ICT
Testing of short circuits, open circuits, component values and operation of ICs.
See Also: ICT Systems, In-Circuit Test
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Product
Automated ICT System
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With world-famous in-circuit test technologies and innovations around automated inline handlers, Keysight automated inline ICT solutions are versatile and flexible and provide you:
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Product
ICT Programmer
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Compatible with a wide range of microcontrollers in electronic devices. Supports programming of single product or bulk PCBA boards. Enables quick replacement of the adapter or dedicated product inserts. Equipped with a high-performance, multi-channel industrial ISP programmer.
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Product
ICT Software: Interactive Developmetn Encironment ICT ICE & ICT Sequencer
ICT IDE and Sequencer
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The ICT software consists of two parts, the interactive development environment ICT IDE and the ICT sequencer. The IDE provides a graphical user interface for convenient creation and testing of these test sequences and allows:- Convenient management of hardware resources via topology editor- Support of several independent embedded testers for parallel test execution- Editing sequences in a text or table editor- Error highlighting during sequencing- Sequence execution (also single step) directly on a selected DUT- Debugging (single step)- Loop execution via sequences, or single steps- Optimization function with regard to waiting time and integration with Shmoo plot- detailed results output within tables as well as various results diagrams- Pin-Finder function to support adapter wiring- Automatic test program generation is available via Aster Testway
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Product
ICT/FCT-Fixtures (Small IF)
GenRad CK-1-228X-S
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
2-Module ICT System, I317x Series 6
E9902G
In-Circuit Test System
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
ICT / FCT Probes
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*Decades of experience*Proprietary base materials and coatings*Innovative designs*Optimized electrical path
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Product
ICT Probes
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ICT Probes - Test Center: 50 - 100 milsCurrent Rating: 3 - 5 ampsContact Resistance: 30 - 50 milliohmsSpring Force: 113 - 312 gf (4-11 oz)
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Product
Manual Test System for ICT & ISP with Integrated ABex and up to 426 Test Points
LEON Fixture
Test System
The LEONFixture is the ideal ICT and ISP solution for small and cost sensitive applications. This manually operated test system combines optimal ergonomics with high performance, durability and precision, ensuring your investment over the long term. The LEONFixture features a test system integrated in a manual base fixture. The system is designed to be used with an Ingun ATS MA13 insert which could be customized by a lot of fixture houses all over the world.As part of the LEON Family, LEONFixture is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
PXI Based Multifunction Measurement and ICT Instrument
PXI-501
Multifunction Switch/Measure Unit
The PXI-501 is a multifunction measurement instrument for functional and in-circuit measurements.It combines two parametric measurement units with a digital voltmeter, a high voltage current source and a discharge unit. This powerful combination makes it the ideal instrument for classical analog in-circuit test and manufacturing defect analysis with additional functional test capabilities.With it’s fast sampling rate of up to 4MSps it speeds up measurements and is capable of measuring and generating AC signals up to 100kHz.To enhance the PXI-501 capabilities it can be combined with an ABex TM-501 or an ABex TM-404. The ABex TM-501 enhances the in and output range of the PXI-501. Furthermore, it provides a shunt current measurement upgrade. In combination with the ABex TM-404 it’s a complete in-circuit test solution with 86 channels in one ABex slot. For sure it can be upgraded to 2838 test points in one rack by simply adding additional matrix modules.With the above-mentioned terminal modules, the PXI-501 is able to act as a ABex system controller, so that no additional controller is required in the cassis.
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Product
ICT Test Probes
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C.C.P. Contact Probes Co., LTD.
Our In-Circuit Test Probes are used for all kinds of PCB tests. We offer a standard portfolio as well as customized parts.
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Product
Mini In-Circuit Test System
U9403A
In-Circuit Test System
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
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Product
In-Circuit Test Systems For Sale
Test System
Forwessun offers a comprehensive range of global services for a variety of Test Systems. We provide refurbished systems that have undergone rigorous testing, giving you reliable performance at a fraction of the cost of new equipment. Whether you’re looking for a long-term solution to enhance your testing capabilities or a temporary setup to meet increased production demands, we have flexible options to suit your needs. - HP3070- Agilent - Keysight- GenRad- Teradyne Our bespoke rental agreements make it easy to scale up without permanent investment—simply return the system when it’s no longer required. For ongoing support, we offer calibration, repair, and maintenance services through convenient service contracts. If you’re looking to retire any outdated or non-functional In-Circuit Test (ICT) systems, we’ll offer fair market prices, helping you maximise value on any surplus equipment.
