PD Test
partial discharge testing.
See Also: Partial Discharge, Partial Discharge Detection, Partial Discharge Monitors, PD, Partial Discharge Test
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Product
PD Test Systems
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1. Number of channels: 2/4 electric signal interfaces & 1 EXT interface 2. Sampling frequency: maximum 200MGa/s 3. Sampling precision: 12bit 4. Range: 0.1mV~20V 5. Range switch: 1mV, 2mV, 5mV, 10mV, 20mV, 50mV, 100mV, 200mV, 500mV, 1V, 2V, 5V 6. Frequency band range: 1Hz-60MHz 7. Range non-linear error: 5% 8. Range of capacitance for test object: 6pF~250µF 9. Power source mode: internal lithium cell / AC 220V 10. Display: 6.5 inches TFT LCD 11. Resolution: 640×480 12. PV: 4GB 13. Hard disk: 32G stiff disk used for storing the test data
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Product
PoE PD Test Solutions
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Explore PoE PD Test solutions from Sifos Technology. What type of testing does your Power-Over-Ethernet Powered Device need?
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Product
Partial Discharge Calibrator
TPK-H
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The high voltage-resistant Partial Discharge calibrator is used to determine the correction factor in the PD test circui.
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Product
PD Emulation Module
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Xtramus Industrial Instruments
A specialized hardware testing tool made by Xtramus Industrial Instruments that acts as a Powered Device (PD) to test Power over Ethernet (PoE) equipment.
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Product
Powered Device Analyzer for 802.3at
PDA-602B
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Emulate all Type-1 and Type-2 PSE’s, powering 2-pairs up to 41W at all PD input voltages. Optionally supports 802.3at PD Conformance Test Suite and LLDP emulations.
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Superior Handheld Partial Discharge Detector
PDStar
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Power Monitoring and Diagnostic Technology Ltd.
PMDT is proud to present one of our latest innovations, the PDStar. It integrates On-Line Partial Discharge (OLPD) testing and Infrared testing for MV and HV equipment, which combines UHF, AE, Ultrasonic, HFCT, TEV, and Infrared testing technologies. It is applicable for online PD testing, as well as abnormal heating and defect detection on all types of substation equipment. PD amplitude, PRPD, PRPS, and infrared spectrums provide critical data for determining the operational condition of electric power equipment. It connects to the PMDTCloud via Wi-Fi/3G/4G to upload test data, download test tasks, and receive diagnostic results in real time. Another uniquely advanced feature of the PDStar is that it integrates with a 100 MSPS (Mega-Samples per Second) HFCT signal processor, which greatly improves the performance for power cable OLPD testing.
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Online PD Spot Tester
Liona
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Cable testing and diagnostics with the BAUR liona. Liona is a portable online PD spot tester for measuring and locating partial discharges in cables and switchgear during normal mains operation. Liona lets you test cable systems and electrical equipment online without switching off partial discharge activities, and then generate trend analyses. Even a PD spot test (duration: 5-10 minutes) is capable of reliably assessing the current status of your system.* Automatic PD detection during normal mains operation (without switching off the cable route)* With DeCIFer technology: PD identification based on 500 million measurement results* Precise online PD mapping with PD transponder
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Product
Capacitive Divider
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It can be chosen as PD sensor for Techimp PDCheck, PDScope or PDBaseII systems. It is suitable for on line or off line PD tests onrotating machines, for both spot measurements and monitoring applications. A BNC termination is available to connect the coupler through a coaxial cable.
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Product
Inductive Sensor
HFCT Ø 30-39-50mm
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Techimp HFCT is an inductive sensor for partial discharge measurements. It is suitable for on/off line PD tests on many electrical systems (cables, transformers, rotating machine, etc..). It has to be applied to the ground connection of the system to be tested.
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Product
ITSM Synchro
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The Impulsive Test Synchronization Module (ITSM) is a device aimed at generating a digital synchronization signal, to use the PDBaseII system for impulsive voltage PD test. The digital synchronization signal generated by the ITSM, is synchronized with the voltage impulse of the impulsive source (voltage generator). The ITSM must be connected between the DIN channel of PDBaseII and the output of the synchronization sensor (e.g. capacitive coupler). The ITSM provides also a low voltage signal reproducing the impulsive voltage source.
