EV Test Systems
See Also: Electric Vehicle Test Systems, EV Testers
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Product
Function Test System
Focus-FX
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This is general function test system. User can change board model easily by replacing a test fixture and changing inspection program. We have variety of measurement instruments such as FX modules which can control commercial instruments. It is possible to add required modules into existing units as they are connected by USB port. User can expand as per desired inspection specification.
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Product
Optics Test Systems
Lens Test
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Optik Elektronik Gerätetechnik GmbH
LensTest enables the measurement of air gaps, lens thickness, lens radii and lens surface centration errors in mounted lenses as well as the active alignment of lens surfaces during optics assembly for centering without rotating the assembly.
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Product
Dynamic Component Test Systems
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RedViking brings advanced engineering and proven implementation expertise to your next dynamic component test stand. We’ve designed entire fleets of multi-model and single-model test systems for new component development and production as well as military and commercial MROs. We have decades of experience building and implementing turnkey dynamic component test systems, and we’ll work with your teams virtually anywhere in the world.
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Product
Stress Testing System
Load Dynamix
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LoadDynamix (former Swifttest) is famous for its IP based converged storage system stress testing, including iSCSI, SMB/CIFS, NFS, FC and HTTP/HTTPS based storage systems. Its GUI interface is very easy to use and allow customer engineer to fully configure all the parameters at the protcol layer. Nearlly all the major IP storage system manufacturers have LoadDynamix products in their test lab.
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Product
Computing VITA System
CRS 48.5
System
The CRS 48.5 is a complete, integrated, pre-tested, ready-to-run HPEC rugged subsystem enabling faster development/deployment at lower cost and risk using the most advanced VITA 48.5 compliant air-flowthrough cooling to allow the integration of up to eight quad core Intel® Core™ i7 processing nodes.
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Product
EBIRST 200-pin LFH To 96-pin SCSI Adapter Cable
93-002-226
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Low Frequency Test Systems
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Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
Our imaging low-frequency inspection systems are excellently suited to displaying internal defects with high resolution and high dynamics.
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Product
Motorized Force Test System
MT Series
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In the past, film extruders, paper producers, converters, and woven/non-woven fabric producers have had the choice of test stands and universal test machines which are either value-priced peak-force-only machines, or expensive computer-operated integral-load cell machines. Now you can have the best of both worlds in a single instrument. The series MT-1500, a simple to use computer operated tester, with Quality Control software for automatic calculation and graphical display of break, elongation, yield, modulus, and other, tension and compression force information.
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Product
Filter Test System
DU7216/7218
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Delta United Instrument Co., Ltd.
Inductance, Q factor, Leakage Inductance, AC Resistance, Capacitance, DC Resistance, Balance,Turn ratio, Open/Short check
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Product
Powertrain ICs for ICE/HEV/EV
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ST's powertrain ICs cover a variety of functions including voltage regulators, sensor interfaces, and load or motor drivers, which are the building blocks of typical Engine Control Units (ECU) found in a vehicle's main applications (engine management systems, transmission control systems, alternator regulators, etc.).
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Product
Chloride Test System
C-CL-2000
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The C-CL-2000 produces results on-site, within minutes that are accurate and comparable to expensive laboratory tests. It measures the electrochemical reaction of a weighted sample placed in an extraction liquid. It automatically shows a temperature compensated reading of percent of chlorides on its digital display. A wide range - from 0.002 to 2% chloride by weight - is covered.
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Product
Battery Pack Test System
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*Easy to see now test progress*Can cycle test*Provide Charge, Discharge, Suspend, FOR, LOOP Mode Select*When Charging, set the stop current to stop charging when fully charged so as to avoid overcharging that will damage the battery. When Discharge, set the stop voltage to stop discharge when discharging to lowest so as to avoid over-discharging that will damage the battery.
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Product
Vibration Test Systems
G-0 Series
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The G-0 Series Vibration Test Systems consist of all-round, rugged, high quality vibration generators energy-efficient solid-state PWM power amplifiers, ideally suited to any vibration tests requiring high reliability such as MIL, IEC and JIS standardized tests for aircraft, automobiles, electronic components, electric apparatus and aerospace equipment.
