Flash Memory
retains data absent of power. Also known as: Flash Device
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Product
16-Bit PCIe Gen-2 Digitizer / Oszilloscope 4 Channel 25 MS/s Up To 8 GS Memory
Octave-16 Express / CompuScope 8442
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The GaGe Octave Express 84XX CompuScope PCIe digitizer card features 16-bit resolution with sampling rates up to 25 MS/s with true Effective Number of Bits (ENOB) of 12-bits with 10 MHz input. Onboard digitizer sample memory is expandable up to 8 GS (16 GB) and up to 8 Octave Express digitizers can be combined for up to 32 channels in a single system.
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Product
Lan Digitizer / Oszilloscope With 16 Bit, 4 Channels 100 MS/s Up To 8 GS Memory
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The GaGe series of Faceless Connected Instruments (FCiX) provide test and measurement professionals new options for integrating high resolution, multi-channel digitizers into Ethernet and LAN enabled measurement systems. The applications served include manufacturing test, automotive test, remote communications monitoring, multi-site semiconductor test, and other solutions where a lightweight but powerful, multi-channel, independent digitizer system is required.
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Product
Arc Flash Analysis
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ETAP Arc Flash Analysis allows you to identify and analyze high risk arc flash areas in your electrical system, and it also allows simulation of several different methods used by engineers to mitigate high incident energy.
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Product
RAMCHECK LX DDR4 Memory Tester
INN-8686-DDR4
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The RAMCHECK LX DDR4 quickly and accurately tests and identifies DDR4 DIMMs for servers and desktops, as well as laptop SODIMMs.
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Product
16 Bit Digitizer (oszilloscope) PCIe Gen-3 2 Channels 500 MS/s 4GS Memory
RazorMax / CompuScope Express 16504
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The new extremely fast and high-resolution Gage digitizers of the series RazorMax Express CompuScope offer with a 3/4" long Single slot PCI Express card a resolution of 16 bit and a sampling rate of 1 GS/s (per channel).
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Product
Programmable Read Only Memory (PROM)
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Is a Static Random Access Memory. The pinout is the JEDEC 28 pin, 8-bit wide standard, which allows easy memory board layouts which accommodate a variety of industry standard ROM, PROM,EPROM, EEPROM and RAMs.
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Product
Memory Burn-In Test
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The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies.