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Product
ICT/FCT-Fixtures Max UUT 370 × 300 mm (wxd)
CK-2-228X (Large IF) / 230532
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
Interface Probes
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Low resistance used in: *ICT Testers *Functional Testers *Special Purpose Machines
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Product
In-Line RF Test Station
AP770
RF Test System
ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
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Product
Medalist i1000D Small Foot Print Inline and Offline In-Circuit Systems
U9405A
System
Unlike traditional bridge type board handlers that add a 3rd party equipment on your offline ICT systems, we provide a one-stop shopping experience when you are automating your in-circuit test.
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Product
Boundary Scan Program Development Service
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No need for test fixtures. Integrates product development, production test, and device programming in one system. Test and Programming data can be reused in Production. Fast test procedure development. Reduced inventory management. Eliminates or reduces ICT usage time. Pre-production testing can begin as soon as prototype is released.
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Product
Board Test Fixture Probes
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Offering a wide range of standard spring contact probes to meet your testing requirements and has long been recognized as the world’s largest probe manufacturer. With over 60 different probe series ranging from 0.02" (0.51 mm) to 0.187" (4.75 mm) pitch with multiple length, travel, ICT, lead free and rotator options, we provide a full portfolio designed for general purpose test on bare boards, loaded printed circuit boards and surface mount assemblies.
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Product
ATE Integration
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Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine or integrate your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).We offer solutions for most of the available automatic test equipment systems, in addition we can support you with customized integrations for your existing automatic test equipment (ATE).
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Product
In-circuit Test
i3070
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The Keysight i3070 In-Circuit Test (ICT) System embodies proven technology, enhancing test efficiency through time-tested software, hardware, and programmability. Catering to diverse PCBA sizes, it addresses applications such as IoT, 5G, automotive, and energy. Its unique design minimizes undesired effects from parasitic capacitance, enhances immunity to crosstalk, and eliminates stray signal coupling, ensuring consistent and repeatable measurements.
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Product
Functional & ICT Tester
igentic® 621t
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Growing demand for light emitting diode (LED) products and increasing testing complexity continue to challenge electronic printed circuit board (PCB) manufacturers. The igentic® 621t is a flexible PCB tester that ensures quality while increasing production. The tester can handle multiple PCB products and test for light measurements, resistance and push button or post detection, as required.
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Product
4 TAP JTAG Boundary-scan Controller for Teradyne Systems
QuadTAP/CFM
Controller
The Corelis QuadTAP/CFM high-speed multi-TAP boundary-scan system makes advanced, multi-TAP boundary-scan testing within ICT systems a reality. By combining ICT and boundary-scan, test engineers gain benefits from both technologies for the highest possible test coverage, speed, and capability.Specifically designed for integration into Teradyne TestStation and GR228x testers, the QuadTAP/CFM and QuadTAP/CFM Expander enable a clean, convenient multi-TAP boundary-scan solution.
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Product
Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
Test System
The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
ICT/FCT-Fixtures, Max UUT 250 × 180 mm (wxd)
CK-1 Small (Hold-Down Gate) / 230154
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
Component Test Scanner
Model 13001
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Support component test scanningSupport 8 slots for plug-in (removable), up to 320 channels for one unitOption A130007 40 channels scan module, input up to 500VDC for IR test without switchingMax. 8 salve units for multiple scanner (master/slave interface)Support Chroma LCR meterSupport Chroma 3302/3252/11025 turn ration functionSupport 11200 CLC/IR meter for IR testStandard RS-232, GPIB and USB interface13001 can be installed in Chroma Component ATE model 8800Support ICT applications
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Product
Drop-In In-Circuit Test Fixtures
The Chameleon
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The Circuit Check kit called the Chameleon allows easy re-use of a majority of an ICT fixture’s major components. The Chameleon includes a full size probe plate and interface alignment plate so all valuable tester resources are available. The probe plate assembly is held in place with twelve (12) screws and the vacuum box’s interchangeable push plate is easily replaced by removing four (4) shoulder screws.
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Product
In‐Circuit Test Fixtures
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Test Head Engineering designs and builds high‐quality In‐Circuit Test (ICT) Fixtures for HP / Agilent / KeySight Technologies 3070 board testers. We partner with In Circuit Test Engineering, Inc. to provide turn-key 3070 ICT solutions - both fixture and programming.
