Test Handler
Test Handler is an equipment that automates the final testing of semiconductor devices. It handles device transportation, controls temperature during semiconductor testing, and sorts devices based on test results.
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Product
Test Handler
HA1200
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The new HA1200 handler can be linked with a tester to utilize our unique active thermal control technology for testing singulated and/or partially assembled dies. This technology enables testing of powerful high-end SoCs with 100% test coverage. This helps reduce yield loss at final test, thus reducing losses of final multi-die assembled products.
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Product
Test Handler
M4841
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High-Throughput Device Handler for Volume Production Testing of MCUs and DSPs.
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Product
Test Handler
M4872
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Improve Efficiency in High-Volume Manufacturing and Device Characterization.
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Product
Test Handler
M6242
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Optimal Test Handler for Mass-Production DRAM, with Double the Throughput.
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Product
Test Handler
M4171
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Advantest’s M4171 single-site handler combines these capabilities in a portable design that is ideally suited for use in engineering environments.
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Product
Stimulus Test Cell
HA7200
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The HA7200 enables these improvements by providing high-speed, high-accuracy temperature and pressure test for automotive sensor R&D and production. Advantest’s proprietary temperature control technology delivers an optimized test solution for high-spec pressure sensors across a broad range of temperatures, in the automotive industry and beyond.
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Product
Stimulus Test Cell
HA7300
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The Stimulus Test Cell HA7300 is a test cell which provides an environment for high-speed, highly accurate temperature and pressure test of differential pressure sensors, utilizing Advantest’s unique temperature control unit with simultaneous temperature control for 8 devices, as well as a newly developed 2Port pressure controller and pressure application nozzle.
