Test Automation Frameworks
structure an environment to standardize, organize and speed the process of building, maintaining and running reliable tests.
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Security Testing Services
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You're building more-complex software faster than ever before, but does your team have sufficient application security skills and resources to test it for security defects? Synopsys security testing services provide continuous access to security testing experts with the skills, tools, and discipline needed to cost-effectively analyze any application, at any depth, at any time.
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Torque Testing
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Torque testers measure properties such as torsional strength and stiffness and are used in quality control of various fields including medical devices, metals, and aerospace
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In-Circuit Test (ICT)
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Analog components (resistance, capacitance, inductance, diodes, transistors, etc.) as well as complex digital components can be tested in the ICT. Compared to other test methods (e.g. flying probe), the in-circuit test enables very short test times (= high assembly throughput) combined with a very high test coverage.
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Vacuum Test Adapter
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Vacuum test adapters (VA) are suitable for contacting electronic assemblies with large quantities (mass testing) and a small number of variants. INGUN vacuum test adapters are available as standard as a single system without an exchangeable replacement kit.
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EMC Testing EMCD
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Efficient and flexible EMC testing services for product CE marking, UKCA marking and demonstrating compliance with US FCC and Canadian ISED regulations. Our experienced engineers will guide you through the test process, helping you to save time, minimise project costs and get your product to market quickly.
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Microwave Testing
500B
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The Model 500B Picoprobe sets new® standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics, the Model 500B Picoprobe achieves an insertion loss of less than 4.0 db and a return loss of greater than 15 db over its frequency range (see accompanying data).
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Test Contactor
RF Scrub
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RF Scrub™ Test Contactor’s innovative design combines an extremely short signal path (0.90mm test height) with high wear resistance pins that can operate in a wide temperature range.The RF Scrub Test Contactor’s long-life, elastomer free design and easy field maintainability makes it an optimal solution for testing of high-performance devices.The RF Scrub design minimizes load board wear and with the unique pin base material and plating, the cleaning intervals can last up to 100,000 cycles.
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Test Switches
Series RT
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Up to three Series FT switches can beassembled on various size 19" wide panels. One piece clear cover standardPanels available in choice of colors and materials
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Network Testing Software
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Get the most out of your PCTEL® scanning receivers with SeeHawk® Touch and Collect network testing software and the SeeHawk™ Central cloud reporting and automation platform. Our intuitive interface makes it easy to conduct drive testing, walk testing, troubleshooting, commissioning, and reporting for cellular, WiFi, and critical communications networks indoors and out. With SeeHawk Central, you’ll also get instant online data access, workflow automation, and report sharing tools for grid-based in-building testing.
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Industrial Automation PC With Intel® Atom™ E3845/Celeron® J1900
UNO-2473G
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4th Generation Intel® Atom/Celeron J1900 Processor up to 1.91/2.0 GHz with 4GB DDR3L Memory4/2 x GbE, 3 x USB 2.0 and 1 x USB 3.0/4 x USB 2.0 and 1 x USB 3.0, 2 x RS-232, 2 x RS-422/485 (E3AE), 2 x RS-232/422/485 (J3AE), 1 x VGA, 1 x HDMI, AudioCompact with Fanless DesignRubber Stopper Design with Captive ScrewDiverse system IO and Isolated Digital IO by iDoor TechnologySupports MRAM by iDoor TechnologyChassis Grounding ProtectionLAN Redundancy (Teaming)Fault-Protected RS-485 Transceivers With Extended Common-Mode Range
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Test Probes
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Test Probes provide the vital link to transfer measurement signals as true and as undistorted as possible. Therefore these elements can be regarded as the heart of Test Fixtures – and for this very reason it is important for Equip-Test to offer high performance Test Probes with best quality and value, and thus ensure maximized ROI (Return of Investment) for our customers. Test Probes supplied by Equip-Test always provide the best-possible available solution for your contacting demands.
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Environmental Testing
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Underwriters Laboratories Inc.
We’ll work with you to effectively mitigate immediate sustainability challenges as well as providing you with the insights, services and tools you need to meet tomorrow’s challenges.
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Hipot & Safety Test
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Chroma Systems Solutions, Inc.
Electrical safety tests to comply with IEC, UL, TUV, CSA, EN, and other electrical safety requirements.
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Localization Testing
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Localization testing is a method that ensures that an application can be used in a specific area or region. It involves testing the application to verify the accuracy, behavior, and suitability in a specific geographical area.
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Test Fixture Adapters for In-Circuit Test Fixtures
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Circuit Check test fixture adapters are utilized when the target ICT tester is not available or has been replaced with a newer technology tester. The tester adapter will often allow existing test fixtures from one test manufacturer to be utilized on another manufacturer test platform, eliminating the need for replacement fixtures. Contact Circuit Check to discuss your tester and fixture combinations for the best choice of a cost effective solution.
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Test Probes / Test Fixtures
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INGUN has an unbeatable assortment of test probes and test fixtures for individual testing tasks.Thanks to many years of experience in the testing equipment field, INGUN offers the suitable test solution for every test requirement.
