Basic Contact Probes (100 Mil) H772DS-30

Basic Contact Probes (100 Mil) H772DS-30

The Basic Contact Probes (100 mil) H772DS-30 are expertly designed for precision applications, supporting a wide array of electronic testing and connectivity solutions. With a pitch measurement of 2.54 mm (100 mil), these probes ensure compatibility across various devices and testing equipment, making them a reliable choice for engineers and technicians alike. The total length of the probe is 3.00 mm, and with an outer diameter of 2.20 mm, it offers ease of use while maintaining robust performance. These probes are tailored for effective signal transmission, ensuring optimal conductivity through their copper-bearing construction.

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