Wafer Level
-
Product
High Voltage 50 Ω Pulse Generator
TLP-4010C
-
High Power Pulse Instruments GmbH
*Wafer and package level TLP/VF-TLP/HMM testing*Ultra fast 50 Ω high voltage pulse output with typical 100 ps rise time*Built-in HMM (IEC 61000-4-2) pulse up to ±10 kV*High pulse output current up to ±40 A*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 programmable pulse rise times: 100 ps to 50 ns*8 programmable pulse widths: 1 ns to 100 ns*Optional pulse width extender increases pulse width up to 1.6 µs in 68 programmable steps*Fast measurement time, typically 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurement of complete wafers*High performance and high quality components
-
Product
Test Socket Based Elastomeric Matrix Connectors
-
Z-Axis offers a wide range of high performance test sockets, which are based on our elastomeric matrix connectors, for wide range of IC packages (BGA sockets, LGA sockets, etc.), coaxical, and wafer level; and for testing high speed, digital, analog, and RF signals etc.
-
Product
High Power Devices
-
SemiProbe configures our PS4L Adaptive Architecture into the Voltarus (TM) family of probe stations to fulfill the unique requirements of testing high power devices at wafer level prior to packaging. Voltarus probe stations are available in manual, semiautomatic, and fully automatic configurations that can test and characterize power devices up to 10 KV or 200 Amps (pulsed).
-
Product
Impulse Semiconductor High Current Integrated
Transmission Line Pulse Test System
-
The Impulse Semiconductor High Current Transmission Line Pulse (TLP) test system is the tool of choice for extracting ESD parameters for transient protection devices in a package, or at wafer level. With accuracy better than 100 milliohms at 40 amps peak current, the Impulse high current TLP is specially tailored to the needs of today's ESD device designers who must accurately measure low values dynamic resistance irrespective of breakdown voltage.
-
Product
High Voltage 50 Ω Pulse Generator
TLP-3010C
-
High Power Pulse Instruments GmbH
*Wafer and package level TLP/VF-TLP/HMM testing*Ultra fast 50 Ω high voltage pulse output with typical 100 ps rise time*Built-in HMM (IEC 61000-4-2) pulse up to ±8 kV*High pulse output current up to ±30 A*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 programmable pulse rise times: 100 ps to 50 ns*8 programmable pulse widths: 1 ns to 100 ns*Optional pulse width extender increases pulse width up to 1.6 µs in 68 programmable steps*Fast measurement time, typically 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurement of complete wafers*High performance and high quality components
-
Product
Wafer Prober
Prexa MS
-
The latest fully automated 300mm wafer prober for memory devices. Featuring high rigidity and exceptional thermal control, the system enables full-wafer contact testing.
-
Product
Wafer Chucks
-
ARC, in addition to fabricating Wafer Chucks from aluminum, is also known for its ability to work in hard to machine materials such as hardened (50-62 Rockwell) metal alloys, fired ceramics, e.g. SiC and glasses. These materials are often ideal for semiconductor equipment applications due to their ability to hold critical dimensions and tolerances. ARC specializes in surface grinding and lapping these materials to precision flatness and parallelism specifications needed for semiconductor wafer chuck requirements.
-
Product
Wafer Prober
Precio XL
-
Fully automated 300mm wafer prober. The system achieves high productivity, excellent contact performance, improved cleanliness, and short lead time, and offers a number of high value-added functions as options.
-
Product
Wafer Test
-
Based on the reliability test, CSE conducts the test of the IC chip through electrical signals to the semiconductor wafer. We provide various Test Solutions according to the needs of designers/manufacturers. by sorting out good and bad products.
-
Product
Laser Levels
-
Fast, accurate and portable, PLS laser levels save time and money versus traditional layout methods using a bubble vials, plumb bobs or complex measurements. Compare the benefits PLS laser tools: Beam quality will be bright, thin and crisp. Drop tested with water and dust Ingress Protection (IP). Designed for the professional contractor with self-leveling technology. Green Laser Levels, Rotary Lasers, Point Lasers and Line and Combo Lasers.
-
Product
Wafer Manufacturing
-
Scientific Computing International
A procedure composed of many repeated sequential processes to produce complete electrical or photonic circuits on semiconductor wafers in semiconductor device fabrication process.
-
Product
Ultrasonic Wafer Scanner
AutoWafer
-
Installed in more wafer applications than all other automatic ultrasonic testing tools combined, AutoWafer provides a complete, production-ready wafer scanner for wafers from 100mm to 200mm, including multiple sizes in a single batch.
-
Product
Level Translators
-
Renesas offers a 6-channel bidirectional, auto-direction sensing, level translator that simplifies the interface between two logic ICs operating at different supply voltages.
-
Product
Wafer Demounting And Cleaning Machines
-
Demounting and cleaning to high throughput fully automatic ingot after cutting in the slicing machine and wire saw.
-
Product
Level Sensors
-
Intelligent solutions for level and point level measurementWhether for continuous level measurement, point level measurement or both – SICK offers a wide range of solutions for process engineering, storage, and protection. Based on the installation situation, medium properties, and environmental conditions, SICK provides sensors that ensure efficient processes. As the provider of one of the broadest technology portfolios, SICK brings its knowledge to the forefront.
-
Product
Wafer Analysis Systems
Tropel®
-
Corning Specialty Materials has a long heritage of providing solutions to semiconductor equipment manufacturers. The Tropel line of wafer analysis equipment enables measurement of wafer substrates from 2” to 450mm regardless of material type and surface finish.
-
Product
Wafer Inspection System
-
JRT Photovoltaics GmbH & Co. KG
In close cooperation with well-known providers of inspection systems, we provide modular systems for quality control and classification of raw wafers.
