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Product
Atomic Clocks
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Society has become dependent on atomic time. Atomic clocks underpin our financial transactions, communications services and broadcast services, but they are expensive to produce and maintain.Quantum technology brings a new generation of clocks which are smaller, more accurate and cost effective, and as a result this is driving an evolution of new time-critical products and services.
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Product
Atomic Clocks And Oscillators
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Safran is a world leader in rubidium atomic clocks and oscillators, quartz crystal (OCXO), maser, integrated GPSGlobal Positioning System is a navigation satellite system. See also/GNSS, and related testing instrument technologies that rely on accurate atomic time and the rubidium standard. Whether you need short or long term stability, our decades of experience designing and manufacturing products is trusted by companies ranging from global enterprises to space initiatives.
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Product
Atomic Force Microscope
NaioAFM
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The NaioAFM is the ideal atomic force microscope for nanoeducation and basic research on small samples. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place.
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Product
Atomic Absorption Spectrophotometer (Baseline Stability)
GT00WA00ZH
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*Good basic line stability*High precision of measurement*Optical path of high energy*Long-life and anti-corrosive atomization system*Multi-functional analysis mode
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Product
Atomic Force Microscope
FlexAFM
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For success in research, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand.
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Product
Microwave Plasma Atomic Emission Spectroscopy / MP-AES Systems
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Agilent’s industry-leading microwave plasma-atomic emission spectrometer (MP-AES) systems are powerful, cost-efficient and easy-to-use for a wide range of applications from routine analysis to complex precious metals analysis. By running on air, Agilent MP-AES systems both cost less and are safer than alternative methods that rely on flammable gases. The innovative Agilent 4210 MP-AES system offers higher sensitivity and faster throughput capabilities than flame atomic absorption.
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Product
Atomic Force Microscope
AFM
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Atomic Force Microscopes are the most widely used SPM microscopes. They can be applied in fields that span from surface science, semiconductor technology, magnetic media, polymer science, optics to biology, chemistry and medicine.Absolute positioning with an accuracy of 2 nm.
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Atomic Absorption Spectroscopy Consumables
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Since the atomic absorption spectrophotometer was first launched in 1968, Shimadzu Corporation has remained at the forefront of the world inorganic analysis industry. Shimadzu still maintains an overwhelming market share with highly-regarded products that are selected as the market standard throughout the world. The extensive product range incorporates fully automatic general-purpose systems, a simple and low-cost AA instrument, and a dedicated soil and plant analyzer. They all share great ease-of-use, high functionality, and excellent reliability. Choose Shimadzu to dramatically enhance the productivity and reliability of your laboratory. Shimadzu products will meet all your demands.
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Product
Atomic Force Microscope
DriveAFM
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The DriveAFM is Nanosurf’s novel flagship AFM platform: a tip-scanning atomic force microscope (AFM) that combines, for the first time, several capabilities in one instrument to enable novel measurements in materials and life sciences.
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Product
Atomic Spectroscopy
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For the past 40 years, we have provided products to the Atomic Spectroscopy industry that solve laboratory problems and improve the success of our OEM partners. These products include unique sample delivery solutions, sample preparation tools, autosamplers, and solutions to improve sample throughput and detection limitations, among others. In short, we strive to understand the markets our OEM partners serve in order to deliver products that meet their needs.
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Product
Cold Atomic Beam System
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Detailed description of item: Complete cold atomic beam sources for alkaline-earth precision experiments and atomic devices. Small chambers with patented permanent-magnet Zeeman slowers and in-vacuum 2D MOT optics allow high flux with low outgassing and no thermal beam flux at the cold atom port, which provides a CF-133 connection to customer vacuum chamber. Advanced thermal design of the effusion oven allows long-lifetime operation at minimal heating power, with no water cooling. An integrated low-outgassing hot window is provided for coupling of on-axis Zeeman cooling light. Ion and getter pumps integrated into the chamber manage outgassing from the oven at temperatures up to 520 °C. Operating baseline pressures below 1×10-11 mbar can be attained in the customer’s downstream cold atom (typically 3D MOT) science chamber, with suitable pumping speed provided at the differentially-pumped cold beam output port.
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Product
Atomic Force Microscope
XE-PTR
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Park Systems' PTR Series is a fully automatic industrial in-line AFM solution for, but not limited to, automatic Pole Tip Recession measurements on Rowbar-level, individual Slider-level, and HGA-level sliders. With sub-nano scale accuracy, repeatability, and throughput, the PTR Series is the metrology tool of choice for Slider manufacturers to improve their overall production yield.
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Product
Atomic Force Microscope
XE7
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Park XE7 has all the state-of-the-art technology you've come to expect from Park Systems, at a price your lab can afford. Designed with the same attention to detail as our more advanced models, the XE7 allows you to do your research on time and within budget.
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Product
Atomic Force Microscope for SEM/FIB
AFSEM® AFM Insert
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AFSEM is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The correlated image data of AFM and SEM enable unique characterization of your sample, and the combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM enables you to easily combine two of the most powerful analysis techniques to greatly extend your correlative microscopy and analysis possibilities.
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Product
Atomic Force Microscope
NX-Hivac
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Park NX-Hivac allows failure analysis engineers to improve the sensitivity of their measurements through high vacuum Scanning Spreading Resistance Microscopy (SSRM). Because high vacuum scanning offers greater accuracy, better repeatability, and less tip and sample damage than ambient or dry N2 conditions, users can measure a wide range of dope concentration and signal response in failure analysis applications.