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Product
D-Mic Auto Test System
BK9013
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If your company produces millions of D-mics per month, take a look at the BK9013. Based on our BK3012V2 D-Mic Tester, the fully automatic BK9013 is our fastest D-Mic test system. With 4 or 8 couplers, the BK9013 can simultaneously test and sort up to 8 D-Mics into 8 passing grades and 7 different causes of failure in just a few seconds! You can view the results in real time or store them to analyze later.
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Product
Electromagnetic Vibration Testing Systems
EV series
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Labtone Test Equipment Co., LTD
EV series of electromagnetic vibration testing systems cover a wide range of forces ideal for many different applications. The electrodynamic shaker systems are well-suited for vibration testing products and structures of any size – from small components and electronic hardware to very large devices and structures.
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Product
Full Wafer Test System
FOX-1P
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Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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Product
Multi-Wafer Test & Burn-in System
FOX-XP
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The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Product
Test Cell System
qCf FC50/125
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qCf: Our revolutionary test cell system for the professional characterization of fuel cells.
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Product
AVL Battery Test Systems
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In modern electrified powertrains (xEVs), huge demands are placed on batteries. These electrochemical energy storage and conversion devices must meet market requirements such as long-lasting high power and energy performance, and dynamic charge and discharge processes.
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Product
TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
Test Instrument
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
Mass Flow Test Systems
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No matter the industry, product integrity is necessary to the manufacturing process. Everything leaks, and mass flow testing provides a fast, reliable determination of leakage to ensure it is within permissible ranges.
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Product
(100kN) Fatigue Testing Systems
8801
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The 8801 servohydraulic testing system meets the challenging demands of a varied range of both dynamic and static testing requirements. The 8801 provides complete testing solutions to satisfy the needs of advanced materials and component testing, and is ideally suited for high- and low-cycle fatigue testing, thermomechanical fatigue testing, and fracture mechanics. The higher capacity of up to 100 kN, a larger working space, a high stiffness, and the precision of alignment all make the 8801 an exceptionally versatile and reliable testing system.
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Product
Mezzanine System
3560
System
ECM P/N 3560 provides four independent I2C channels. For ease of development a PCA9564 interface IC converts parallel data to I2C serial communication. Additionally an LTC1694 I2C accelerator IC decreases the rise time of the passively pulled up I2C bus allowing for greater capacitive loading or higher bus speeds. Each channel is comprised of SCL, SDA and two Grounds.
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Product
Self-Sufficient Test System
MFTS100
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Computer Gesteuerte Systeme GmbH
The MFTS100 is a self-sufficient test system with optional integrated touch screen for easy operation and display of measurement data or running processes.
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Product
EW System Test Set
MS 1107
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PSS LRU Test Set is used to test the RWR (Radar Warning Receiver) system by simulating the input signals and testing the output signals.
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Product
Ionic Contamination Test System
Omegameter SMD 650
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The SCS Omegameter SMD 650, the long-time industry standard for ionic testing utilizing “static test” methodology, is designed to perform cleanliness testing on printed circuits and assemblies. Identifies the presence of ionic contamination on bare and assembled printed circuit boards and other electronic components. Provides an accurate and repeatable method for determining cleanliness on site. Provides immediate process control results, eliminating the need for outside laboratory testing.
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Product
Accelerated Life Test Systems
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Test systems for accelerated life testing and product burn-in utilize Intepro’s electronic loads that are ideal where high power bulk loading is required. Characterization applications within Telecommunication and Aerospace sectors benefit from Intepro’s environmental stress screening (ESS)/Burn-in solutions
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Product
Miniature Vibration Test System
G-2 Series
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The G-2 Series Miniature Vibration Test System, though compact & handy, consists of a sweep oscillator, sine controller, power amplifier and vibration generator, thus suited to a variety of applications; calibration of sensors, standardized vibration tests for small parts, school teaching materials and modal analysis. The G-2002 is handy, with all the composed units being incorporated in a portable case.
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Product
In-Process Wafer Inspection System
7945
System
Chroma 7945 wafer chip inspection system is an automated inspection system for pre and post diced patterned wafers. Change kits enable switching between various applications by allowing different carriers including metal frame or grip ring.
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Product
Laser Diode Characterization System
58620
System
The Chroma 58620 Laser Diode Characterization Station is a state-of-the-art full turnkey system specially designed for laser diode testing. Features range from macro inspection of the facet or aperture active area to a full suite of electro-optical parametic tests.
