Rigaku Corp.
Since its inception in 1951, Rigaku has been at the forefront of analytical and industrial instrumentation technology. Today, with hundreds of major innovations to their credit, the Rigaku group of companies are world leaders in the fields of general X-ray diffraction, thin film analysis, X-ray fluorescence spectrometry, small angle X-ray scattering, protein and small molecule X-ray crystallography, Raman spectroscopy, X-ray optics, semiconductor metrology, X-ray sources, computed tomography, nondestructive testing and thermal analysis.
- +81 3-3479-0618
- +81 3-3479-6171
- info-gsm@rigaku.co.jp
- 3-9-12, Matsubara-cho
Akishima-shi, Tokyo 196-8666
Japan
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Product
Benchtop X-ray Crystallography System
XtaLAB mini II
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The Rigaku XtaLAB mini II, benchtop X-ray crystallography system, is a compact single crystal X-ray diffractometer designed to produce publication-quality 3D structures. The perfect addition to any synthetic chemistry laboratory, the XtaLAB mini II will enhance research productivity by offering affordable structure analysis capability without the necessity of relying on a departmental facility. With the XtaLAB mini II, you no longer have to wait in line to determine your structures. Instead your research group can rapidly analyze new compounds as they are synthesized in the lab.
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Product
Total Reflection X-Ray Fluorescence (TXRF) Products
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Total Reflection X-Ray Fluorescence (TXRF) Products by Rigaku
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Product
Tube-Above Wavelength Dispersive X-ray Fluorescence Spectrometer
ZSX Primus IV
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As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the new Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards. ZSX Guidance supports you in all aspects of measurement and data analysis. Can accurate analysis only be performed by experts ? No — that is in the past. ZSX Guidance software, with the built-in XRF expertise and know-how of skilled experts, takes care of sophisticated settings. Operators simply input basic information about samples, analysis components and standard composition. Measured lines with the least overlap, optimum backgrounds and correction parameters (including line overlaps) are automatically set with aid of qualitative spectra.
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Product
Benchtop X-ray diffraction (XRD) instrument
MiniFlex
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New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.
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Product
Multipurpose X-Ray Diffractometer with Built-In Intelligent Guidance
SmartLab SE
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The SmartLab® SE is a highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance. It offers continued refinement of the original ease of use features that enabled the original SmartLab to receive the R&D 100 Award in 2006: automatic alignment, component recognition, cross beam optics and advanced photon counting hybrid pixel array detectors (HPAD).
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Product
XRD System
SmartLab®
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SmartLab includes as standard Rigaku's patented Cross Beam Optical™ (CBO) technology. CBO technology uses simultaneously mounted, simultaneously aligned optical components for both focusing (Bragg-Brentano) and parallel beam diffractometer geometries. Users can switch between the two geometries without the need to remove, replace, or realign optical components.
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Applied Rigaku Technologies, Inc
Applied Rigaku Technologies, Inc., a division of Rigaku Corporation, engineers, manufactures and distributes Rigaku EDXRF products worldwide. Located in Cedar Park, Texas, USA, our company specializes in benchtop and on-line EDXRF spectrometers for the non-destructive elemental analysis of solids, liquids, powders, and coatings. Our benchtop EDXRF portfolio includes the compact NEX QC Series for routine process control needs, the advanced NEX DE Series for bulk and small spot applications, and the NEX CG indirect excitation analyzer for complex applications and research. With multi-element capabilities, measure elements sodium (Na) through uranium (U) in a variety of matrices for a wide range of applications. For real-time process control needs, we offer the NEX XT total sulfur analyzer, NEX OL multi-element process analyzer for liquid streams, and the NEX LS linear scanner for cross and down web profiling of your process.
