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Electron Microscope Sample Preparation
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Excellent sample preparation is the prerequisite for first-class electron microscopy. Be prepared – for great results in EM Sample Preparation! Perfect preparation makes the difference between trying and achieving, between failure and success, between results and excellent results. So be prepared for great results with Leica Microsystems!
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Robotic Sample Loading Systems
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Below you can see examples of two systems using our robotic sample loading system. Many other automated microscopy systems are possible using our components.
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PCIe Color Industrial Camera
CMOSIS CMV4000
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2K camera Applications: In-situ optical inspection camera, fast process capturing, e.g. Golf club swings, Intelligent Transportation Systems (ITS), Open road tolling and Traffic monitoring, Industrial Automation, Machine Vision, Facial Recognition, Motion Capture, Automotive crash testing, OCR/ OCV, 3D scanning, Robotic Arms, Material and Life science Microscopy, Ophthalmology and Retinal imaging, Medical Imaging, Flat panel inspection, Dental, Kiosks, Security, Biometrics
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Atomic Force Microscope for SEM/FIB
AFSEM® AFM Insert
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AFSEM is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The correlated image data of AFM and SEM enable unique characterization of your sample, and the combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM enables you to easily combine two of the most powerful analysis techniques to greatly extend your correlative microscopy and analysis possibilities.
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Electron Multiplication (EM) Standard Image Sensors
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EM (Electron Multiplication) is a technology that uses on-chip gain in the charge domain to effectively eliminate read noise from an image sensor. This enables advanced ultra-low light applications that require extreme sensitivity at fast frame rates. Examples include life science applications such as single molecule detection, super resolution microscopy and spinning disk confocal microscopy along with physical science applications such as nanotechnology imaging, Bose Einstein condensates and soft X-ray spectroscopy, and astronomy applications such as adaptive optics and lucky imaging. The inclusion of an additional conventional output allows further flexibility for applications such as true 24 hour surveillance.
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Stereo Microscopes
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Here are a few examples from our 40 years of microscopy experience in the development of special stereo microscope solutions and accessories for and with Leica , Zeiss , Nikon and Olympus .
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Software Options
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Sonix offers powerful microscopy analysis software to enhance packaged semiconductor imaging, accelerate production and adapt systems based on the ECHO platform to customer-specific requirements.
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Microscopy
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Aurora is an award-winning Airy Beam Light Sheet imaging system designed for researchers working in fields such as neuroscience, developmental biology, cancer biology, regenerative medicine and other bioscience disciplines, including Plant Sciences and Marine Biology. Compact, affordable and customisable, Aurora is available as a single and multiphoton light sheet fluorescence microscope for rapid, large 3D volumetric imaging, high resolution, multicolour, time-lapse imaging and live cell imaging. Aurora uses ground-breaking Airy Beam Light Sheet imaging techniques to achieve outstanding results in the field. It is currently in use by many leading organisations delivering results previously not possible.
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Optical Dilatometry Platform
OPP 868
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Result of over twenty years of R&D of optical instruments for the study of the thermo-mechanical behavior of materials, ODP 868 makes possible the analysis of samples beyond the limits of classical heating microscopy. Its versatility makes of ODP 868 the most innovative tool for production and R&D laboratories for the optimization of all the industrial processes that involve thermal cycles.
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PCIe-5763, 16-Bit, 500 MS/s, 4-Channel PCI FlexRIO Digitizer Device
786168-01
FlexRio Digitizer
The PCIe-5763 is a PCI FlexRIO Digitizer Device that simultaneously samples four channels at 500 MS/s with 16 bits of resolution and features 225 MHz of analog input bandwidth. With over 73 dB of SNR, the PCIe-5763 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PCIe-5763 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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PCIe-5764, 16-Bit, 1 GS/s, 4-Channel PCI FlexRIO Digitizer Device
785961-01
FlexRio Digitizer
The PCIe-5764 is a PCI FlexRIO Digitizer Device that simultaneously samples four channels at 1 GS/s with 16 bits of resolution and features 400 MHz of analog input bandwidth. With up to 70 dB of SNR, the PCIe-5764 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PCIe-5764 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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Modular Raman Spectrometers
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Multifunction confocal Raman microscopy system, based on new designed confocal microscopy techniques, with the ultra-low noise CCD camera latest advanced for Raman detection, highresolution spectrometer, attaining superior user friendliness and sensitivity.
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LIFA FLIM System
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The Lambert Instruments LIFA FLIM system is the fastest and easiest way to perform Fluorescence Lifetime Imaging Microscopy (FLIM).Available in versatile configurations dependent on your specific applications, the LIFA system offers a turn-key solution for fluorescence lifetime imaging microscopy. Compatible with any fluorescence microscope with a camera output – including microscopes by Leica, Nikon, Olympus, TILL and Zeiss. Set up is quick and easy, with all hardware integrated seamlessly with our dedicated LIFA software, so you can focus on your experiment.The advanced software instantly analyses data and presents the calculated fluorescence lifetimes visually. Recorded images are compatible with ImageJ, FIJI, Matlab and MetaMorph, while detailed statisitcal data can be exported to an Excel worksheet.
