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Product
Atomic Force Microscope
DriveAFM
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The DriveAFM is Nanosurf’s novel flagship AFM platform: a tip-scanning atomic force microscope (AFM) that combines, for the first time, several capabilities in one instrument to enable novel measurements in materials and life sciences.
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Product
Atomic Oven
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Atomic oven with collimated output for ultra-high vacuum systems, loaded with Sr, Yb or Ca. The oven provides superior heat isolation while achieving high atomic flux. Its low power consumption results in exceptionally low pressures during normal operation for temperatures up to 650 °C. The chamber is shipped in an ultra-high vacuum storage chamber supplied by AOSense. Customers can provide AOSense with a previously purchased storage chamber for repeat orders. Please contact us for more information.
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Product
Atomic Force Microscope
NaioAFM
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The NaioAFM is the ideal atomic force microscope for nanoeducation and basic research on small samples. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place.
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Product
Atomic Force Microscope
XE-PTR
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Park Systems' PTR Series is a fully automatic industrial in-line AFM solution for, but not limited to, automatic Pole Tip Recession measurements on Rowbar-level, individual Slider-level, and HGA-level sliders. With sub-nano scale accuracy, repeatability, and throughput, the PTR Series is the metrology tool of choice for Slider manufacturers to improve their overall production yield.
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Atomic Layer Deposition Systems
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Atomic Layer Deposition (ALD) is a powerful way to build ultra-thin, super-precise coatings, one atomic layer at a time. It’s especially useful and efficient when working with tiny, complex 3D structures, making it a go-to technique in advanced semiconductor manufacturing.
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Product
Cold Vapor Atomic Fluorescence (CVAF) Mercury Analyzer
QuickTrace M‑8000
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The QuickTrace® M-8000 Cold Vapor Atomic Fluorescence (CVAF) mercury analyzer is ideal for ultra-trace to sub-mg/L mercury quantitation. Due to the high sensitivity of the M-8000, it easily achieves the ultra-trace detection limit of <0.05 ng/L total mercury that is demanded by customers following EPA method 1631. The QuickTrace® M-8000 is also versatile enough to analyze samples >400 µg/L without dilution in a research or industrial setting.
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Product
Atomic Absorption Spectrometer
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Atomic absorption spectroscopy (AAS) determines the presence of metals in liquid samples. Metals include Fe, Cu, Al, Pb, Ca, Zn, Cd and many more. It also measures the concentrations of metals in the samples. Typical concentrations range in the low mg/L range.
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Product
Atomic Force Microscope
Flex-Mount
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Flex-Mount is a unique AFM that can be configured to acquire high-resolution information on large, non-planar and demanding samples. The Flex-Mount solution combines the superior resolution and performance of the Nanosurf FlexAFM scan head with the integrability of the Nanosurf NaniteAFM.
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Product
AFM (Atomic Force Microscope) Optical Platform
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The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
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Product
Atomic Force Microscope
LensAFM
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The Nanosurf LensAFM is an atomic force microscope that continues where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and measuring capabilities of these instruments.
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Product
CVAF – Cold Vapor Atomic Fluorescence
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Cold Vapor Atomic Fluorescence (CVAF) is a powerful technique based on detecting fluorescence light emitted by the sample. Below the principle of the technique is explained in a nutshell.
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Product
Atomic Absorption Systems
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Agilent leads the industry with innovative atomic absorption (AA) instruments. The entry-level SpectrAA 55B is ideal for labs in remote locations, while the 240FS and 280FS AA systems achieve the productivity of sequential ICP with Agilent’s Fast Sequential technology. The 240Z and 280Z AA systems provide superior performance and accurate background correction with transverse Zeeman technology. Our AA Duo systems feature unique simultaneous operation of both the flame and graphite furnace.
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Product
Clock And Trigger Synchronization Board With Atomic Clock
CLKSYNC-PCI-AC
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CLKSYNC-PCI-AC is a clock and trigger distribution board designed to provide up to eight synchronous clock and trigger outputs. The CLKSYNC-PCI-AC is designed for use with multi-channel, ADC and DAC systems where precise clock and trigger synchronization are required.
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Product
Microwave Plasma Atomic Emission Spectroscopy / MP-AES Systems
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Agilent’s industry-leading microwave plasma-atomic emission spectrometer (MP-AES) systems are powerful, cost-efficient and easy-to-use for a wide range of applications from routine analysis to complex precious metals analysis. By running on air, Agilent MP-AES systems both cost less and are safer than alternative methods that rely on flammable gases. The innovative Agilent 4210 MP-AES system offers higher sensitivity and faster throughput capabilities than flame atomic absorption.
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Product
Atomic Resolution Analytical Electron Microscope
NeoARM JEM-ARM200F
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"NEOARM" comes with JEOL’s unique cold field emission gun (Cold-FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold-FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV."NEOARM" is also equipped with an automated aberration correction system that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging even at low accelerating voltages. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit.
