed.
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Product
Compression Set Fixture
ASTM D395
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ASTM D395 Compression Set Fixture is to test rubber under constant deflection in air.
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Product
USB-C® – USB 2.0 Plug HS SQ Test Fixture
AUT17094
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This product is designed for USB-C USB2.0 Receptacle Host Electrical Test.
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Product
Stand-Alone Test Fixture
MA 2012/D/H/GR2270/71
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,00 kg
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Product
Food Grips and Fixtures
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AMETEK Sensors, Test & Calibration
We supply material testing instruments to some of the world’s most innovative companies within the food industry. The reason for this is our extensive experience within food testing, combined with our high precision texture analysis and packaging test systems.
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Product
Manual Fixture Kit With Changeable Cassette, Max number of probes (2N) 500 units, Max UUT 197 x 114 mm (wxd)
CMK-01
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Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Product
Custom Test Fixtures
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For popular high speed components like semiconductor packages, and test contactors, we have developed a custom test fixture which allows the use of high bandwidth microprobes to measure virtually any I/O pin, according to GigaTest's methodology and requirements.
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Product
Exchangeable Test Fixture
MA 2112/D/H/S-7/GR2270/71
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 12,13 kg
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Product
ICT/FCT-Fixtures (Small IF)
GenRad CK-1-228X-S
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
Actuation Methods for In-Circuit Test Fixtures
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Commonly referred to as In-Circuit Test (ICT), loaded board test can be defined as the task of measuring values of components that have been installed on a printed circuit board (PCB). A second basic category of loaded board test measures simple open and shorts on the board to verify manufacturability standards. Circuit Check supports all forms of in-circuit test strategies with its Performance Grade and Value Line test fixtures.
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Product
Flexible Pitch GND Fixture Clamps
GF-A
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High Power Pulse Instruments GmbH
*Compatible with GGB picoprobe model 10 replacement probe tips*<1 ns rise time (200 ps possible with 5 mm GND wire length)*Custom selectable GND wire length 5-15 mm*Gold-coated spring-steel clamp with micro-machined groove for locking of the clamps on the probe tip*High conductivity and low inductance copper HF litz wire with 200 x Ø 0.02 mm strands*Easy to use clamping*Tungsten carbide probe needle with 1 inch length, 15° taper and 7.5 µm tip radius
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Product
VOC FIXTURE OVER CLAMP ASSEMBLY'S
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Test-X VOC Series overclamps are used for testing bare or loaded printed circuit boards with open vias and to minimize board flex.The VOC Series overclamp comes with adjustable delrin pressure fingers, anti-rotating hex nuts, hinge and latching assemblies, mounting instructions and hardware.The VOC Series will accomodate fixtures with dress frames or newer style fixtures using full-size top plates.
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Product
Open Source Hardware Test/Programming Fixture
OpenFixture
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OpenFixture is a fully parametric programming/test fixturing solution written in openscad. The inputs are generated/captured from the users board layout software and a laser cuttable fixture is generated automagically.
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Product
Standard & Custom Test Fixtures
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Both standard and custom Test Fixtures from OAI enable the user to integrate the solar cell with the I -V tester. Fixture configurations range from from simple hold down devices to temperature-controlled fixtures with front and back side contact. We invite you to contact an OAI Application Engineer for help with your fixture design. With our expert guidance, you can expect maximum performance from your I -V Tester and Solar Simulator.
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Product
Lamp & Fixture Wiring Tester
GT3110GAM LAMPCHEK
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LampChek indicates the lamp and fixture continuity.
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Product
Headphone Test Fixture
AEC206
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The Larson Davis Model AEC206 Binaural Test Fixture is the tool for testing supra-aural, circumaural, supra-concha, intraconcha, and insert-type headphones. Preassembled with IEC 60318-4 (711) occluded-ear simulators and TEDS compatible preamplifiers that provide electronic calibration information, the Model AEC206 is user-friendly and easy to learn. Additionally, calibration is a simple process—a custom adapter is included for the Model CAL250 acoustic calibrator or similar device.
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Product
Precision LCR Meter With Component Fixture And Limits Comparator
LCR400
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0.1% basic measurement accuracyDual 5 digit high brightness displaysAutomatic component recognitionBuilt-in 4 terminal component fixtureLimits comparator with 8 Pass bins plus 2 Fail binsThree test frequencies, switchable biasRS232 interface standardOptional SMD tweezers, BNC connectors, Kelvin Clip test lead set, and PC logging software
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Product
Test Fixturing Solutions
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Amfax and MAC Panel have teamed up to provide a unique WIRE-FREE Test fixture technology. We have created an alternative solution to traditional wired ITAs called PECture(TM). The name is a combination of PEC (Printed Electronic Circuit) and fixture.
