Router Test
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Product
4G Router
BB-SR30809125-SWH
Router
SmartFlex, AUS/NZ, 5x Ethernet, PoE PD, Metal, International Power Supply (EU, US, UK, AUS). LTE cat.4, 3G/HSPA+, GPRS/EDGE, AUS/NZ, 2x SIM. LTE B1, B2, B3, B4, B5, B7, B8, B28, B40. 2x Ethernet port with PoE support, DIN rail mounting. Powerful CPU and Memory, Hosting of SW IoT applications.
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Product
200 Vdc External Voltage Bias Fixture
16065A
Test Fixture
Measure a DUT with up to +/-200 V DC bias and also measure axial/radial lead components
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Product
Digital Test Instrumentation
EDigital-Series™
Test Instrument
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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Product
Open Test Platform for High Performance Automotive Applications
TSVP
Test Platform
The R&S®TSVP family of products is an open test platform from Rohde & Schwarz ideal for high performance automated test equipment (ATE) applications. The chassis contains a mechanical frame, digital backplane, analog backplane, mains switching and filtering, power supply and diagnostic extensions. A highlight is the analog bus for routing measurement signals between different slots without additional external wiring.
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Product
JTAG Functional Test
JFT
Functional Test
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Product
PCIe 2.0 Test Platform
PXP-100B
Test Platform
The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
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Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
4G Router
ICR-2834WP
Router
ICR-2800, EMEA, 2x Ethernet, 2× RS232/RS485, USB, Wi-Fi, Plastic, Without Accessories. LTE Cat.4 with 3G/2G fallback 1.3 GB eMMC storage to host customer SW applications 2× SIM with cover, eSIM ready.
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Product
Routers
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Schweitzer Engineering Laboratories, Inc.
Routers forward data packets to and from different networks. In utility networks, routers are often used to create security perimeters around substation LANs.
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Product
4G Router
ICR-2834WPA02
Router
ICR-2800, EMEA, 2x Ethernet, 2× RS232/RS485, USB, Wi-Fi, Plastic, UK ACC LTE Cat.4 with 3G/2G fallback. 1.3 GB eMMC storage to host customer SW applications 2× SIM with cover, eSIM ready.
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Product
EBIRST 78-pin D-type To 68-pin Female SCSI Adapter
93-006-222
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
PXIe Optical Test Modules
Test Module
Coherent Solutions’ expanding portfolio of PXIe optical test modules bring a wide range of new mixed-signal test capabilities to the PXI platform. The new modules offer seamless integration with PXI Platform and deliver reliable and repeatable results across a wide range of optical and mixed-signal test applications.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
Test Fixture
The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Advanced SoC/Analog Test System
3650
Test System
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
6TL10 Table Top Test Base
H71001000
Test Platform
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettes.The platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Product
Parallel Electrode SMD Test Fixture
16192A
Test Fixture
The 16192A test fixture is designed for impedance evaluations of side electrode SMD components. The minimum SMD size that this fixture is adapted to evaluate is 1(L)[mm].
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Product
Electrification Testing Solutions
Test System
When looking for a partner to assist with your electrification testing or power electronics testing challenge, Ball Systems has the expertise and experience to ensure your energy storage or power conversion project moves forward efficiently.
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Product
4G Router
ICR-2834WA01
Router
ICR-2800, EMEA, 2x Ethernet, 2× RS232/RS485, USB, Wi-Fi, Metal, EU ACC LTE Cat.4 with 3G/2G fallback. 1.3 GB eMMC storage to host customer SW applications 2× SIM with cover, eSIM ready.
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Product
5G Router
ICR-4172
Router
ICR-4100, GLOBAL, 2× ETH, GNSS, USB, SD, Without Accessories. 5G NR Cellular Connectivity, Sub-6GHz. 3GPP Release 16, Supports both NSA and SA modes.
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Product
EBIRST 78-pin D-type To 68-pin Male SCSI Adapter
93-006-401
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
LAN Router
BB-SR30010120
Router
SmartFlex, Global, 5x Ethernet, Wi-Fi, Metal, Without Accessories. VPN, Multiple LAN/WAN configuration, DIN rail mounting. Powerful CPU and Memory, Hosting of SW IoT applications.
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Product
4G Router
BB-SR30810025-SWH
Router
SmartFlex, AUS/NZ, 2x Ethernet, Wi-Fi, Metal, International Power Supply (EU, US, UK, AUS). LTE cat.4, 3G/HSPA+, GPRS/EDGE, AUS/NZ, 2x SIM. LTE B1, B2, B3, B4, B5, B7, B8, B28, B40. Powerful CPU and Memory, Hosting of SW IoT applications.
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Product
LTE-A Router
ICR-4133W
Router
ICR-4100, EMEA, 2× ETH, USB, SD, WIFI, Without Accessories. LTE-Advanced Cat.6 Cellular Connectivity. Quad-core CPU with 1 GB RAM.
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Product
4G Router
BB-SR30810325-SWH
Router
SmartFlex, AUS/NZ, 2x Ethernet, 1x RS232, 1x RS485, Wi-Fi, Metal, International Power Supply (EU, US, UK, AUS). LTE cat.4, 3G/HSPA+, GPRS/EDGE, AUS/NZ, 2x SIM. LTE B1, B2, B3, B4, B5, B7, B8, B28, B40. Powerful CPU and Memory, Hosting of SW IoT applications.
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Product
4G Router
ICR-2834WA02
Router
ICR-2800, EMEA, 2x Ethernet, 2× RS232/RS485, USB, Wi-Fi, Metal, UK ACC LTE Cat.4 with 3G/2G fallback 1.3 GB eMMC storage to host customer SW applications. 2× SIM with cover, eSIM ready.
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Product
GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
Test Instrument
The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
4G Router
BB-SR30408010
Router
SmartFlex, EMEA/LATAM/APAC, 2x ETH, PoE PSE, Plastic, No ACC. LTE cat.4, 3G/HSPA+, GPRS/EDGE, EMEA/LATAM/APAC, 2x SIM. LTE B1, B3, B5, B7, B8, B20 VPN router, Open Linux OS.
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Product
4G Router
ICR-2834GPA02
Router
ICR-2800, EMEA, 2x Ethernet, 2× RS232/RS485, USB, GPS, Plastic, UK ACC LTE Cat.4 with 3G/2G fallback. GNSS receiver 1.3 GB eMMC storage to host customer SW applications 2× SIM with cover, eSIM ready.
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Product
ARINC 818 Tester
Test Platform
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Product
Test System for Detecting Exact PCB Short Circuit Locations
QT25
Test System
Qmax Test Technologies Pvt. Ltd.
QT25 employs a unique method to detect exact PCB shorts circuit locations and pin down the shorted components and tracks. It is designed in such a manner that it precisely detects exact short circuit locations across VCC - GND or a shorted component connected across a Bus or hair-line shorts between PCB tracks, Which is highly impossible to detect using conventional tools especially when they are connected parallel in circuit. It can also be used in measuring the contact resistance of switches and relays in its milli-ohm mode as a value add.
