PD Test
partial discharge testing.
See Also: Partial Discharge, Partial Discharge Detection, Partial Discharge Monitors, PD, Partial Discharge Test
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Product
PDS Excavator Monitoring System
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It shows a real time overview of the excavator in navigation, profile, and 3D views; displaying the dredge tool, pontoon/vessel, design depths, and color-coded digital terrain model (DTM). The navigation view highlights the high and low spots and is updated in real time, recording the progress of the dredging work. The recording follows the shape of the dredge tool and is visible immediately in all views. Up/down indicators show the operator the exact distance to the seafloor and design depth continuously. 3D design models allow the use of complex designs. The monitoring system can also be used for a remote presentation on the bridge of the vessel and it is possible to draw the vessel in the views of the excavator as well.
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Product
EBIRST 200-pin LFH Coaxial Adapter - 56 SMBs
93-002-202
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
PDS Cable Trencher Monitoring Software
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- Displays trencher depth relative to the seafloor- Real time monitoring of the operation- USBL configuration- Multibeam measurements included in the project.- Easy calibration of the sensors for the trencher
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Product
Disk Drive Test System
Saturn
Test System
The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
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Product
Non-Signaling RF Test Platform for Validation & Production
Universal Wireless Tester
Test Platform
Wireless communication standards are increasingly integrated into vehicles as well as smart home and Internet-of-Things applications. They form the basis for connected services, advanced HMIs, and autonomous driving. The combination of constantly evolving standards and the integration of multiple wireless technologies with many RF channels into new product designs means that measurement speed and quality are becoming a priority.
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Product
Memory Test System
T5221
Test System
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
Parametric Test Fixture
U2941A
Test Fixture
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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Product
USB PD Power Supply/Module ATS
8000 Series
Power Supply
The USB 3.1 specifications has three major features which are 10Gbit/s transmission speed, USB PD (Power Delivery) with support for 100 watt charging power, and the standard Type-C connector/cable that can be inserted with either side. It is expected to meet all kinds of data / video transfer applications. The advent of USB PD may consolidate the specifications of various power converters and the laptop, monitor, printer or Hub that implements USB PD is no longer a simple power-consuming device but able to supply power to other devices. The USB PD DRP (Dual role port) function allows the built-in USB PD module to deliver a maximum of 100 watts of power through the Type-C interface. To make sure the USB PD Type-C output power does not supply invalid voltage or poor power output characteristics with excessive noise that can damage the power consuming device and cause unsuccessful startup, each USB PD power supply or module has to be fully tested during production to ensure the product features meet the design specifications. This ensures high-quality products are provided to the market to gain acceptance.
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Product
Multi-Channel PD System Locator
PDiagnostic Series
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Power Monitoring and Diagnostic Technology Ltd.
The PDiagnostic is a portable system that utilizes Ultra-High Frequency (UHF), Acoustic Emissions (AE), High-Frequency Current Transformer (HFCT), and Transient Earth Voltage (TEV) sensors to detect, analyze, and locate the PD signals in real time for a multitude of medium and high voltage electric power equipment.The multi-channel PDiagnostic system locates PD on power equipment down to a meter by utilizing Acoustic-Electromagnetic Combination Location Technique, Time Difference of Signals’ Arrival (TDOA), Partial Discharge Signals Separation (PDSS), and 3D Positioning Technology with PC software included.The system features advanced PD diagnostic capabilities, automatic PD type pattern recognition, and accurate PD location capabilities. The PDiagnostic is an ideal trouble-shooting tool for your PD programs. Severity is determined and maintenance suggestions are provided accordingly.
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Product
BSD (Test Diagnostics)
test
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
In-Line RF Test Station
AP770
RF Test System
ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
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Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Product
CPE Design Verification System
Jupiter 310
Test System
Jupiter is the industry standard for automated DOCSIS physical (PHY) layer testing. It provides the most comprehensive test coverage and accurate results on the market for DOCSIS 3.1 devices.
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Product
Massively Parallel Parametric Test System
P9001A
In-Circuit Test System
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
Portable PD Analyzer
AQUILA
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A compact and portable Partial Discharge acquisition unit, which allows to detect and analyze partial discharge activities in all electrical assets: from power cables to transformers, rotating machines and switchgears, together with the right combination of sensors and accessories. AQUILA comes with a full range of options, ideal for field testing.
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Product
At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional Test
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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Product
Automated Aerospace and Defense Test
test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Product
Flying Prober Test System
QTOUCH1404C
Test System
Qmax Test Technologies Pvt. Ltd.
The Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built high resolution Vision Camera for easy monitoring of probe needle contact. The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision.
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Product
Fibre Linked EHV And Distributed Assets PD Monitoring System
EHV-PDM
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The EHV-PDM is a PD monitoring system designed for application on critical EHV and distributed assets, where the monitoring point could be many hundreds of metres or tens of kilometres apart. Fibre linked monitoring points transmit PD data over long distances to the main monitoring unit, which then processes the data and displays the results on a secure customer web front end.
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Product
PD (Partial Discharge) Tester
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Weshine Electric Manufacturing Co., Ltd
Using the Windows system operating platform, you can freely choose ellipse, straight line, sine wave display, two-dimensional, three-dimensional graphic analysis mode, spectrum window, Q-V-F three-dimensional characteristic window, and static detailed measurement, observation and analysis of partial discharge pulse of one-cycle test voltage .
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Product
PDS Jet Dredge Software
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Teledyne PDS for jet dredges is designed to the requirements of the dredge operator to carry out their job more efficiently. The operator has a real time overview of the dredger with the top and side views displaying the vessel outline and tube along with the surveyed depths, design, and dredged depth.
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Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
test
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
PDS Caisson Placement Software
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- Computation relative to previous placed objects- Placement guidance is accurate and reliable- One software suite for a complete solution for your project- Easily integrated with other modules of Teledyne PDS- Easy to use software for your application
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Product
Photonics Module Test System
58625
Test System
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
Test Platform
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Product
Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
Test Fixture
The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
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Product
Function Test and In-Circuit Test
CT350
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ICT test points: max 2736 CAD Data import Automatic program generator Powerful debugging tools Test coverage analysis Paperless repair station Logging- and statistic functions Full graphical functions Panel and multisite tests Fast adapter exchange High Pin Count-Interface On table optional usable shelf part.
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Product
Test Sockets
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socket design as per customer specificationsquick + easy socket changehigh-performance spring probesdesigned for high frequency up to 16 GHz-55C/-67F to 150C/302F temperature rangemanual/automatic application optionssmall socket footprintone socket base for each insert (3x3 to 9x9 QFN)one-click switch from engineering to production socket modedevice dependent standard socket frame with changeable insertmore than 500,000 compression cyclesKelvin test applicabilitytool-free insert + actuator exchanges0.3 mm minimum lead pitchQFP extender available
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Product
Microwave Testing
120
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The MODEL 120 PICOPROBE® sets new standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics, the Model 120 Picoprobe®, achieves an insertion loss of less than 1.75 db (typical) and a return loss of greater than 15 db (max.) over its frequency range.