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Product
Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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Product
Atomic Force Microscope (AFM)
CombiScope
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The CombiScope Atomic Force Microscope (AFM) is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope is the right solution for you. It perfectly combines inverted optical and atomic force microscopies and unleash all the power of both techniques providing the instrument adjustment and measurement automation, high resolution and high speed. Plus it can be easily upgraded to our Raman spectrometers.
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Product
Cold Vapor Atomic Absorption (CVAA) Mercury Analyzer
QuickTrace M‑7600
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The QuickTrace® M-7600 Cold Vapor Atomic Absorption (CVAA) Mercury Analyzer easily achieves the ultra-trace mercury detection limit of <0.5 ng/L. The QuickTrace® M-7600 is ideal for ultra-trace to sub-mg/L mercury quantitation. The M-7600 is designed for routine and research use in a variety of settings, including environmental laboratories, industry, and research institutes, for virtually any aqueous acidified sample.
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Product
Atomic Resolution Analytical Electron Microscope
NeoARM JEM-ARM200F
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"NEOARM" comes with JEOL’s unique cold field emission gun (Cold-FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold-FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV."NEOARM" is also equipped with an automated aberration correction system that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging even at low accelerating voltages. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit.
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Product
ATOM Handler
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The ATOM-IC Handler is a benchtop handler designed for use on engineering test floors and in development operations. Its innovative design allows for maximum flexibility and minimum cost and maintenance.
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Product
ALD Advantages
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Atomic Layer Deposition (ALD) stands out for one reason: control. The most significant advantages of thin film deposition via Atomic Later Deposition over other methods, are manifest in four distinct areas – film conformality, low temperature processing, stoichiometric control, and inherent film quality associated with the self-limiting, and self-assembled nature of the ALD mechanism ALD is exceptionally effective at coating surfaces that exhibit ultra high aspect ratio topographies, as well as surfaces requiring multilayer films with good quality interfaces technology. This thin-film process builds materials one atomic layer at a time, delivering unmatched uniformity and sub-nanometer precision, even on complex 3D structures. That level of accuracy makes ALD a critical technology for advanced semiconductor manufacturing, flexible electronics, and materials research.
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Product
Level AFM
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Is a flexible Atomic Force Microscope for scientists. It offers a wide range of modes, sophisticated spectroscopy options and the programming of user defined experiments. Besides standard options found in Anfatec's other AFMs, the level AFM allows to add Anfatec's full range of AFM options, such as KPFM, closed loop operation, automated sample motion, acoustic enclosure, humidity and temperature control ... Each instrument is adapted to the user's specific needs.
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Product
Atomic Absorption Spectrometry
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Is an easy, high-throughput, and inexpensive technology used primarily to analyze elements in solution.
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Product
Atomic Absorption Systems
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Agilent leads the industry with innovative atomic absorption (AA) instruments. The entry-level SpectrAA 55B is ideal for labs in remote locations, while the 240FS and 280FS AA systems achieve the productivity of sequential ICP with Agilent’s Fast Sequential technology. The 240Z and 280Z AA systems provide superior performance and accurate background correction with transverse Zeeman technology. Our AA Duo systems feature unique simultaneous operation of both the flame and graphite furnace.
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Product
Atomic Force Microscopy
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Bruker’s industry-leading AFM microscopes provide the highest levels of performance, flexibility and productivity, and incorporate the very latest advances in atomic force microscopy techniques. Applications range from materials science to biology, from semiconductors to data storage devices, from polymers to optics with measurement of nanoscale topography, nano-mechanical, nano-electrical and nanoscale chemical mapping.
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Product
The Level AFM For Educational Purposes
"Eddy"
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„Eddy“ is an Atomic Force Microscopy system for student's education. It bases on the approved Level AFM setup and includes a full sample set and a large cantilever set.
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Product
High-end Transmission Electron Microscope
CryoARM
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JEOL announces the latest member in its family of high-end transmission electron microscopes, the CryoARM. This highly automated TEM is designed for unattended operation and high throughput imaging of cryo-EM specimens. The CryoARM was initially introduced to a select audience at the 2016 Gordon Research Conference in Hong Kong, M&M 2016 in Columbus, OH and EMC 2016 in Lyon, France. The CryoARM is a dedicated cryo-TEM, based on the highly successful JEOL ARM (Atomic Resolution Microscope) series, an ultrahigh performance, highly stable platform considered to be the "best-in-class" TEMs. The development of the CryoARM was accomplished in collaboration with leading Life Science researchers.
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Product
Transmission Electron Microscope
TEM
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Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.
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Product
Atomic Force Microscope
HDM Series
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The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning and analysis. Park NX-HDM links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput. In addition, Park NX-HDM provides accurate sub-angstrom surface roughness measurements, scan after scan. Park NX-HDM, together with its industry's lowest noise floor, and its unique True Non-Contact™ technology, it is the most accurate AFM for surface roughness measurement in the market.
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Product
ALD Applications
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Atomic Layer Deposition (ALD) has the potential to optimize product design across a wide array of applications from making silicon chips run faster, to increasing the efficiency of solar panels, to improving the safety of medical implants.