-
Product
Wafer Chucks
-
American Probe & Technologies, Inc.
High Performance Chuck for your needs Introducing the American Probe & Technologies’ HC-6000 series of thermal chucks,
-
Product
Level Float Switch
2285
-
The 2285 Level Float Switch is suitable for level switching of various liquids, sewage in shafts, tanks, basins or cisterns. The double-chambered float is made of injection molded tough polypropylene that ensures good waterproof protection.
-
Product
Exposure Level Tester
ELT-400
-
*Wide frequency range (1 Hz - 400 kHz)*Standard-compliant measurement*Acceptance measurements compliant with CE standard IEC/EN 62233 and Generic Standard IEC 62311*Limit value traces conforming to ICNIRP 1998, 2010 and EMF Directive 2013/35/EU*Real time measurement with RMS and peak detectors*External FFT signal analysis for determining the frequency components via three channel analog output (one channel for each spatial axis) e.g. with the aid of a digital oscilloscope.
-
Product
Level Detectors
-
Becker Nachrichtentechnik GmbH
Becker Nachrichtentechnik offers selective RF level detectors for air interface monitoring. The detectors are especially designed for frequencies used in e.g. electron accelerators. Due its mechanical design, the modules are compatible to cable route mounting systems. The detection of unintentional RF radiation is a main application field.
-
Product
Torpedo Digital Level
DL136
-
Advance Plus Trading Co., Ltd.
Model Number: DL136 Key Specifications/Special Features: Torpedo Digital Level with level bubbles,LED technology for the brightest display, IP65 standards 1. 25.4cm 10 inch level with 2 bubbles, 254*28*58.8mm（L*W*H）;2. Resolution: 0.01° at 0° and 90°, 0.05° at the rest°;3. Horizontal level measuring range: 0 to 360°;4. Accuracy: ±0.1° at 0° and 90°: ±0.2° at the rest;5. Measures angle in degrees, IN/FT, % slope or pitch;6. Audible tone at level, plump and setting angle;7. Automatic shut-off after 3 minutes;8. Backlight LCD;9. Self checking accuracy;10. Self calibration;11. Hold-function to freeze the measurement;12. Memory recall (9 measurements);13. With magnets in the bottom;14. With scales at the front bottom alumimum side;15. Operated by DC 3V (2*LR03 AAA 1.5V batteries, not included); 16. IP65 waterproof & dusyproof industrial standard.
-
Product
Signal Level Meter
HT828B
-
Hangzhou Softel Optic Co., Ltd.
The signal level meter, SE828C is able to measure EQ, C/N, V/A and trunk volt in the CATV analog system, the number keys is designed to direct input frequency so that work would be easier. It can measure 2 channels at the same time.
-
Product
Sound Level Meters
Optimus
-
The Optimus Sound Level Meters are a range of high performance sound level meters that use the very latest technology to provide you with a simple and accurate tool to measure and record noise levels. Combining the latest digital technology with ease of use. Class 1 & Class 2 to IEC 61672-1:2013 & IEC 61672-1:2002. High performance guaranteed - Class 1 & Class 2 Sound Level Meters.
-
Product
Capacitive Level Switches
VEGACAP, VEGAPOINT
-
In capacitive point level detection, the sensor and vessel form the two electrodes of a capacitor. Any capacitance change caused by a level change is converted into a switching signal. Thanks to the shortenable cable and rod versions, level switches can be perfectly adapted to any application. They are often used for overfill or dry run protection as well as oil/water or foam detection.
-
Product
Wafer Test
-
WinWay’s commitment to technology, quality and service ensures our interface solutions go above and beyond to exceed your expectations. Our products and services have a proven track record of delivering customer success in semiconductor testing. The Company offers comprehensive test interface solutions ranging from wafer-level test, package-level test to thermal management.
-
Product
Level Switches
-
In point level detection, a point level switch detects when a certain predefined level is reached. Such a device is employed when it is not necessary to measure every possible intermediate level, as is the case with continuous level measurement. A switching command starts or stops filling equipment such as conveyors or pumps. Point level switches outputting a binary signal can be integrated into a process control system.
-
Product
Signal Level Meter
SLM-5870
-
Compact, light-weight, easy to carry With dual-channel measurement display Channel and single frequency mode
-
Product
In-Line Wafer Surface Defect Inspection
ALTO-SD-150/200
-
ALTO-SD SERIES IS AN IN-LINE INSPECTION SYSTEM SUPPLYING HIGH THROUGHPUT, FULL SURFACE DEFECT INSPECTION FOR ALL KINDS OF WAFERS INCLUDING SILICON, QUARTZ, SAPPHIRE, COMPOUND AND MEMS WAFERS. HIGH-RESOLUTION CAMERA OPTICS PLUS LED ILLUMINATION GUARANTEE RELIABLE DETECTION OF ALL LOCAL DEFECTS. IT INSPECTS DEFECT SIZE OF 1~ 10 MICRONS, CONFIGURABLE INSPECTION RESOLUTION TO OPTIMIZE DEFECT SIZE VS. THROUGHPUT. THE SYSTEM COMBINES HIGH-PRECISION MEASUREMENT, POWERFUL DATA ANALYSIS AND USER-FRIENDLY OPERATIONS.
-
Product
Vibrating Level Switch
TF 100 Series
-
TF-100 Series is a vibrating level switch with TF-L relay output and TF-P transistor output or with TF-T current output.This level switch is designed for reliable indication of clean liquids and light slurries. It is available with Relay, Current, and PNP outputs that can be set to indicate alarm on either high level for spill prevention, or low level for run-dry protection.