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Product
Atomic Force Microscope
NX10
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Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and better data, you can focus on doing more innovative research.
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Product
Atomic Clocks
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Society has become dependent on atomic time. Atomic clocks underpin our financial transactions, communications services and broadcast services, but they are expensive to produce and maintain.Quantum technology brings a new generation of clocks which are smaller, more accurate and cost effective, and as a result this is driving an evolution of new time-critical products and services.
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Product
Atomic Absorption Spectrophotometer
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Atomic Absorption Spectrophotometer (AAS) is a kind of instrument for the inorganic analysis. It is widely used in environmental protection, medicine, sanitation, metallurgy, geology and petrochemical industry fields for micro and trace analysis. Atomic Absorption Spectrophotometer can analyze more than seventy kinds of elements. With the development of instrument accessories and analyzing technology, more objects, from element to morphology and from nonmetallic anion to gas-phase molecule, could be analyzed directly or indirectly.
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Product
Atomic Force Microscopy
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Bruker’s industry-leading AFM microscopes provide the highest levels of performance, flexibility and productivity, and incorporate the very latest advances in atomic force microscopy techniques. Applications range from materials science to biology, from semiconductors to data storage devices, from polymers to optics with measurement of nanoscale topography, nano-mechanical, nano-electrical and nanoscale chemical mapping.
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Product
Rubidium Atomic Audio Clock
PERF10
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Stanford Research Systems, Inc.
Perfection is a high standard - but your studio clocks deserve nothing less. That''s why we designed the PERF10, to offer audio professionals and demanding audiophiles a frequency reference of staggering accuracy and unmatched stability.
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Product
Atomic Force Microscope
FlexAFM
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For success in research, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand.
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Product
Atomic Force Microscope
3DM Serirs
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Park Systems has introduced the revolutionary Park 3DM Series, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY and Z scanning system with tilted Z-scanner, it overcomes the challenges of the normal and flare tip methods in accurate sidewall analysis. In utilizing our True Non-Contact Mode™, the Park 3DM Series enables non-destructive measurement of soft photoresist surfaces with high aspect ratio tips.
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Product
Atomic Spectroscopy
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Agilent’s comprehensive atomic spectroscopy software portfolio leads the industry in the simple setup and productivity tools required by routine analytical laboratories, while also providing the flexibility needed for advanced method development in research and academia. Our advanced ICP-MS software, including the powerful ChemStation and MassHunter systems, are used in all of our mass-spec platforms, so you can benefit from a single solution and reduce staff training requirements. Our cutting edge ICP software also enables intuitive control in ICP-MS processes.
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Product
Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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Product
Atomic Force Microscope for SEM/FIB
AFSEM® AFM Insert
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AFSEM is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The correlated image data of AFM and SEM enable unique characterization of your sample, and the combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM enables you to easily combine two of the most powerful analysis techniques to greatly extend your correlative microscopy and analysis possibilities.
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Product
Atomic Absorption Spectrophotometer (Baseline Stability)
GT00WA00ZH
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*Good basic line stability*High precision of measurement*Optical path of high energy*Long-life and anti-corrosive atomization system*Multi-functional analysis mode
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Product
Low Temperature Gas Source
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Get a low-cost means to introduce a gas without thermal pre-cracking using Veeco’s low-temperature gas source for molecular beam epitaxy (MBE) systems. The source features a large conductance tube for fast gas switching and a diffuser end plate for good growth uniformity. It is an ideal gas injector for CBr4 for carbon doping in GaAs and NH3 for GaN growth, as well as any other gases that do not require thermal pre-cracking. Enhance system capabilities further by combining the source on one mounting flange with an Atomic Hydrogen Source or 5cc Dopant Source.
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Product
ALD Advantages
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Atomic Layer Deposition (ALD) stands out for one reason: control. The most significant advantages of thin film deposition via Atomic Later Deposition over other methods, are manifest in four distinct areas – film conformality, low temperature processing, stoichiometric control, and inherent film quality associated with the self-limiting, and self-assembled nature of the ALD mechanism ALD is exceptionally effective at coating surfaces that exhibit ultra high aspect ratio topographies, as well as surfaces requiring multilayer films with good quality interfaces technology. This thin-film process builds materials one atomic layer at a time, delivering unmatched uniformity and sub-nanometer precision, even on complex 3D structures. That level of accuracy makes ALD a critical technology for advanced semiconductor manufacturing, flexible electronics, and materials research.
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Product
Atomic Force Microscope
AFM Heron
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New, fully motorized AFM HERON (HERO of Nanotechnology) which allows to perfectly align a cantilever, laser and photodiode by just one click on a command button. The scanning settings and landing parameters are also automated that allows to avoid any time consuming adjustment operations, thus leaving more time to researcher for designing the experiment and performing more accurate measurements.