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Correlative Microscopy
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Our modular software platforms enable you to acquire, process and analyze images in multiple dimensions and over various timepoints
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EV Profiler Kit V2
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Harness the power of single-molecule localization microscopy to characterize EVs across scales. Quantify nanometer small, rare, and precious EV samples with super-resolution precision. ONI’s EV Profiler helps you focus on answering the right questions about your EV populations.
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Broad-Beam Ion Milling
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Materials Evaluation and Engineering
Ion beam milling is a unique method of sample preparation that complements and significantly extends the capabilities of the traditional microscopy and metallographic laboratories.
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PXIe-5763 , 16-Bit, 500 MS/s, 4-Channel PXI FlexRIO Digitizer
785160-01
FlexRio Digitizer
The PXIe-5763 is a PXI FlexRIO Digitizer that simultaneously samples four channels at 500 MS/s with 16 bits of resolution and features 225 MHz of analog input bandwidth. With over 73 dB of SNR, the PXIe-5763 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PXIe-5763 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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High-resolution, SWIR InGaAs camera
Wildcat+ 640 TE0 and WL Series
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The Wildcat+ 640 TE0 and WL series is based upon a state-of-the-art uncooled InGaAs detector with 640×512 pixels and 20 μm pixel pitch. The WL version uses a special windowless sensor package for laser beam analysis applications. The camera offers superior, high-resolution SWIR imaging capabilities, comes in a versatile and industry-proven Wildcat camera package (GenICam compliant) and offers advanced on-board image processing.The Wildcat+ 640 TE0 and WL cameras output full frame images at 220 Hz via either a CameraLink or USB3 Vision interface.The Wildcat+ 640 TE0 and WL is suitable for semiconductor inspection, display inspection (mobile phone and TV), microscopy and laser beam analysis.Benefits & Features- Compact and industry-proven camera design- High resolution SWIR imaging- Advanced on-board image processing performance- GenICam complaint- Flexible optical mount and lens options
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Sputter Coater & Freeze Fracture Solutions
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To obtain high-quality images of samples with scanning (SEM) or transmission electron microscopy (TEM), your samples need to be conductive to avoid charging. If a sample does not have a high enough conductivity, then you can quickly cover it with a conductive layer using the method of sputter coating. Also, a carbon or e-beam evaporator coating can be used. Such coatings protect the sample, allow enhancing of the EM image contrast, or can act as a TEM-grid support film for small scale samples.
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Fluorescence Illuminators
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In fluorescence microscopy, fluorescent substances are viewed or imaged with a microscope. These fluorescent substances may be naturally occurring in the sample or may be introduced to assist in the identification of specific features in the sample. Multiple fluorescent substances (fluorophores) with different fluorescent properties can be visualized within the same sample using the capabilities of fluorescence illumination and fluorescence filter combinations.
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Surface Analysis
Innova-IRIS
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This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.
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Tunable Lasers
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Tunable lasers are laser light sources designed to emit coherent light at large range of wavelengths. Simply put, this ability to “tune” wavelenghts makes these lasers particularly useful in many applications requiring great flexibility and performance optimization. As such, tunable lasers are commonly used for spectroscopy, interferometry, microscopy applications and writing of Holographic Optical Elements (HOE). More recently, we have seen their rise within quantum research.
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Fluorescence Microscopy Solutions
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Bruker’s suite of fluorescence microscopy systems provides a full range of solutions for life science researchers. Our multiphoton imaging systems provide the imaging depth, speed and resolution required for intravital imaging applications in neuroscience, oncology and immunology.
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Plastic And Reconstructive Surgery Microscopy Solutions
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Leica plastic and reconstructive surgery (PRS) microscopes give you the performance and reliability you need to repair intricate and fine structures during the most delicate reconstructive procedures. They feature high-quality optics, easy operation, and integrated visualization technologies, such as fluorescence filters and augmented reality (AR) fluorescence.
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Atomic Force Microscope
HDM Series
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The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning and analysis. Park NX-HDM links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput. In addition, Park NX-HDM provides accurate sub-angstrom surface roughness measurements, scan after scan. Park NX-HDM, together with its industry's lowest noise floor, and its unique True Non-Contact™ technology, it is the most accurate AFM for surface roughness measurement in the market.
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Deformable Mirrors
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High-precision adaptive optics components designed to correct wavefront aberrations in real-time for imaging, microscopy, ophthalmology, and laser beam shaping.
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SPA100
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Our highly sensitive source picoammeter is designed for measuring and logging very small currents down to the pA range - making it an ideal instrument for scientific and research applications, including physics, materials science and electron microscopy. Full-featured at an affordable price, the SPA100 combines sensitivity, accuracy and stability to allow users to measure low currents with high precision as well as conveniently source bias voltages for experimentation. SPA100 also doubles as an ultra-high resistance meter, measuring accurately into the teraohm range. As with all our “headless” products, the SPA100 connects to PC via USB and utilises our complimentary software EPIC - enabling users to easily measure, graph and capture readings with timestamps and measurement stability information.
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Physiology & Neuroscience Systems
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Below are two examples automated microscopy solutions, tailored towards physiology or neuroscience applications. Many of our components can be used to automate your microscope.
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Scanning Electron Microscopy
SEM
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Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Digital Microscopes
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Digital microscopes are microscopes without eyepieces. A digital camera acts as a detector. Images are displayed on a screen or monitor, turning the microscopy workstation into an ergonomic digital workplace.





