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Product
High Frequency Current Transformer
HFCT Ø 140mm
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Techimp Clamp High Frequency Current Transformer model 140 is an inductive sensor for partial discharge measurements. It is suitable for online /off line PD tests on : large diameter cables ; grounding rod bar ; etc. A TNC termination is available to connect the Clamp HFCT 140 to the TechImp PD analyzer : PDCheck , PDBase etc. The arrow indicates the requested input current (Iin) direction to get coherent output voltage (Vout) polarity respect to ground. When the sensor is installed with the arrow directed to ground, the detected voltage signal (Vout) has the same phase of the input current (Iin).
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Product
Universal Partial Discharge Measurement and Analysis System
MPD 800
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Our MPD 800 universal partial discharge (PD) measurement and analysis system represents the next generation of our widely-used and innovative MPD PD testing technology. Enhanced and newly-added hardware and software features ensure highly-sensitive multi-channel PD measurements for reliable, industry-standard PD testing on a variety of electrical equipment and components.
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USB PD Test System
6050
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Single Output USB PD USB PD basic version:the single-group test systemarchitecture is as shown in the table, 5302A AC Source, 3302F + 3310F series and9922-R Quick Charge Controller.
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PD Conformance Test Suite for 802.3at & 802.3bt
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Sifos Technologies offers the ultimate simplicity in testing a PD’s conformance to IEEE 802.3 Standards with Pass/ Fail reporting in the PD Conformance Test Suite available for purchase with the PDA-600 Family of Instruments.
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PD Free Test Transformer
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Wuhan Fanke Transformer Manufacture Co., LTD
PD Free Test Transformer
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Product
AC Hipots for Factory and Field Testing
HPA Series
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HPA Series test sets perform AC withstand and PD testing (most models) on higher capacitance loads, offering up to 40 kVA and 300 kV AC
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NI HIL and Real-Time Test Software Suite
test
Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
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Interactive Benchtop Test
test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Fast and Flexible WLAN Measurements up to 802.11ax
WLAN Test Toolkit
test
The WLAN Test Toolkit gives you direct and fine control over the generation and analysis of IEEE 802.11a/b/g/n/ac and ax signals, as well as 802.11j/p/ah/af waveforms, with industry-leading speed and accuracy. It empowers you to characterize, validate, and test a variety of WLAN connectivity products, such as RF front end components, wireless modules, and user devices.The toolkit includes extensive support for the latest features of the 802.11ax standard, including extended single-user packets, multiuser OFDMA, and multiuser multiple input, multiple output (MIMO) functionality with per-user configuration and measurement results. The WLAN Test Toolkit helps you solve demanding new access point test cases by generating signals that simulate multiuser environments, including per-user impairments. You can also use the new software to generate trigger frames to test the real-time response of client devices and make power precorrection and relative center frequency measurements.
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Product
SoC Test System
T2000
Test System
SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
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Product
CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
Test Instrument
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Scalable Tester System for Functional Testing
UTP6010
Functional Test
The UTP6010 is a scalable tester system for functional testing, comprising an integrated main switching unit, a keyboard drawer and a swivelling monitor. It is the reliable, modular, low priced UTP starter kit. The system is suitable for tester applications, where space-saving devices are required, because its construction height is only 12 HU (excluding keyboard drawer and main switching unit).
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Bluetooth RF Test System
FRVS
Test System
FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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Product
Memory Test System
T5221
Test System
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
NI Semiconductor Test Systems
Test System
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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Product
High Speed Test Bench
AT444
Test Platform
AC motor with mechanical multiplying gearbox test benches allow precise programming of all drive parameters required for accurate rotating devices test.The use of special high-speed bearings, mechanical components and parts wear resistant leads to a large life. The supply includes the electronic drive and control as well as the entire oil cooling unit.
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SoC Test Systems
Test System
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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SoC/Analog Test System
3650-S2
Test System
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Semiconductor Test System
TS-960e
Test System
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.





