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Product
Becker Transponder Test Fixture
TA-3400
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This transponder test fixture is specific to the requirements for testing Becker Avionics Transponders and provides interface connectors for both the panel mount and remote systems. The panel also provides switches to implement Gillham code altitude as well as separate interfaces for an external parallel or serial encoder. The panel will interface with the RMU 5000 or standard control head. This fixture also comes with voltage and current meters along with an internal dimming source. This panel comes in the standard 19 inch rack width and measures 12 inches in depth.
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Product
USB-C® Short Channel Rx Precet. Test Fixture
AUT20098
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*Easy swap between CC1 and CC2RP & RD Mode: In the older version of the USB-C full breakout board, users had to manually set the jumper with a short pin. But now users can easily swap between the two by just moving the switch.*In the previous version, the soldering joint of Test Fixture Host Fixture 1A gets worn out quickly from repetitive plug and pull. This newly designed fixture is more durable and users can easily replace the worn out SMA connectors with new ones.*DC-in Jack is upgraded to +5V USB C portA boost in user experience as it makes setting up easier.
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Product
Stand-Alone Test Fixture
MA 2011/D/H
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1000Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 12,00 kg
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Product
ADI Test Fixture
TA-6500
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The TA-6500 test fixture combines the features of the OEM's Instrument Servo Tester(T307962), the Pointer/Flag Test Fixture(T307951) and the AD-650/600 Test Panel(T334043) all into one panel to facilitate testing of these Attitude Director Indicator's. The panel switches and adjustment pots are labeled to match the test procedure numbers and the duplicity in marking makes it easier for the technician to understand each function. The UUT interface is through a 96 pin zero insertion force(ZIF) type connector to minimize contact wear. The expanded localizer and nav input pins J2-34/35 are exposed on the panel to facilitate the insertion of a 200 ohm shunt when required. The fixtures rear panel has connectors for the required dual API/Synchro transmitter interface while the panel switches provide the correct routing of each.
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Product
USB-C® Tx & Long Chnnel Rx Precet. Test Fixture
AUT20044 Rev:B0
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The original Intel USB-C 3.1 Tx Test Fixtures includes two types of fixtures, UFP and DPF. Allion Pre-Cert Test Fixture integrates functions of the two fixtures into an one-board solution, eliminating the hassel to frequent switching of two fixtures.
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Product
SMD Test Fixture
16034G
Test Fixture
Perform impedance evaluation on a minimum SMD size of 0.6(L) x 0.3(W) [mm]
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Product
Cryogenic Millimeter-Wave / Microwave Test Fixtures and Calibration Kits
upj10
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KEYCOM''s cryogenic millimeter-wave / microwave test fixtures and calibration kits are specifically optimized for testing the performance of patterns between the edges of printed boards(edge type) and circuit testing on the printed boards(probe type). They are also designed to minimize heat capacity by miniaturizing their dimensions so they cool off efficiently, and materials with low coefficient of linear thermal expansion such as invar are used for major parts where high dimensional stability is required. Their operating frequency ranges from DC to 110GHz.
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Product
Exchangeable Test Fixture
MA 2112/D/H/S-7/HG/KT-ITA-21
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 16,30 kg
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Product
Bending Stiffness Test Fixture
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Q-Card’s bending stiffness fixture features splayed feet and aggressive no-slip rubber pads for stability. It is manufactured of aerospace-grade aluminum alloy with a hard anodized, scratch-resistant, durable finish to provide years of rigorous testing and trouble-free service.
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Product
Exchangeable Test Fixture
2112/D/H/S-7/HG/Pylon
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 13,50 kg
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Product
ARINC HSI / ADI Test Fixture
TA-2000
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The TA-2000 test fixture is a combination panel that incorporates all the standard capabilities of the legacy CTS-11(ADI) and CTS-12(HSI) panels and much more. This panel is married to our model TA-1001 dual synchro transmitter/API panel thus allowing for local stimulus and alignment of the instruments synchros and resolvers. The panel provides for testing of both superflag(28v) and low level meters through a matrix of switching that will allow testing of all meters simultaneously or just individually. The low level meter drive circuit also incorporates an automatic mode that will continuously oscillate the L/R and Up/Dn pointers.
