Teradyne, Inc.
Teradyne tests and helps build the world’s most innovative products. Our leading-edge testers make sure that new products work right the first time, every time. And our robotics portfolio helps manufacturers to develop and deliver new products quickly, efficiently and cost-effectively.
- +1 800-837-2396
978 370-2700 - 978 370-1100
- customercare@teradyne.com
- 600 Riverpark Drive
North Reading, MA 01864
United States of America
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Product
Automotive Production Board Test
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Teradyne's TestStation platform enables manufacturers to easily react to rapidly changing product requirements. From volume, mix and test complexity - there is a TestStation configuration to meet your production requirements at the highest fault coverage and yield rate. configurable from a range of a few test points for basic shorts detection up to more than 15,000 test points for more complex PCBAs.
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Product
Wireless Testing
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Thorough testing of wireless technologies is essential, but it can’t result in production slowdowns or increased costs. Teradyne’s industry-leading wireless testers deliver high-throughput and get the newest technologies from the lab to high-volume manufacturing, quickly and cost-effectively.
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Product
TestStation Multi-Site Inline
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TestStation Multi-Site Inline is the most productive, lowest cost in-circuit test solution. This "zero-footprint" inline test system provides true 2x-4x parallel test, delivering 200% to 400% greater productivity, and 40% to 50% lower total cost of test.
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Product
Digital Test Instrumentation
EDigital-Series™
Test Instrument
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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Product
Digital Test Instrumentation
Di-Series™
Test Instrument
The Di-Series tests all levels of integration from board level (SRA/SRU) to box level (WRA/LRU) units under test (UUTs), while maintaining full compatibility with previous generations of Teradyne instrumentation and systems. Excellent usability and reliability reduce programming and support effort, as well as straightforward upgrades of existing test program sets (TPS).
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Product
Multiple Module Serial Bus Test Instrument
Bi4-Series
Test Instrument
The wide variety of serial buses used in defense and aerospace applications typically requires multiple single-purpose instruments. Too often, they are difficult to reconfigure in order to test a different application.The Bi4-Series provides all the capabilities needed for complete communications bus access test for up to four serial buses used in board level (SRA/SRU) and box level (WRA/LRU) equipment—all in a single VXI module.The instrument includes test applications, industry-compliant software drivers and hardware enabling straightforward integration into automatic test systems.With the configuration flexibility needed to effectively test every bus format used in defense and aerospace applications, the Bi4-Series instrument plays a key role in reducing implementation time and test system cost.
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Product
5G Testing
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Teradyne test solutions are at the forefront of the 5G test era. Why? We work with the leading semiconductor manufacturers and provide optimized test coverage for the major wireless standards. From emerging millimeter wave devices to the traditional sub-6GHz, our test solutions are already leading the way.
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Product
Asynchronous System Level Test Platform
Titan
Test Platform
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Product
Semiconductor Testing
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Teradyne’s semiconductor test portfolio is transforming the way you test chipsets for automotive, industrial, communications, consumer, smartphones, and computer and electronic game applications. Semiconductor devices span a broad range of functionality, from very simple low-cost devices such as appliance microcontrollers, operational amplifiers or voltage regulators to complex digital signal processors and microprocessors as well as memory devices.
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Product
True Concurrent Test
TestStation Duo
Test System
The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.
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Product
Test System
UltraFLEX
Test System
The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Product
High-Speed Digital Bus Test Instruments
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Teradyne and AIT instruments test legacy and newer digital buses.The enormous variety of digital buses used in defense and aerospace applications requires comprehensive, yet efficient testing.Teradyne and AIT COTS instruments meet these challenging bus test requirements for legacy and standardized buses, as well as evolving digital buses that have faster speeds, larger data volumes, and increasingly complex protocols requiring real-time test and emulation.
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Product
Functional Test for Engineering Lab
Spectrum BT
Functional Test
Designed to meet the needs of product engineering labs, production lines, test development centers, and repair depots, the Spectrum BT is a configurable and scalable functional test system. This focused system solves typical functional test coverage challenges throughout the defense/aerospace product life cycle—and it’s upgradable as test requirements evolve.
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Product
SoC Tester
UltraFLEXplus
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The UltraFLEXplus combines new instrument and software capability with a revolutionary tester infrastructure that provides a step-function improvement in throughput and engineering efficiency – all while leveraging the cumulative test IP developed over the UltraFLEX’s 15 year history .
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Product
Ultra-High Performance FLASH and DRAM Memories Test Solution
Magnum V
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Teradyne’s Magnum V systems delivers high throughput and high parallel test efficiency for ultra-high performance FLASH and DRAM memories. Magnum V’s largest configuration delivers up to 20,480 digital channels at 1600Mbps per channel.
Children
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Avionics Interface Technologies
AIT is a leading designer and manufacturer of Test Instrumentation, Databus Analyzers, and Rugged/Embedded interface solutions for Military and Commercial applications. AIT prides itself on providing the most capable products in the industry along with market leading support to ensure the long term success of its customers and partners.
Children
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LitePoint Corporation
LitePoint is the leading provider of test solutions for the world’s leading manufacturers of wireless modules and consumer electronics, including smart phones, tablets, and PCs. We are a Silicon Valley company founded in 2000 and since then, LitePoint products have been used to optimize and verify the operation of over 2 billion wireless devices. A Teradyne company.