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Selenium Testing
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If you want a tool that can automate all your testing requirements, is robust, fit for any language, useful for projects of any size, and is free of cost, choose Selenium.
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Hemoglobinopathy Testing Products
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Today's most demanding laboratories can turn to Bio-Rad HPLC assays for a range of fully automated testing solutions, whether they are running a few samples or hundreds of samples a day. Get the gold standard in HPLC technology for revealing hemoglobinopathies in your laboratory. We offer instruments and reagents for measuring hemoglobinopathies and screening for sickle cell disease.
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Ozone Test Chamber
EKT-2001OZ-HCSSX
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Designed and manufactured in accordance with ASTM D1149, ISO1431 & JIS K6259 standards. Providing precise and accurate ozone (OZ) concentration environment for rubber and polymer test. Widely applied to (1) Accelerated ageing research (2) Quality control and assurance tests and (3) R&D laboratory formula experiments for cracking resistance.
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Automated Relay Test System
Relay Master
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Relay Master is an automatic relay test system capable of testing from one to 64 relays simultaneously without having to remove them from the rack. System automation improves efficiency and reduces track time requirements. The PC-based system stores test parameters and results in a database for ease of reliability and trending analysis.
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Chemical Testing
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Accolade Engineering Solutions
To ensure product environmental compliance or to gain better understanding of your materials or processes, chemical testing is often required. AES has state of the art the equipment for chemical analysis. For elemental analysis XRF, SEM/EDS or ICP can be used. For molecular analysis GCMS, HPLC and FTIR may be used. FTIR may also be used for surface analysis of contamination and our microFTIR system is suitable for the smallest samples.
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Optics Testing Systems
SHSInspect
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SHSInspect instruments are widely used in R&D and production when performance, reliability and efficiency counts most. Based on the state-of-the-art wavefront sensor SHSLab, Optocraft offers measurement modules, turnkey instruments and automated tools for a great variety of applications in the field of optics and optical systems, such as:*objective lens testing*testing of optical elements and windows*surface shape measurement*inline measurement and automation
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Test Fixtures & Jigs
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A test fixture or test jig is the component containing the bed of nails used for testing the PCB or assembled product. It is powered and controlled by the Yelo Testpoint system which has test cards capable of providing multiple test conditions. This system also controls the probes used in the bed of nails, and relays test information back to the Testpoint system to be analysed.
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Automation Product Software Development Kit
APS SDK
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APS means “Automation Product Software”. APS library provides users a uniform interface to access all of ADLINK products which support it. It can cover many automation fields especially in machine automation. The most important component in machine automation is motion control. APS library was first born with motion control which co-working components such as system platform management, field bus communication function, general digital input/output, general analog input/output and various counter/timer supports are all built-in components in APS. The APS library will be an all-in-one solution in automation field of ADLINK products.
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VLF Insulation Testing
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VLF testing uses very low frequencies as part of an AC cable maintenance routine. VLF testers are smaller and more practical than AC testers but output the same amount of power as a 50 Hz mains device. This combination of size and power makes Very Low Frequency cable testing perfect for testing longer sections of cable and apparatus
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Emissions Testing
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One of the main aims of environmental protection is to suppress harmful emissions or reduce them as much as possible. Typical examples of emissions include gaseous and particulate pollutants emitted by furnaces, odor emissions and particulate emissions from waste tips. Help protect the climate and ask us to measure the emissions created by your facilities.Our experts will test your facility – from large-scale firing plants to biogas plants, from waste incinerators to crematoria – according to national and international standards. We can also help you reduce noise pollution, measure exhaust gases and harmful emissions, and modernize your facilities.With their extensive experience, our experts can analyze your processes and identify potential improvements. As a measurement body registered throughout Germany and internationally accredited according to ISO 17025 we are authorized to perform the legally required measurements for you.Your facilities need testing? Ask us about our emission testing.
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Exchangeable Test Fixture
2112/D/H/S-7/HG/Pylon
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 13,50 kg
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Simulation and Testing Solutions
LMS
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Siemens Digital Industries Software
LMS simulation and testing solutions help manufacturing companies manage the complexities of tomorrow’s product development by incorporating model-based mechatronic simulation and advanced testing solutions in the product development process. Our products and services tune into mission-critical engineering attributes – ranging from system dynamics, structural integrity and sound quality to durability, safety and power consumption.
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Wafer Test
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WinWay’s commitment to technology, quality and service ensures our interface solutions go above and beyond to exceed your expectations. Our products and services have a proven track record of delivering customer success in semiconductor testing. The Company offers comprehensive test interface solutions ranging from wafer-level test, package-level test to thermal management.
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Multi-Station Test Frame
6800
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The 6800 Series Multi-Station System offers enhanced throughput with its ability to perform simultaneous, independent tests on up to five (5) separate specimens using a single load frame. Based on our standard 68TM-30 testing frame (30 kN capacity)*, this system is especially suitable when test times are lengthened due to high elongation or slow test speeds.
