Siemens EDA
Siemens EDA is uniquely positioned to partner with our customers to create advanced solutions for the design and verification of modern semiconductor designs.
- 8005 Boeckman Rd
Wilsonville, Oregon
United States of America
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Product
JTAG Probe
MAJIC
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MAJIC (Multi-Architecture JTAG Interface Controllers) JTAG Probes are small, stand-alone, processor-based systems that provide an intelligent connection between host-based development tools (the debugger) and an embedded processor via its standardized JTAG debug logic IP macrocell.
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Product
Industrial Power Tester
MicReD Power Tester 600A
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The MicReD Industrial Power Tester 600A supports automatic testing and diagnosis of possible failure causes of power components. Built for manufacturing as well as laboratory environments, it can power the modules through tens of thousands, potentially millions, of cycles while simultaneously providing real-time failure-in-progress diagnosis.
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Product
Transistor-Level Defect Simulator
Tessent DefectSim
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Tessent DefectSim is a transistor-level defect simulator for analog, mixed-signal (AMS), and non-scan digital circuits. It measures defect coverage and defect tolerance. Tessent DefectSim is perfect for both high-volume and high-reliability ICs. Tessent DefectSim replaces manual test coverage assessment in AMS circuits needed to meet quality standards such as ISO 26262 and provides objective data to guide improvements in DFT. Tessent DefectSim dramatically reduces SPICE simulation time compared to simulating every potential defect.




