Test Frameworks
faciliate automation by a system integrating test; libraries, data, objects and processes.
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Product
Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
Test System
Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
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Product
Combination Board Functional Test System
QT 4256 ATE
Functional Test
Qmax Test Technologies Pvt. Ltd.
QT 4256 ATE is a combination Board Functional Test System , a main frame Automated Test Equipment (ATE) which can be configured up to maximum of 1280 Bi-directional digital channels ideal for testing circuit card assemblies of high level of complexity and whether it is a legacy or new generation PCB.
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Product
SMD Test Fixture
16034G
Test Fixture
Perform impedance evaluation on a minimum SMD size of 0.6(L) x 0.3(W) [mm]
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Product
NI Real-Time Test Cell Reference System
778820-35
test
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Product
RF-Antenna Communication Links Functional Test
Functional Test
The application encompasses functional tests of very large quantities of automotive antenna amplifiers, plus parallelization of tests by implementing several test stations in a rotary indexing table. The DUTs are inserted manually and after final assembly, they are loaded into the rotary table; this requires manual triggering by the operator.
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Product
Functional Test Fixtures
Test Fixture
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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Product
Ethernet and Fibre Channel Test Platform
SierraNet M1288
Test Platform
The SierraNet M1288 Ethernet and Fibre Channel test platform provides best in class analysis, jamming and generation for traffic capture and manipulation for testing application and link characteristics. SierraNet M1288 is the latest in the line of industry leading test and measurement tools from Teledyne LeCroy, designed for today’s high-speed storage and communications fabrics. SierraNet M1288 supports examination and modification of Ethernet and Fibre Channel links utilizing both Pulse Amplitude Modulation 4 (PAM4) and legacy Non-Return to Zero (NRZ) technologies.
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Product
NI HIL and Real-Time Test Software Suite
test
Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
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Product
Scienlab Battery Test System – Pack Level, 220 KW
SL1730A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
Automated Test Systems
Test System
WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
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Product
Scienlab Battery Test System – Pack Level, 110 KW Extendable Version
SL1720A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development.
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Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Product
Disk Drive Test System
Saturn
Test System
The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
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Product
VLSI Test System
3380
Test System
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Product
Flash Memory Test System
T5830
Test System
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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Product
Functional Test for Engineering Lab
Spectrum BT
Functional Test
Designed to meet the needs of product engineering labs, production lines, test development centers, and repair depots, the Spectrum BT is a configurable and scalable functional test system. This focused system solves typical functional test coverage challenges throughout the defense/aerospace product life cycle—and it’s upgradable as test requirements evolve.
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Product
ESD Test System
58154 Series
Test System
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Product
NI Vehicle Radar Test System
Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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Product
Scienlab Charging Discovery System (CDS) – High-Power Series
SL1047A
Battery Test Platform
The Scienlab Charging Discovery System – High-Power Series from Keysight enables you to test charging interfaces of electric vehicles (EVs) and EV supply equipment (EVSE) during high-power charging up to 1,500 V DC and ±600 A DC. With the CDS can perform all necessary conformance and interoperability tests according to worldwide charging standards. Our new solution, which features the separate Scienlab Cooling Unit with interchangeable liquid-cooled charging adapters, also enables a high-power upgrade of the SL1040A Scienlab Charging Discovery System - Portable Series.
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Product
In-Line Test System
Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Product
Conformance Test System
TS-RRM
Test System
The R&S®TS-RRM 5G and LTE test system is a test solution for running 5G NR and LTE inter-RAT RRM test cases for certification of wireless devices.It is a fully automated conformance test system for running validated RRM conformance test cases. In addition to the RRM test cases required by GCF/PTCRB, the R&S®TS-RRM also supports carrier acceptance specific RRM tests.
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Product
Laser Diode Burn-in Reliability Test System
58604
Test System
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Product
Application Software for Electronic Test & Instrumentation
test
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Product
JTAG Functional Test
JFT
Functional Test
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Product
Seno-Con Test System
PANTHER 2K QST
Test System
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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Product
In-Circuit Test System Rentals
Test System
Forwessun offers flexible test system rental options to meet short-term or seasonal testing demands. Our rental systems are rigorously tested for reliability and performance, giving you access to high-quality equipment without the need for a full purchase commitment. Customised rental agreements allow you to return the equipment when it’s no longer required, providing an ideal solution for scaling up production or filling in during periods of high demand.
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Product
Automated Multi-Functional Tester
QTouch 1408 C
Functional Test
Qmax Test Technologies Pvt. Ltd.
QTouch 1408 C – Automated Multi-Functional Tester with in-built camera is designed to make automatic image capturing and probing of electrical signals with ease and speed especially in PCBs with high density/high pin count device that are mounted on the PCB. It is designed to move on X, Y, Z directions making it possible to probe every component as close as 20 mils. Easy tagging feature allows the user to get the real time XY coordinates using the library information with minimal intervention. CAD import feature is available for Auto Test Generation/to extract the XY coordinates from the CAD data. Qmax Automated Multi Functional Tester can perform Board level functional test of a PCB and guided probe / Back tracking diagnostics utility to reliably test Digital, Analog and Mixed Signal PCBs and fault isolation to the PCB level or component level.
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Product
Positioning Test System
TS-LBS
Test System
The R&S®TS-LBS is a comprehensive test solution for network and satellite based location technology testing of wireless devices and chipsets.It is highly configurable for testing various location technologies and uses Rohde & Schwarz location based test systems.The R&S®TS-LBS test system family fulfills the requirements of LBS conformance testing and operator acceptance testing on GSM, WCDMA, LTE and 5G devices and chipsets as well as regulatory testing consisting of adjacent channels and spurious emissions for EN 303 413 receiver testing. It also fulfills the requirements of E112 (EU) 2019/320 testing consisting of GNSS testing such as Galileo and AML mobile testing.
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Product
Mini In-Circuit Test System
U9403A
In-Circuit Test System
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
